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US5445311A Expired / Lapsed US ⏱️ 0.0 years remaining

Electrical interconnection substrate with both wire bond and solder contacts, and fabrication method

Assignee: OL Security LLC
•
Filing: 1994-10-13
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Granted: 1995-08-29
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Expires: 2014-10-13
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Abstract

Abstract An electrical interconnection substrate (20) is prepared to receive both wire bonded and soldered connections (60,64,66) by forming a dielectric solder mask (30) over the substrate (20), with openings (36) in the mask (30) to expose the contact pads (22) for which soldered connections are desired. The substrate (20) is exposed to a molten solder alloy (44) in a wave soldering process that dissolves the wire bonding material (28) (preferably gold) from the exposed pads (22) and deposits solder bonding pads (52) in its place. Excess solder is then removed from the substrate, and openings (54) are formed through the solder mask (30) to expose the wire bond contact pads (22'). The selective dissolving of gold bonding layers (28) and their replacement by solder pads (52) prevents the establishment of brittle gold-solder intermetallics, and the deposited solder (52) requires no further heat treatment for correct alloy formation.

Inventors

  • 👤 Philip A. Trask
  • 👤 Vincent A. Pillai
  • 👤 Thomas J. Gierhart

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 06:00
CPC Classifications
H; H05; H05K; H05K3/00; H05K3/30; H05K3/32; H05K3/34; H05K3/3452; B; B23; B23K; B23K1/00; B23K1/0008; B23K1/0016; B23K1/018; B23K1/08; B23K1/085; H05K3/22; H05K3/24; H05K3/243; H05K3/3465; H05K3/3468; H10; H10W; H10W70/00; H10W70/01; H10W70/05; H10W70/097; H10W70/60; H10W70/611; H10W72/00; H10W72/01; H10W72/019; H10W90/00; H10W99/00; H05K2201/00; H05K2201/01; H05K2201/0137; H05K2201/0154; H05K2201/03; H05K2201/0302; H05K2201/0305; H05K2201/0332; H05K2201/0388; H05K2201/0391; H05K2203/00; H05K2203/03; H05K2203/0361; H05K2203/04; H05K2203/044; H05K2203/049; H05K2203/05; H05K2203/0562; H05K2203/0585; H05K3/0011; H05K3/0017; H05K3/0041; H05K3/02; H05K3/06; H05K3/067; H05K3/28; H05K3/328; H10W72/071; H10W72/072; H10W72/07231; H10W72/07236; H10W72/07251; H10W72/20; H10W72/29; H10W72/50; H10W72/531; H10W72/5363; H10W72/551; H10W72/552; H10W72/5522; H10W72/59; H10W72/90; H10W72/921; H10W72/923; H10W72/931; H10W72/934; H10W72/951; H10W72/952; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/4913; Y10T29/49144

