Optical monitoring of growth and etch rate of materials

Claim 1

A method for determining the rate of change of thickness in a first thin planar layer of a first material having a refractive index n 2 at a predetermined wavelength λ 1 and being at least partly transparent to light at the wavelength λ 1 , fabricated on a second layer of a different material, where the first layer is positioned between and has an interface with each of the second layer and a third layer of material that overlies the first layer, and where it is intended that the thickness of the first layer will be decreasing with time or increasing with time, the method comprising the steps of: providing a planar substrate with said second, first, and third planar layers thereon; creating an aperture through the third layer of material so that a portion of the first layer is exposed; directing a light beam including a component of wavelength λ 1 into the aperture to illuminate the exposed first layer at a predetermined incidence angle θ 1 such that a portion of the light beam is reflected at the surface of the exposed first layer and at the first layer-second layer interface; performing an interferometry intensity measurement of light beam reflectivity R at each of a sequence of consecutive times {t i } i=1 N at which the reflectivity attains a local extremum, with t 1 <t 2 < . . . <t N ; determining the average rate of change v i of thickness of the first layer in a time interval t i <t<t i+1 (i=1,2, . . . , N-1) by use of the relation v.sub.i =λ.sub.1 /2n.sub.2 (t.sub.i+1 -t.sub.i).

Claim 2

A method for determining the rate of change of thickness in a first thin planar layer of a first material having a refractive index n 2 at a predetermined wavelength λ 1 and being at least partly transparent to light at the wavelength λ 1 , fabricated on a second layer of a different material, where the first layer is positioned between and has an interface with each of the second layer and a third layer of material that overlies the first layer, and where it is intended that the thickness of the first layer will be decreasing with time or increasing with time, the method comprising the steps of: providing a planar substrate with said second, first, and third planar layers thereon; creating an aperture through the third layer of material so that a portion of the first layer is exposed; directing a light beam including a component of wavelength λ 1 into the aperture to illuminate the exposed first layer at a predetermined incidence angle θ 1 such that a portion of the light beam is reflected at the surface of the exposed first layer and at the first layer-second layer interface; performing an interferometry intensity measurement of light beam reflectivity R at each of a sequence of consecutive times {t i } i=1 N at which the reflectivity attains a local extremum, with t 1 <t 2 < . . . <t N ; determining the average rate of change v i of thickness of the first layer in a time interval t i <t<t i+1 (i=1,2, . . . , N-1) by use of the relation v.sub.i =λ.sub.1 /2n.sub.2 (t.sub.i+1 -t.sub.i).

Claim 6

A method for determining the rate of change of thickness in a first thin planar layer of a first material having a refractive index n 2 at a predetermined wavelength λ 1 , in an ambient medium with a refractive index n 1 , and being at least partly transparent to light at the wavelength λ 1 , fabricated on a second layer of a different material, where the first layer is positioned between and has an interface with each of the second layer and a third layer of material that overlies the first layer, and where it is intended that the thickness of the first layer will be decreasing with time or increasing with time, the method comprising the steps of: providing a planar substrate with said second, first, and third planar layers thereon; creating an aperture through the third layer of material so that a portion of the first layer is exposed; directing a light beam including a component of wavelength λ 1 into the aperture to illuminate the exposed first layer at a predetermined incidence angle θ 1 such that a portion of the light beam is reflected at the surface of the exposed first layer and at the first layer-second layer interface; performing an interferometry intensity measurement of light beam reflectivity R at each of a sequence of consecutive times {t i } i=1 N at which the reflectivity attains a local extremum, with t 1 <t 2 < . . . <t N ; determining the average rate of change v i of thickness of the first layer in a time interval t i <t<t i+1 (i=1,2, . . . , N-1) by use of the relation v.sub.i =λ.sub.1 sec[sin.sup.-1 (n.sub.1,sin θ.sub.1 /n.sub.2)]/2n.sub.2 (t.sub.i+1 -t.sub.i).

Claim 7

A method for determining the rate of change of thickness in a first thin planar layer of a first material having a refractive index n 2 at a predetermined wavelength λ 1 , in an ambient medium with a refractive index n 1 , and being at least partly transparent to light at the wavelength λ 1 , fabricated on a second layer of a different material, where the first layer is positioned between and has an interface with each of the second layer and a third layer of material that overlies the first layer, and where it is intended that the thickness of the first layer will be decreasing with time or increasing with time, the method comprising the steps of: providing a planar substrate with said second, first, and third planar layers thereon; creating an aperture through the third layer of material so that a portion of the first layer is exposed; directing a light beam including a component of wavelength λ 1 into the aperture to illuminate the exposed first layer at a predetermined incidence angle θ 1 such that a portion of the light beam is reflected at the surface of the exposed first layer and at the first layer-second layer interface; performing an interferometry intensity measurement of light beam reflectivity R at each of a sequence of consecutive times {t i } i=1 N at which the reflectivity attains a local extremum, with t 1 <t 2 < . . . <t N ; determining the average rate of change v i of thickness of the first layer in a time interval t i <t<t i+1 (i=1,2, . . . , N-1) by use of the relation v.sub.i =λ.sub.1 sec[sin.sup.-1 (n.sub.1,sin θ.sub.1 /n.sub.2)]/2n.sub.2 (t.sub.i+1 -t.sub.i).