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US5438550A Expired / Lapsed US ⏱️ 0.0 years remaining

Address transition detecting circuit of a semiconductor memory device

Assignee: SK Hynix Inc
•
Filing: 1993-10-29
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Granted: 1995-08-01
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Expires: 2013-10-29
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Abstract

Abstract An ATD circuit of a semiconductor memory device includes a variable delay line for delaying an address signal, a logic comparator for comparing the logic of the address signal with that of the address signal delayed by the variable delay line to generate an ATD pulse signal having a constant width at the rising and falling edges of the address signal, and a power supply voltage detector for detecting a voltage level of the power supply voltage to adjust the length of the variable delay line according to the voltage level, so that the pulse width of the ATD pulse signal for controlling precharge and voltage equalization of a bit line and operation of a sense amplifier is constantly maintained independently of the variation of a power supply voltage to thus improve access speed of the semiconductor memory device.

Inventors

  • 👤 Gyu S. Kim

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 18:14
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/34; G11C11/40; G11C11/401; G11C11/4063; G11C11/407; G11C8/00; G11C8/18

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 150 words
An address transition detecting circuit of a semiconductor memory device comprising: first input means for receiving an address signal; second input means for receiving a power supply voltage; a variable delay line for delaying said address signal from said first input means by a variable delay length that depends upon a delay control signal received by the variable delay line; logical comparative means for comparing the logic of said address signal from said first input means with that of the delayed address signal from said variable delay line to generate an address transition detecting pulse signal having a predetermined width at the rising and falling edges of said address signal; and power supply voltage detecting means for detecting the voltage level of said power supply voltage input to said second input means and generating said delay control signal according to the detected voltage level of the power supply voltage input.
Claim 2
Dependent Claim 150 words
An address transition detecting circuit of a semiconductor memory device comprising: first input means for receiving an address signal; second input means for receiving a power supply voltage; a variable delay line for delaying said address signal from said first input means by a variable delay length that depends upon a delay control signal received by the variable delay line; logical comparative means for comparing the logic of said address signal from said first input means with that of the delayed address signal from said variable delay line to generate an address transition detecting pulse signal having a predetermined width at the rising and falling edges of said address signal; and power supply voltage detecting means for detecting the voltage level of said power supply voltage input to said second input means and generating said delay control signal according to the detected voltage level of the power supply voltage input.
Claim 3
Dependent Claim 95 words
An address transition detecting circuit of a semiconductor memory device as claimed in claim 1, wherein said variable delay line comprises: at least two delay means, each delay means having an output which provides the address signal delayed by a distinct delay time with respect to the address signal received at the first input means; and first switching means for selectively switching, according to said delay control signal, one of at least two delayed address signals from the output of one of one of said at least two delay means toward said logical comparative means.
Claim 4
Dependent Claim 92 words
An address transition detecting circuit of a semiconductor memory device as claimed in claim 2, wherein said power supply voltage detecting means comprises: voltage dividing means connected to said second input means for dividing said power supply voltage by a constant dividing ratio; and comparing means for comparing the divided voltage from said voltage dividing means with a reference voltage to generate a switching control signal having different logic values in accordance with the voltage level of said power supply voltage, and supply said switching control signal to said first switching means.
Claim 5
Dependent Claim 44 words
An address transition detecting circuit of a semiconductor memory device as claimed in claim 3, wherein said comparing means comprises at least one logic gate having different logic threshold values for performing a logical operation of said divided voltage from said voltage dividing means.
Claim 6
Dependent Claim 31 words
An address transition detecting circuit of a semiconductor memory device as claimed in claim 3, wherein said voltage dividing means comprises a level shifter formed of at least two MOS transistors.
Claim 7
Dependent Claim 60 words
An address transition detecting circuit of a semiconductor memory device as claimed in claim 1, wherein said power supply voltage detecting means includes: third input means for receiving a chip selection signal; and switching means being connected to said second input means for switching said power supply voltage by means of said chip selection signal from said third input means.
Claim 8
Dependent Claim 59 words
An address transition detecting circuit of a semiconductor memory device as claimed in claim 1, wherein said logical comparative means comprises an exclusive logic gate for generating a pulse of a predetermined logic when the logic of said address signal from said first input means is different from that of said delayed address signal from said variable delay line.

References Cited (Backward Citations)

US5025422A Cited
US5124584A Cited
US5159574A Cited
US5264737A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-07-31 1999-01-30 1999-08-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-07-31 2003-01-30 2003-08-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-07-31 2007-01-30 2007-08-01 $7700.00 Window Closed / Lapsed

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