Claims Analysis

Total Claims: 21
Claim 1
Independent Claim 136 words
A method of preparing an electrical interconnection substrate to receive electrical circuit elements by both wire bonded and soldered connections, the substrate having a plurality of wire bond contact pads formed with a layer of conductive wire bonding material, comprising: forming a solder mask over said substrate, with openings in said mask exposing the contact pads for which soldered connections are desired, exposing said substrate to a molten solder alloy to dissolve the wire bonding material from the exposed contact pads into the molten solder, and to deposit a layer of solder onto said mask and into said mask openings, the solder deposited into said mask openings forming solderable contact pads, removing solder from said mask between said openings, and exposing through said solder mask the wire bond contact pads for which wire bonding is desired.
Claim 2
Independent Claim 136 words
A method of preparing an electrical interconnection substrate to receive electrical circuit elements by both wire bonded and soldered connections, the substrate having a plurality of wire bond contact pads formed with a layer of conductive wire bonding material, comprising: forming a solder mask over said substrate, with openings in said mask exposing the contact pads for which soldered connections are desired, exposing said substrate to a molten solder alloy to dissolve the wire bonding material from the exposed contact pads into the molten solder, and to deposit a layer of solder onto said mask and into said mask openings, the solder deposited into said mask openings forming solderable contact pads, removing solder from said mask between said openings, and exposing through said solder mask the wire bond contact pads for which wire bonding is desired.
Claim 3
Dependent Claim 39 words
The method of claim 1, wherein said wire bond contact pads for which wire bonding is desired are exposed by forming openings in said mask over said contact pads, while leaving the remainder of said mask on the substrate.
Claim 4
Dependent Claim 9 words
The method of claim 2, said mask comprising polyimide.
Claim 5
Dependent Claim 35 words
The method of claim 1, wherein said wire bond contact pads are provided with said layer of wire bonding material thick enough to be wire bondable, but thin enough to dissolve into said molten solder.
Claim 6
Dependent Claim 31 words
The method of claim 4, wherein said wire bond contact pads are provided with a layer of conductive, substantially non-ductile material surmounted by a layer of gold about 1-5 microns thick.
Claim 7
Dependent Claim 24 words
The method of claim 1, wherein said substrate is exposed to said molten solder alloy by passing it through a molten solder alloy bath.
Claim 8
Dependent Claim 20 words
The method of claim 6, wherein said substrate is exposed to said molten solder alloy by a wave soldering process.
Claim 9
Dependent Claim 19 words
The method of claim 6, wherein said substrate is passed through multiple passes of said molten solder alloy bath.
Claim 10
Dependent Claim 18 words
The method of claim 1, wherein an air-knife is used to remove said solder from between said openings.
Claim 11
Dependent Claim 24 words
The method of claim 1, wherein said mask is provided as an aluminum on dielectric laminate to obtain substantially straight openings through said mask.
Claim 12
Dependent Claim 22 words
The method of claim 10, wherein said mask openings are formed by wet etching said aluminum and reactive ion etching said dielectric.
Claim 13
Dependent Claim 23 words
The method of claim 10, wherein the aluminum portion of said mask is removed prior to exposing said substrate to said molten solder.
Claim 14
Dependent Claim 51 words
The method of claim 1, further comprising the steps of wire bonding at least one wire bondable integrated circuit (IC) chip to at least some of said exposed wire bond contact pads, and solder connecting at least one solder connectable IC chip to at least some of said solderable contact pads.
Claim 15
Independent Claim 82 words
A method of converting a wire bondable contact pad on a substrate to a solderable contact pad, said wire bondable contact pad having a layer of conductive wire bondable material, comprising: removing said layer of conductive wire bondable material from said wire bondable contact pad by exposing it to a molten solder alloy and dissolving it into said solder alloy, and depositing a solder alloy onto said contact pad with the same molten solder exposure used to dissolve said wire bondable material.
Claim 16
Independent Claim 82 words
A method of converting a wire bondable contact pad on a substrate to a solderable contact pad, said wire bondable contact pad having a layer of conductive wire bondable material, comprising: removing said layer of conductive wire bondable material from said wire bondable contact pad by exposing it to a molten solder alloy and dissolving it into said solder alloy, and depositing a solder alloy onto said contact pad with the same molten solder exposure used to dissolve said wire bondable material.
Claim 17
Dependent Claim 33 words
The method of claim 14, wherein said contact pad is provided with said layer of wire bonding material thick enough to be wire bondable, but thin enough to dissolve into said molten solder.
Claim 18
Dependent Claim 29 words
The method of claim 15, wherein said contact pad is provided with a layer of conductive, substantially non-ductile material surmounted by a layer of gold about 1-5 microns thick.
Claim 19
Dependent Claim 35 words
The method of claim 14, wherein said layer of conductive wire bondable material is removed and said solder alloy is deposited onto said contact pad by passing said substrate through a molten solder alloy bath.
Claim 20
Dependent Claim 21 words
The method of claim 17, wherein said contact pad is exposed to said molten solder alloy by a wave soldering process.
Claim 21
Dependent Claim 19 words
The method of claim 17, wherein said substrate is passed through multiple passes of said molten solder alloy bath.

References Cited (Backward Citations)

GB2125618A Cited
US5002818A Cited
US5254493A Cited
US5118385A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-08-28 1999-02-27 1999-08-29 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-08-28 2003-02-27 2003-08-29 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-08-28 2007-02-27 2007-08-29 $7700.00 Window Closed / Lapsed

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