US5460689A
Expired / Lapsed
US
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High pressure plasma treatment method and apparatus
Assignee: Applied Materials Inc
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Filing: 1994-02-28
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Granted: 1995-10-24
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Expires: 2014-02-28
Abstract
Abstract A method of precleaning a wafer including the steps of placing the wafer in a plasma chamber; flowing a gas into the plasma chamber; establishing a plasma in the chamber at a first pressure; after establishing the plasma, plasma etching the wafer at the first pressure for a first period of time; transitioning to a second pressure that is different from the first pressure; plasma etching the wafer at the second pressure for a second period of time; and after the second period of time has elapsed, discontinuing plasma etching at the second pressure.
Inventors
- 👤 Ivo J. Raaijmakers
- 👤 Jaim Nulman
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 05:33
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/056; H01; H01J; H01J37/00; H01J37/32; H01J37/32009; H01J37/32082; H01J37/321; H10P; H10P50/00; H10P50/20; H10P50/28; H10P50/282; H10P50/283; H10P70/00; H10P70/20; H10P70/23; H10P70/234; H10P70/27
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
97 words
A method of pretreating a wafer comprising: placing the wafer in a plasma chamber; flowing a gas into the plasma chamber; establishing a plasma in said chamber having a first pressure therein; after establishing the plasma, plasma etching said wafer at the first pressure for a first period of time; transitioning to a second pressure in said chamber, said second pressure being different from said first pressure; plasma etching said wafer at the second pressure for a second period of time; and after the second period of time has elapsed, discontinuing plasma etching at said second pressure.
Claim 2
Independent Claim
97 words
A method of pretreating a wafer comprising: placing the wafer in a plasma chamber; flowing a gas into the plasma chamber; establishing a plasma in said chamber having a first pressure therein; after establishing the plasma, plasma etching said wafer at the first pressure for a first period of time; transitioning to a second pressure in said chamber, said second pressure being different from said first pressure; plasma etching said wafer at the second pressure for a second period of time; and after the second period of time has elapsed, discontinuing plasma etching at said second pressure.
Claim 3
Dependent Claim
21 words
The method of claim 1 wherein said first pressure is at least an order of magnitude different from said second pressure.
Claim 4
Dependent Claim
15 words
The method of claim 2 wherein said first pressure is higher than said second pressure.
Claim 5
Dependent Claim
13 words
The method of claim 3 wherein said first pressure is above 10 mTorr.
Claim 6
Dependent Claim
15 words
The method of claim 4 wherein said first pressure is greater than about 50 mTorr.
Claim 7
Dependent Claim
14 words
The method of claim 5 wherein said first pressure is greater than 100 mTorr.
Claim 8
Dependent Claim
13 words
The method of claim 3 wherein said second pressure is below 10 mTorr.
Claim 9
Dependent Claim
13 words
The method of claim 7 wherein said second pressure is below 1 mTorr.
Claim 10
Dependent Claim
21 words
The method of claim 2 wherein said first pressure is above 10 mTorr and said second pressure is below 1 mTorr.
Claim 11
Dependent Claim
12 words
The method of claim 3 wherein said gas is a nonreactive gas.
Claim 12
Dependent Claim
10 words
The method of claim 10 wherein said gas is argon.
Claim 13
Dependent Claim
19 words
The method of claim 3 further comprising maintaining a plasma in said chamber while transitioning to said second pressure.
Claim 14
Dependent Claim
20 words
The method of claim 3 further comprising powering down the plasma chamber after discontinuing plasma etching at said second pressure.
Claim 15
Dependent Claim
51 words
The method of claim 1 wherein said wafer has a top layer with contact holes formed therein and further comprising using a vapor deposition process to deposit a metal layer on top of the top layer and in said contact holes after completing the plasma etching step at said second pressure.
Claim 16
Dependent Claim
64 words
The method of claim 1 wherein said wafer has a top layer with contact holes formed therein, and wherein the plasma etching step at one of the two mentioned pressures is primarily for the purpose of facetting upper edges of said contact holes and the plasma etching step at the other pressure is primarily for the purpose of cleaning bottoms of said contact holes.
