US5434513A
Expired / Lapsed
US
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Semiconductor wafer testing apparatus using intermediate semiconductor wafer
Assignee: Rohm Co Ltd
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Filing: 1994-10-14
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Granted: 1995-07-18
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Expires: 2014-10-14
Abstract
Abstract Bump electrodes are formed on the bottom surface of an intermediate semiconductor wafer at locations corresponding to electrode pads of circuit elements formed on a subject semiconductor wafer. Pickup electrodes and control electrodes are formed on the top surface of the intermediate semiconductor wafer. A switching circuit is formed in the intermediate semiconductor wafer, and serves to connect selected ones of the bump electrodes to the pickup electrodes in accordance with switching control signals provided from a tester via the control electrodes. The pickup electrodes and the control electrodes are connected to the tester via pogo pins.
Inventors
- 👤 Toshifumi Fujii
- 👤 Masayoshi Koine
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 18:08
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07364; G01R1/07378
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
144 words
An apparatus for testing electrical characteristics of a plurality of separate, individual circuit elements formed on a subject semiconductor wafer, comprising: an intermediate member; a plurality of sets of bump electrodes formed on a first surface of the intermediate member to be faced with the subject semiconductor wafer at locations corresponding to respective sets of electrode pads of each of the plurality of the separate, individual circuit elements formed on the subject semiconductor wafer; a plurality of pickup electrodes formed on a second surface of the intermediate member and electrically connected to the bump electrodes; switching means in the intermediate member for selectively switching at least one of the plurality of pickup electrodes to selected bump electrodes corresponding to different ones of the plurality of separate, individual circuit elements; and a connection mechanism for connecting the pickup electrodes to an electrical characteristics measuring device.
Claim 2
Independent Claim
144 words
An apparatus for testing electrical characteristics of a plurality of separate, individual circuit elements formed on a subject semiconductor wafer, comprising: an intermediate member; a plurality of sets of bump electrodes formed on a first surface of the intermediate member to be faced with the subject semiconductor wafer at locations corresponding to respective sets of electrode pads of each of the plurality of the separate, individual circuit elements formed on the subject semiconductor wafer; a plurality of pickup electrodes formed on a second surface of the intermediate member and electrically connected to the bump electrodes; switching means in the intermediate member for selectively switching at least one of the plurality of pickup electrodes to selected bump electrodes corresponding to different ones of the plurality of separate, individual circuit elements; and a connection mechanism for connecting the pickup electrodes to an electrical characteristics measuring device.
Claim 3
Dependent Claim
45 words
The apparatus of claim 1, wherein the intermediate member is an intermediate semiconductor wafer different from the subject semiconductor wafer, said switching means comprising a switching circuit formed in the intermediate semiconductor wafer, for connecting selected ones of the bump electrodes to the pickup electrodes.
Claim 4
Dependent Claim
64 words
The apparatus of claim 2, further comprising a plurality of control electrodes formed on the second surface of the intermediate semiconductor wafer, for providing switching control signals to the switching circuit, wherein the connection mechanism further connects the control electrodes to the electrical characteristics measuring device to allow the control signals to be provided from the electrical characteristics measuring device to the control electrodes.
Claim 5
Dependent Claim
27 words
The apparatus of claim 2, further comprising an amplification circuit formed on or in the intermediate semiconductor wafer, for amplifying response signals output from the circuit elements.
Claim 6
Dependent Claim
21 words
The apparatus of claim 1, further comprising means for moving the intermediate member toward and away from the subject semiconductor wafer.
Claim 7
Independent Claim
137 words
An apparatus for testing electrical characteristics of a plurality of individual circuit elements formed on a subject semiconductor wafer, comprising: an intermediate member; a plurality of sets of bump electrodes formed on a first surface of the intermediate member to be faced with the subject semiconductor wafer at locations corresponding to respective sets of electrode pads of plurality of the individual circuit elements formed on the subject semiconductor wafer; a plurality of pickup electrodes formed on a second surface of the intermediate member and electrically connected to the bump electrodes; and a connection mechanism for connecting the pickup electrodes to an electrical characteristics measuring device, and further comprising means for maintaining electrical connections between the pickup electrodes and the electrical characteristics measuring device while the intermediate member is moved toward or away from the subject semiconductor device.
Claim 8
Independent Claim
137 words
An apparatus for testing electrical characteristics of a plurality of individual circuit elements formed on a subject semiconductor wafer, comprising: an intermediate member; a plurality of sets of bump electrodes formed on a first surface of the intermediate member to be faced with the subject semiconductor wafer at locations corresponding to respective sets of electrode pads of plurality of the individual circuit elements formed on the subject semiconductor wafer; a plurality of pickup electrodes formed on a second surface of the intermediate member and electrically connected to the bump electrodes; and a connection mechanism for connecting the pickup electrodes to an electrical characteristics measuring device, and further comprising means for maintaining electrical connections between the pickup electrodes and the electrical characteristics measuring device while the intermediate member is moved toward or away from the subject semiconductor device.
Claim 9
Dependent Claim
25 words
The apparatus of claim 6, wherein the maintaining means comprises a plurality of pogo pins and connection pins movably fitted in the respective pogo pins.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-07-17 | 1999-01-16 | 1999-07-18 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-07-17 | 2003-01-16 | 2003-07-18 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-07-17 | 2007-01-16 | 2007-07-18 | $7700.00 | Window Closed / Lapsed |