Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
178 words
A method of operating an electrically readable, electrically erasable and electrically programmable non-volatile memory system that includes a memory array of cells that are organized along rows and columns, whereby a given row is controllable by control inputs of said memory system and said row stores at least one page of data bytes that were supplied from one or more data inputs that is separate from said control inputs of said memory system, said method comprising: applying to said control inputs a first combination of voltage levels that are within a range of voltage levels applied to said control inputs during the read operation and representing a first combination of logical levels to cause erasure of only one page of data from said memory array; and applying to said control inputs a second combination of voltage levels that are within said range of voltage levels applied to said control inputs during the read operation and representing a second combination of logical levels to cause the simultaneous erasure of at least two pages of data from said memory array.
Claim 2
Independent Claim
178 words
A method of operating an electrically readable, electrically erasable and electrically programmable non-volatile memory system that includes a memory array of cells that are organized along rows and columns, whereby a given row is controllable by control inputs of said memory system and said row stores at least one page of data bytes that were supplied from one or more data inputs that is separate from said control inputs of said memory system, said method comprising: applying to said control inputs a first combination of voltage levels that are within a range of voltage levels applied to said control inputs during the read operation and representing a first combination of logical levels to cause erasure of only one page of data from said memory array; and applying to said control inputs a second combination of voltage levels that are within said range of voltage levels applied to said control inputs during the read operation and representing a second combination of logical levels to cause the simultaneous erasure of at least two pages of data from said memory array.
Claim 3
Dependent Claim
44 words
The method of claim 1 wherein applying to said control inputs said second combination of voltage levels within said range of voltage levels applied to said control inputs during the read operation causes flash simultaneous erasure of all the pages of said memory array.
Claim 4
Dependent Claim
22 words
The method of claim 1 wherein each page includes a number of logical bits that is a multiple of the number 512.
Claim 5
Independent Claim
101 words
A method of writing and reading multi-bit digital information to and from a physical memory cell FET storage transistor of a semiconductor non-volatile memory array, comprising: converting a set of voltage levels representing a first set of logical levels of a digital data byte into a first analog voltage; applying said first analog voltage to said storage FET transistor thereby permanently changing the value of its channel current conductivity; and converting a second analog voltage that is read from said storage FET transistor to a set of voltage levels representing said first set of logical levels of said digital data byte.
Claim 6
Independent Claim
101 words
A method of writing and reading multi-bit digital information to and from a physical memory cell FET storage transistor of a semiconductor non-volatile memory array, comprising: converting a set of voltage levels representing a first set of logical levels of a digital data byte into a first analog voltage; applying said first analog voltage to said storage FET transistor thereby permanently changing the value of its channel current conductivity; and converting a second analog voltage that is read from said storage FET transistor to a set of voltage levels representing said first set of logical levels of said digital data byte.
Claim 7
Dependent Claim
17 words
The method of claim 4 wherein said first analog voltage is equal to said second analog voltage.
Claim 8
Dependent Claim
13 words
The method of claim 4 wherein said digital data byte represent binary information.
Claim 9
Dependent Claim
29 words
The method of claim 4 wherein said change in current conductivity occurs due to change in the amount of charge stored in a floating gate of a memory transistor.
Claim 10
Dependent Claim
25 words
The method of claim 4 wherein said digital to analog conversion and said analog to digital conversions are performed by a single monolithic semiconductor chip.
Claim 11
Dependent Claim
53 words
The method of claim 4 wherein: said first analog voltage is applied to a drain terminal of an FET transistor thereby permanently changing its current conductivity to a desired level; decoupling said first analog voltage from said FET transistor; and sensing said second analog voltage from the source terminal of said FET transistor.
Claim 12
Dependent Claim
53 words
The method of claim 4 wherein: said first analog voltage is applied to a drain terminal of an FET transistor thereby permanently changing its current conductivity to a desired level; decoupling said first analog voltage from said FET transistor; and sensing said second analog voltage from said drain terminal of said FET transistor.
Claim 13
Independent Claim
181 words
A method of operating an electrically readable, electrically erasable and electrically programmable non-volatile memory system that includes a memory array of cells that are organized along horizontal rows and vertical rows, whereby a selected row is controllable by control inputs of said memory system and said selected row stores at least one page of data bytes that were supplied from one or more data inputs that is separate from said control inputs of said memory system, said method comprising: applying to said control inputs a first combination of voltage levels that are within a range of voltage levels applied to said control inputs during the read operation and representing a first combination of logical levels to cause erasure of only one page of data from said selected row; and applying to said control inputs a second combination of voltage levels that are within said range of voltage levels applied to said control inputs during the read operation and representing a second combination of logical levels to cause the simultaneous erasure of at least two pages of data from said memory array.
Claim 14
Independent Claim
181 words
A method of operating an electrically readable, electrically erasable and electrically programmable non-volatile memory system that includes a memory array of cells that are organized along horizontal rows and vertical rows, whereby a selected row is controllable by control inputs of said memory system and said selected row stores at least one page of data bytes that were supplied from one or more data inputs that is separate from said control inputs of said memory system, said method comprising: applying to said control inputs a first combination of voltage levels that are within a range of voltage levels applied to said control inputs during the read operation and representing a first combination of logical levels to cause erasure of only one page of data from said selected row; and applying to said control inputs a second combination of voltage levels that are within said range of voltage levels applied to said control inputs during the read operation and representing a second combination of logical levels to cause the simultaneous erasure of at least two pages of data from said memory array.
Claim 15
Dependent Claim
44 words
The method of claim 11 wherein applying to said control inputs said second combination of voltage levels within said range of voltage levels applied to said control inputs during the read operation causes flash simultaneous erasure of all the pages of said memory array.
Claim 16
Dependent Claim
47 words
The method of claim 11 wherein applying to said control inputs said second combination of voltage levels within said range of voltage levels applied to said control inputs during the read operation causes erasure of all the data from only one selected row of said memory array.