Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
223 words
A method for fabricating a bipolar transistor comprising the steps of: forming a conductive buried collector region in a silicon substrate by using ion-implantation of an impurity and thermal-annealing; sequentially forming a first silicon oxide layer, a first nitride layer, a first polysilicon layer, an oxide layer, a second nitride layer and a second polysilicon layer doped with an impurity; selectively removing the second nitride and second polysilicon layers to form a pattern; sequentially forming a second silicon oxide layer, a third nitride layer and a third silicon oxide layer thereon; forming a patterned photoresist layer thereon to define active and inactive regions and removing those layers above said oxide layer on the active region to form an opening; forming a side wall on both sides of the opening; forming a collector on a surface portion of the buried collector region up to a lower surface of the second polysilicon layer; removing the side wall and the third nitride layer to expose a side surface of the second polysilicon layer; selectively forming a base on an upper surface of the collector including a side surface of the second polysilicon layer; forming a first side wall oxide layer on both sides of the base and the second silicon oxide to define an emitter region; forming an emitter on the base; and forming electrodes thereon.
Claim 2
Independent Claim
223 words
A method for fabricating a bipolar transistor comprising the steps of: forming a conductive buried collector region in a silicon substrate by using ion-implantation of an impurity and thermal-annealing; sequentially forming a first silicon oxide layer, a first nitride layer, a first polysilicon layer, an oxide layer, a second nitride layer and a second polysilicon layer doped with an impurity; selectively removing the second nitride and second polysilicon layers to form a pattern; sequentially forming a second silicon oxide layer, a third nitride layer and a third silicon oxide layer thereon; forming a patterned photoresist layer thereon to define active and inactive regions and removing those layers above said oxide layer on the active region to form an opening; forming a side wall on both sides of the opening; forming a collector on a surface portion of the buried collector region up to a lower surface of the second polysilicon layer; removing the side wall and the third nitride layer to expose a side surface of the second polysilicon layer; selectively forming a base on an upper surface of the collector including a side surface of the second polysilicon layer; forming a first side wall oxide layer on both sides of the base and the second silicon oxide to define an emitter region; forming an emitter on the base; and forming electrodes thereon.
Claim 3
Dependent Claim
78 words
The method as defined in claim 1, wherein the step of forming the opening further comprises removing the oxide layer and the first polysilicon layer formed on the active region, performing a thermal-annealing to oxidize an exposed portion of the first polysilicon layer and to form a second side wall oxide layer therein, and removing the first nitride and the first silicon oxide layers on the active region to expose a surface portion of the buried collector region.
Claim 4
Dependent Claim
32 words
The method as defined in claim 1, wherein the step of forming the collector comprises simultaneously performing impurity-injection together with a selective crystal growth, thereby allowing the collector to have a conductivity.
Claim 5
Dependent Claim
45 words
The method as defined in claim 1, wherein the step of forming the collector comprises forming a single crystal silicon layer on the exposed surface of the buried collector region by a selective crystal growth before injecting an impurity into the single crystal silicon layer.
Claim 6
Dependent Claim
33 words
The method as defined in claim 1, wherein the base is composed of a single crystal SiGe layer doped with an impurity having high concentration of at least 1×10 18 cm -3 .
Claim 7
Dependent Claim
22 words
The method as defined in claim 1, wherein the base is composed of one of a SiGe/Si layer and a Si/SiGe/Si layer.
Claim 8
Dependent Claim
23 words
The method as defined in claim 1, wherein Ge content of the base is linearly changed between bottom and top of the base.
Claim 9
Dependent Claim
23 words
The method as defined in claim 1, wherein Ge content of the base is constant in the range of no more than 3%.
Claim 10
Dependent Claim
31 words
The method as defined in claim 1, wherein Ge content of the base is linearly changed between bottom and top of the base in the range of from 30% to 0%.
Claim 11
Dependent Claim
52 words
The method as defined in claim 1, wherein Ge content of the base is constant between bottom and a first height of the base in the range of no more than 30% and is linearly changed between the first height and top of the base in the range of 30% to 0%.
Claim 12
Dependent Claim
50 words
The method as defined in claim 1, wherein Ge content of the base is linearly changed between bottom and a first height of the base in the range of 0% to 30% and changed between the first height and top of the base in the range of 30% to 0%.
Claim 13
Dependent Claim
28 words
The method as defined in claim 1, wherein the first side wall oxide layer is composed of one of a BSG containing boron and a PSG containing phosphorous.