← Back to Patent Explorer
US4663890A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for machining workpieces of brittle hard material into wafers

Assignee: GMN Georg Mueller Nuernberg AG
•
Filing: 1986-05-22
•
Granted: 1987-05-12
•
Expires: 2006-05-22
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A method for machining a disk-shaped workpiece, for example having a thickness of between 350 and 1200 microns, formed of brittle crystalline material having a Vickers hardness greater than about 7,000 N/mm 2 in the manufacture of a wafer having a fine thickness, such as in the range of between about 60 and 250 microns, comprises a "cross" grinding operation including the steps of situating the workpiece in opposed relationship to a flat grinding surface of a rotating cup-type grinding wheel and infeeding or plunging the grinding wheel with respect to the workpiece in a direction substantially parallel to the axis of rotation of the grinding wheel at a controlled rate while maintaining the workpiece fixed and stationary with respect to the axis of rotation of the grinding wheel until a layer of the workpiece having a specifically predetermined optimal thickness has been abraded. The method of the invention provides increased yields of wafers with improved surface quality and precision and with decreased depth of damage of the crystal lattice structure.

Inventors

  • 👤 Georg Brandt

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 14:42
CPC Classifications
B; B24; B24B; B24B27/00; B24B27/0023; B24B1/00; B24B7/00; B24B7/10; B24B7/16; B24D; B24D7/00; B24D7/06

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 164 words
A method for machining a workpiece having an as-cut finish formed of a brittle crystalline semiconductor material having a Vickers hardness greater than about 7,000 N/mm 2 in the manufacture of a semiconductor wafer having a fine thickness with a finished surface in a single operation, comprising the steps of: situating the workpiece with a first workpiece surface in opposed relationship to a flat grinding surface of a rotating grinding wheel, the grinding surface being situated in a plane substantially perpendicular to the axis of rotation of the grinding wheel; and infeeding the grinding wheel with respect to the workpiece in a direction substantially parallel to the axis of rotation of the grinding wheel until the grinding surface contacts the first workpiece surface and continuing the infeeding at a certain controlled rate while maintaining the workpiece fixed and stationary with respect to the axis of rotation of the grinding wheel until a layer of the workpiece having a specifically predetermined thickness has been removed.
Claim 2
Independent Claim 164 words
A method for machining a workpiece having an as-cut finish formed of a brittle crystalline semiconductor material having a Vickers hardness greater than about 7,000 N/mm 2 in the manufacture of a semiconductor wafer having a fine thickness with a finished surface in a single operation, comprising the steps of: situating the workpiece with a first workpiece surface in opposed relationship to a flat grinding surface of a rotating grinding wheel, the grinding surface being situated in a plane substantially perpendicular to the axis of rotation of the grinding wheel; and infeeding the grinding wheel with respect to the workpiece in a direction substantially parallel to the axis of rotation of the grinding wheel until the grinding surface contacts the first workpiece surface and continuing the infeeding at a certain controlled rate while maintaining the workpiece fixed and stationary with respect to the axis of rotation of the grinding wheel until a layer of the workpiece having a specifically predetermined thickness has been removed.
Claim 3
Dependent Claim 124 words
The method of claim 1 including the further subsequent steps of: resituating sthe workpiece with a second workpiece surface in opposed relationship to a flat grinding surface of a rotating grinding wheel, the grinding surface being siruated in a plane substantially perpendicular to the axis of rotation of the grinding wheel; infeeding the grinding wheel with respect to the workpiece in a direction substantially parallel to the axis of rotation of the grinding wheel until the grinding surface contacts the second workpiece surface and continuing the infeeding at a certain controlled rate while maintaining the workpiece fixed and stationary with respect to the axis of rotation of the grinding wheel until a layer of the workpiece having a specifically predetermined thickness has been removed.
Claim 4
Dependent Claim 23 words
The method of claim 2, wherein a wafer so manufactured has a thickness in the range of between about 60 and 250 microns.
Claim 5
Dependent Claim 23 words
The method of claim 2, wherein a wafer so manufactured has a thickness in the range of between about 80 and 120 microns.
Claim 6
Dependent Claim 23 words
The method of claim 1, wherein the flat grinding surface of the grinding wheel overlaps the entire workpiece surface during the grinding operation.
Claim 7
Dependent Claim 16 words
The method of claim 1 wherein the material of which the workpiece is formed is silicon.
Claim 8
Dependent Claim 36 words
The method of claim 1, wherein the material of which the workpiece is formed is a compound formed of one element from Group III A and an element from Group V A of the Periodic Table.
Claim 9
Dependent Claim 27 words
The method of claim 1, wherein the material of which the workpiece is formed is selected from the group consisting of germanium, spinel, sapphire and gallium-gadolinium-garnet (GGG).
Claim 10
Dependent Claim 30 words
The method of claim 1, wherein the material of which the workpiece is formed is selected from the group consisting of silicon carbide, silicon nitride, boron carbide and sintered ceramic.
Claim 11
Dependent Claim 42 words
The method of claim 1, wherein after the desired amount of workpiece material has been removed and with the rotation of the grinding wheel continuing, moving the workpiece in the direction substantially perpendicular to the axis of rotation of the grinding wheel.
Claim 12
Dependent Claim 33 words
The method of claim 1, wherein after the grinding surface contacts the workpiece surface, infeeding the grinding wheel at a rate in the range of between about 0.1 to 50 mm per minute.

References Cited (Backward Citations)

US653531A Cited
US2315475A Cited
US3142942A Cited
US3665648A Cited
US3841028A Cited
US4064660A Cited
CH599830A5 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-05-11 1990-11-10 1991-05-12 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-05-11 1994-11-10 1995-05-12 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-05-11 1998-11-10 1999-05-12 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag