Printed flexible circuit terminations and method of manufacture

Claim 2

Electrical component test apparatus comprising: a) a body including means for resiliently supporting a test component to said body such that a plurality of component terminals project into a first cavity disposed in said body adjacent said support means and further including cover means mounted to said body to contact each component inserted; b) contact means having a conductive signal layer, a ground layer and a dielectric layer; wherein said dielectric layer separates said signal layer and said ground layer; wherein said signal layer includes a plurality of laterally displaced, seamless conductive paths etched from a homogeneous conductive material of a uniform thickness; wherein each of said plurality of conductive paths includes first and second etched contact terminations and an interconnecting field path; wherein said first terminations project unsupported in laterally displace relation to one another from a peripheral edge of said dielectric layer into said first cavity; and wherein the vertical thickness of said first and second terminations is greater than said field path, whereby said first terminations flex upon contact with respective ones of said terminals.

Claim 3

Apparatus as set forth in claim 1 wherein said contact means includes a flexible dielectric layer and a flexible ground layer and wherein each of said plurality of conductive paths exhibits an impedance characteristic in the range of 50 to 100 ohms to signals conducted over said paths at frequencies in the range of DC to 10 gigahertz.

Claim 4

Apparatus as set forth in claim 1 including a component retainer mounted in said cavity and supported above a spring such that upon contacting the cover to a component said spring is depressed.

Claim 5

Apparatus as set forth in claim 1 including an elastomer component retainer mounted in said cavity, which retainer compresses upon contacting the cover to a component, and having a plurality of projections which align the corners of said component to said retainer and said retainer to said body.

Claim 6

Apparatus as set forth in claim 1 wherein said dielectric layer comprises a center portion and from which radiates a plurality of wings, wherein said first terminations project unsupported from a peripheral edge of said wings, wherein said second terminations are formed at the center portion, and wherein said wings are folded to envelope said body such that said second terminations depend from beneath said body.

Claim 7

Apparatus as set forth in claim 5 wherein said first terminations are devoid of said dielectric substrate and ground layer in the region of said first cavity and wherein said wings are clamped between said cover and said body in the region of a dielectric layer which overlies said conductive paths.

Claim 8

Apparatus as set forth in claim 1 wherein said second terminations respectively support a plurality of terminal pins at a hole bored through each of said second terminations.

Claim 9

Apparatus as set forth in claim 1 wherein said conductive layer is mounted between first and second dielectric layers, wherein first and second ground layers cover said first and second dielectric layers, wherein adjacent ones of said first and second dielectric layers and said first and second ground layers includes a plurality of apertures aligned to expose said second terminations.

Claim 10

Apparatus as set forth in claim 11 wherein said plurality of capacitors and said plurality of contacts are mounted to an electrically conductive cover and including means for insulating portions of each of said capacitors and contacts from said cover.

Claim 11

Apparatus as set forth in claim 1 wherein said conductive paths are formed from a beryllium copper alloy.

Claim 12

Electrical circuit test apparatus comprising: a) a body including means for resiliently supporting a test component to said body such that a plurality of component terminals project into a first cavity disposed in said body adjacent said support means and further including cover means mounted to said body to contact each component inserted; b) contact means having a conductive signal layer, first and second ground layers and first and second dielectric layers; wherein said signal layer is mounted between said first and second dielectric layers; wherein said first and second ground layers cover said first and second dielectric layers; wherein said signal layer includes a plurality of seamless conductive paths; wherein a plurality of apertures communicate through said first and second dielectric layers with said plurality of conductive paths; wherein each of said plurality of conductive paths includes first and second etched terminations and an interconnecting field path; wherein the vertical thickness of said first and second terminations is greater than said field path; and wherein said said first terminations project unsupported from a peripheral edge of said first and second dielectric layers into said first cavity; and c) a plurality of capacitors mounted to said cover means and coupled to spring means for resiliently biasing a plurality of contacts to engage each of said first terminations and for completing a plurality of circuit paths through each of said plurality of capacitors upon contacting said cover means to a component.

Claim 13

Electrical circuit test apparatus comprising: a) a body including means for resiliently supporting a test component to said body such that a plurality of component terminals project into a first cavity disposed in said body adjacent said support means and further including cover means mounted to said body to contact each component inserted; b) contact means having a conductive signal layer, first and second ground layers and first and second dielectric layers; wherein said signal layer is mounted between said first and second dielectric layers; wherein said first and second ground layers cover said first and second dielectric layers; wherein said signal layer includes a plurality of seamless conductive paths; wherein a plurality of apertures communicate through said first and second dielectric layers with said plurality of conductive paths; wherein each of said plurality of conductive paths includes first and second etched terminations and an interconnecting field path; wherein the vertical thickness of said first and second terminations is greater than said field path; and wherein said said first terminations project unsupported from a peripheral edge of said first and second dielectric layers into said first cavity; and c) a plurality of capacitors mounted to said cover means and coupled to spring means for resiliently biasing a plurality of contacts to engage each of said first terminations and for completing a plurality of circuit paths through each of said plurality of capacitors upon contacting said cover means to a component.

