US5457401A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor device testing apparatus
Assignee: Sumitomo Electric Industries Ltd
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Filing: 1995-01-12
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Granted: 1995-10-10
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Expires: 2015-01-12
Abstract
Abstract A testing apparatus which assures that a constant acceleration test and an AC continuous operation test can be simultaneously conducted on semiconductor devices to be tested. The testing apparatus includes a rotatable turntable with semiconductor devices to be tested mounted thereon, rotary terminals electrically connected to connection pins of the semiconductor devices mounted on the turntable and adapted to rotate together with the turntable, and stationary terminals adapted to intermittently or continuously slidably contact the rotary terminals while the turntable is rotated.
Inventors
- 👤 Tatsuya Hashinaga
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 15:33
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2855; G01R31/2872; G01R31/2881
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
159 words
A semiconductor device testing apparatus for concurrently conducting an AC continuous operation test and a constant acceleration test, comprising: a turntable that rotates so as to provide a substantially constant rotational acceleration to a plurality of semiconductor devices, each semiconductor device having connection pins; holding means, secured to said turntable, for firmly holding each said semiconductor device, and for providing an electrical connection to a selected one of said connection pins of each semiconductor device; a rotary terminal secured to said turntable, and electrically connected to said holding means, so as to provide an electrical connection between said rotary terminal and each said semiconductor device; and a stationary terminal, which is electrically connected to said rotary terminal and an independent AC power supply; wherein said electrical connection of said rotary terminal and said stationary terminal permits an alternating current to be supplied to each said semiconductor device while said substantially constant rotational acceleration of said semiconductor device is occurring.
Claim 2
Dependent Claim
159 words
A semiconductor device testing apparatus for concurrently conducting an AC continuous operation test and a constant acceleration test, comprising: a turntable that rotates so as to provide a substantially constant rotational acceleration to a plurality of semiconductor devices, each semiconductor device having connection pins; holding means, secured to said turntable, for firmly holding each said semiconductor device, and for providing an electrical connection to a selected one of said connection pins of each semiconductor device; a rotary terminal secured to said turntable, and electrically connected to said holding means, so as to provide an electrical connection between said rotary terminal and each said semiconductor device; and a stationary terminal, which is electrically connected to said rotary terminal and an independent AC power supply; wherein said electrical connection of said rotary terminal and said stationary terminal permits an alternating current to be supplied to each said semiconductor device while said substantially constant rotational acceleration of said semiconductor device is occurring.
Claim 3
Dependent Claim
143 words
A semiconductor device testing apparatus, comprising: a turntable that rotates so as to provide a substantially constant rotational acceleration to a semiconductor device that has connection pins; holding means, secured to said turntable, for firmly holding said semiconductor device, and for providing an electrical connection to at least one of said connection pins; a rotary terminal secured to said turntable, and electrically connected to said holding means, thereby providing an electrical connection between said rotary terminal and said at least one of said connection pins; and a stationary terminal, which is electrically connected to said rotary terminal and an independent AC power supply; wherein said electrical connection of said rotary terminal and said stationary terminal permits an alternating current to be supplied to said at least one of said connection pins while said substantially constant rotational acceleration of said semiconductor device is occurring.
Claim 4
Dependent Claim
143 words
A semiconductor device testing apparatus, comprising: a turntable that rotates so as to provide a substantially constant rotational acceleration to a semiconductor device that has connection pins; holding means, secured to said turntable, for firmly holding said semiconductor device, and for providing an electrical connection to at least one of said connection pins; a rotary terminal secured to said turntable, and electrically connected to said holding means, thereby providing an electrical connection between said rotary terminal and said at least one of said connection pins; and a stationary terminal, which is electrically connected to said rotary terminal and an independent AC power supply; wherein said electrical connection of said rotary terminal and said stationary terminal permits an alternating current to be supplied to said at least one of said connection pins while said substantially constant rotational acceleration of said semiconductor device is occurring.
Claim 5
Dependent Claim
21 words
An apparatus according to claim 2, wherein said turntable is cylindrical in shape and said stationary terminal is annular in shape.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-10-09 | 1999-04-10 | 1999-10-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-10-09 | 2003-04-10 | 2003-10-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-10-09 | 2007-04-10 | 2007-10-10 | $7700.00 | Window Closed / Lapsed |