Claim 17
Independent Claim
165 words
A method of pretreating a wafer having a top layer with contact holes formed therein, said method comprising: placing the wafer in a plasma chamber; flowing a gas through the plasma chamber; establishing a first pressure in said chamber with the gas flowing through the chamber, said first pressure selected such that plasma etching at said first pressure is primarily for the purpose of facetting upper corners of the contact holes; striking a plasma in said chamber; after striking the plasma, plasma etching said wafer at the first pressure for a first period of time; establishing a second pressure in said chamber, said second pressure being lower than said first pressure, said second pressure selected such that plasma etching at said second pressure is primarily for the purpose of cleaning bottoms of said contact holes; plasma etching said wafer at the second pressure for a second period of time; and after the second period of time has elapsed, discontinuing plasma etching at said second pressure.
Claim 18
Independent Claim
165 words
A method of pretreating a wafer having a top layer with contact holes formed therein, said method comprising: placing the wafer in a plasma chamber; flowing a gas through the plasma chamber; establishing a first pressure in said chamber with the gas flowing through the chamber, said first pressure selected such that plasma etching at said first pressure is primarily for the purpose of facetting upper corners of the contact holes; striking a plasma in said chamber; after striking the plasma, plasma etching said wafer at the first pressure for a first period of time; establishing a second pressure in said chamber, said second pressure being lower than said first pressure, said second pressure selected such that plasma etching at said second pressure is primarily for the purpose of cleaning bottoms of said contact holes; plasma etching said wafer at the second pressure for a second period of time; and after the second period of time has elapsed, discontinuing plasma etching at said second pressure.
Claim 19
Independent Claim
151 words
An apparatus for performing a two phase plasma etching process on a wafer, said apparatus comprising: a chamber body; a platform within said chamber body for holding the wafer during plasma etching; a quartz bell jar mounted on the chamber body to form an enclosure surrounding the platform; a coil surrounding the quartz bell jar; a first RF supply connected to the coil for generating a plasma above the wafer; a second RF power supply supplying power to the platform to bias the wafer during plasma etching; a first mass flow controller for controlling the flow of a gas into the chamber during a low pressure phase of plasma etching; and a second mass flow controller for controlling the flow of the gas into the chamber during a high pressure phase of plasma etching, said first mass flow controller rated at a higher flow rate than said second mass flow controller.
Claim 20
Independent Claim
151 words
An apparatus for performing a two phase plasma etching process on a wafer, said apparatus comprising: a chamber body; a platform within said chamber body for holding the wafer during plasma etching; a quartz bell jar mounted on the chamber body to form an enclosure surrounding the platform; a coil surrounding the quartz bell jar; a first RF supply connected to the coil for generating a plasma above the wafer; a second RF power supply supplying power to the platform to bias the wafer during plasma etching; a first mass flow controller for controlling the flow of a gas into the chamber during a low pressure phase of plasma etching; and a second mass flow controller for controlling the flow of the gas into the chamber during a high pressure phase of plasma etching, said first mass flow controller rated at a higher flow rate than said second mass flow controller.
Claim 21
Dependent Claim
49 words
The method of claim 1 wherein said wafer has a top layer with vias formed therein and further comprising using a vapor deposition process to deposit a metal layer on top of the top layer and in said vias after completing the plasma etching step at said second pressure.
Claim 22
Dependent Claim
61 words
The method of claim 1 wherein said wafer has a top layer with vias formed therein, and wherein the plasma etching step at one of the two mentioned pressures is primarily for the purpose of facetting upper edges of said vias and the plasma etching step at the other pressure is primarily for the purpose of cleaning inside of said vias.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-10-23 | 1999-04-24 | 1999-10-24 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-10-23 | 2003-04-24 | 2003-10-24 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-10-23 | 2007-04-24 | 2007-10-24 | $7700.00 | Window Closed / Lapsed |