Claim 14

Electrical circuit test apparatus comprising: a) a body including means for resiliently supporting a test component to said body such that a plurality of component terminals project into a first cavity disposed in said body adjacent said support means and further including cover means mounted to said body to contact each component; b) contact means having a conductive signal layer, a ground layer and a flexible dielectric layer; wherein said dielectric layer separates said signal layer and said ground layer; wherein said dielectric layer includes a center portion and from which radiates a plurality of wings; wherein said signal layer includes a plurality of seamless conductive paths; wherein each of said plurality of conductive paths includes first and second etched terminations and an interconnecting field path; wherein the vertical thickness of said first and second terminations is greater than said field path; and wherein said wings are folded to envelop said body such that said first terminations project unsupported from a peripheral edge of said plurality of wings into said first cavity and said second terminations depend from beneath said body; and c) means mounted to said cover means for capacitively decoupling each of said first terminations to said ground layer at substantially the point of contact between each of said first terminations and each of said terminals.

Claim 15

Electrical circuit test apparatus comprising: a) a body including means for resiliently supporting a test component to said body such that a plurality of component terminals project into a first cavity disposed in said body adjacent said support means and further including cover means mounted to said body to contact each component; b) contact means having a conductive signal layer, a ground layer and a flexible dielectric layer; wherein said dielectric layer separates said signal layer and said ground layer; wherein said dielectric layer includes a center portion and from which radiates a plurality of wings; wherein said signal layer includes a plurality of seamless conductive paths; wherein each of said plurality of conductive paths includes first and second etched terminations and an interconnecting field path; wherein the vertical thickness of said first and second terminations is greater than said field path; and wherein said wings are folded to envelop said body such that said first terminations project unsupported from a peripheral edge of said plurality of wings into said first cavity and said second terminations depend from beneath said body; and c) means mounted to said cover means for capacitively decoupling each of said first terminations to said ground layer at substantially the point of contact between each of said first terminations and each of said terminals.

Claim 16

Electrical circuit test apparatus comprising: a) a body including means for resiliently supporting a test component to said body such that a plurality of component terminals project into a first cavity disposed in said body adjacent said support means and further including cover means mounted to said body to contact each component; b) a component retainer having a support surface which receives a component, wherein said support surface includes first protrusions which index the component to the support surface and second protrusions which index the retainer to the second surface and spring means for resiliently biasing said component support above said second surface; c) contact means having a conductive signal layer, a ground layer and a dielectric layer; wherein said layer separates said signal layer and said ground layer; wherein said signal layer includes a plurality of seamless conductive paths; wherein each of said plurality of conductive paths includes first and second etched terminations and an interconnecting field path; wherein said first terminations project unsupported from a peripheral edge of said dielectric layer into said first cavity; and wherein the vertical thickness of said first and second terminations is greater than said field path; and c) a plurality of capacitors mounted to said cover means and coupled to spring means for resiliently biasing a plurality of contacts to engage each of said first terminations, whereby a plurality of circuit paths are resiliently completed through each of said plurality of first terminations and capacitors upon contacting said cover means to a component and said first terminations to said terminals.

Claim 17

Electrical circuit test apparatus comprising: a) a body including means for resiliently supporting a test component to said body such that a plurality of component terminals project into a first cavity disposed in said body adjacent said support means and further including cover means mounted to said body to contact each component; b) a component retainer having a support surface which receives a component, wherein said support surface includes first protrusions which index the component to the support surface and second protrusions which index the retainer to the second surface and spring means for resiliently biasing said component support above said second surface; c) contact means having a conductive signal layer, a ground layer and a dielectric layer; wherein said layer separates said signal layer and said ground layer; wherein said signal layer includes a plurality of seamless conductive paths; wherein each of said plurality of conductive paths includes first and second etched terminations and an interconnecting field path; wherein said first terminations project unsupported from a peripheral edge of said dielectric layer into said first cavity; and wherein the vertical thickness of said first and second terminations is greater than said field path; and c) a plurality of capacitors mounted to said cover means and coupled to spring means for resiliently biasing a plurality of contacts to engage each of said first terminations, whereby a plurality of circuit paths are resiliently completed through each of said plurality of first terminations and capacitors upon contacting said cover means to a component and said first terminations to said terminals.