Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
146 words
A process for forming a capacitor on a substrate having circuitry comprising the steps of: depositing a first insulative layer on said substrate; depositing a first conductive layer on said first insulative layer; depositing a second insulative layer on said first conductive layer; depositing a second conductive layer on said second insulative layer; depositing a third insulative layer on said second conductive layer; and forming a patterning layer on said third insulative layer, said patterning layer having an opening therein, said opening exposing a first region; etching said third insulative layer, said second conductive layer, said second insulative layer, said first conductive layer and said first insulative layer from said first region to form an opening through said etched layers, said opening having a sidewall; and depositing a fourth insulative layer and anisotropically etching said fourth insulative layer to form a sidewall insulator on said sidewall.
Claim 2
Dependent Claim
146 words
A process for forming a capacitor on a substrate having circuitry comprising the steps of: depositing a first insulative layer on said substrate; depositing a first conductive layer on said first insulative layer; depositing a second insulative layer on said first conductive layer; depositing a second conductive layer on said second insulative layer; depositing a third insulative layer on said second conductive layer; and forming a patterning layer on said third insulative layer, said patterning layer having an opening therein, said opening exposing a first region; etching said third insulative layer, said second conductive layer, said second insulative layer, said first conductive layer and said first insulative layer from said first region to form an opening through said etched layers, said opening having a sidewall; and depositing a fourth insulative layer and anisotropically etching said fourth insulative layer to form a sidewall insulator on said sidewall.
Claim 3
Dependent Claim
22 words
The process as described in claim 1 wherein said opening exposes one of a lower level conductive layer and a semiconductor region.
Claim 4
Dependent Claim
35 words
The process as described in claim 1 further comprising the steps of: depositing a conductive material in said opening; and, depositing an upper level conductive layer on said third insulative layer and said conductive material.
Claim 5
Dependent Claim
35 words
The process as described in claim 2 further comprising the steps of: depositing a conductive material in said opening; and, depositing an upper level conductive layer on said third insulative layer and said conductive material.
Claim 6
Dependent Claim
25 words
The process as described in claim 3 wherein said steps of depositing said conductive material and depositing said upper level conductive layer are performed simultaneously.
Claim 7
Dependent Claim
83 words
The process as described in claim 3, wherein said opening exposes a lower level conductive layer, said lower level conductive layer being coupled to one of a power source and a ground, wherein said third insulative layer has a third insulative layer opening formed therein, said third insulative layer opening exposing said second conductive layer, and wherein said conductive material is further deposited in said third insulative layer opening, such that said second conductive layer is coupled to said lower level conductive layer.
Claim 8
Dependent Claim
68 words
The process as described in claim 1 further comprising the step of forming a first insulative layer opening in said first insulative layer prior to depositing said first conductive layer, wherein said first insulative layer opening exposes a portion of said substrate, and wherein said first conductive layer is further deposited in said opening such that said first conductive layer is coupled to said portion of said substrate.
Claim 9
Dependent Claim
142 words
A process for forming a capacitor on a substrate having circuitry comprising the steps of: depositing a first insulative layer on said substrate; depositing a first conductive layer on said insulative layer; depositing a second insulative layer on said first conductive layer; forming a patterning layer on said second insulative layer, said patterning layer having a first opening therein, said first opening exposing a first region; etching said second insulative layer, said first conductive layer and said first insulative layer from said first region to form a second opening through said etched layers, said second opening having a sidewall; depositing a fourth insulative layer and anisotropically etching said fourth insulative layer to form a sidewall insulator on said sidewall; depositing a conductive material in said second opening; and, depositing a second conductive layer on said second insulative layer and said conductive material.
Claim 10
Dependent Claim
142 words
A process for forming a capacitor on a substrate having circuitry comprising the steps of: depositing a first insulative layer on said substrate; depositing a first conductive layer on said insulative layer; depositing a second insulative layer on said first conductive layer; forming a patterning layer on said second insulative layer, said patterning layer having a first opening therein, said first opening exposing a first region; etching said second insulative layer, said first conductive layer and said first insulative layer from said first region to form a second opening through said etched layers, said second opening having a sidewall; depositing a fourth insulative layer and anisotropically etching said fourth insulative layer to form a sidewall insulator on said sidewall; depositing a conductive material in said second opening; and, depositing a second conductive layer on said second insulative layer and said conductive material.
Claim 11
Dependent Claim
28 words
The process as described in claim 8 wherein said steps of depositing said conductive material in said second opening and depositing said second conductive layer are performed simultaneously.
Claim 12
Dependent Claim
17 words
The process as described in claim 8 wherein said second conductive layer comprises a power distribution level.
Claim 13
Dependent Claim
17 words
The process as described in claim 9 wherein said second conductive layer comprises a power distribution level.