US5429960A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of making flash EEPROM memory
Assignee: United Microelectronics Corp
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Filing: 1994-11-28
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Granted: 1995-07-04
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Expires: 2014-11-28
Abstract
Abstract This invention provides a flash EEPROM, or electrically programmable and erasable read only memory, structure and a method for forming the flash EEPROM structure. The invention uses a large angle ion implant beam without wafer rotation to form the source and drain regions of the memory cell. A low doped region is formed at the edge of the drain region. The tunnel dielectric is formed directly above the low doped region. The width of the low doped region is controlled by the angle of the large angle ion implant beam and can be very accurately controlled. The tunnel dielectric is formed independently of the gate dielectric and the thickness of each can be optimized. The tunnel dielectric area can be made very small which improves reliability and reduces the voltage necessary to program and erase the memory cell. A temporary nitride floating gate electrode, which is later replaced by a polysilicon floating gate electrode, provides flexibility in the location of the floating gate electrode.
Inventors
- 👤 Gary Hong
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 03:35
CPC Classifications
H; H10; H10B; H10B41/00
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
221 words
A method of forming a flash EEPROM device, comprising the steps of: providing a semiconductor substrate; forming a gate dielectric layer on said semiconductor substrate; forming a patterned nitride layer on said gate dielectric layer; forming a lightly doped region in said semiconductor substrate using a normally directed ion implant beam; forming a source region having an inner edge and a drain region having an inner edge in said semiconductor substrate using a large angle ion implant beam thereby forming a lightly doped area adjacent to said inner edge of said drain region; removing, by means of etching, that part of said gate dielectric layer not covered by said patterned nitride layer; forming a tunnel dielectric area directly over said lightly doped area; forming self-aligned dielectric areas directly over said source region and said drain region; removing, by means of etching, said patterned nitride layer; forming a floating gate electrode on said semiconductor substrate; forming a interlevel dielectric layer on said floating gate electrode and on that part of said self-aligned dielectric area not covered by said floating gate electrode; forming a control gate electrode on said interlevel dielectric layer; forming an insulating dielectric layer over said control gate electrode; forming contact openings in said insulating dielectric layer; and forming metal contacts in said contact openings in said insulating dielectric layer.
Claim 2
Independent Claim
221 words
A method of forming a flash EEPROM device, comprising the steps of: providing a semiconductor substrate; forming a gate dielectric layer on said semiconductor substrate; forming a patterned nitride layer on said gate dielectric layer; forming a lightly doped region in said semiconductor substrate using a normally directed ion implant beam; forming a source region having an inner edge and a drain region having an inner edge in said semiconductor substrate using a large angle ion implant beam thereby forming a lightly doped area adjacent to said inner edge of said drain region; removing, by means of etching, that part of said gate dielectric layer not covered by said patterned nitride layer; forming a tunnel dielectric area directly over said lightly doped area; forming self-aligned dielectric areas directly over said source region and said drain region; removing, by means of etching, said patterned nitride layer; forming a floating gate electrode on said semiconductor substrate; forming a interlevel dielectric layer on said floating gate electrode and on that part of said self-aligned dielectric area not covered by said floating gate electrode; forming a control gate electrode on said interlevel dielectric layer; forming an insulating dielectric layer over said control gate electrode; forming contact openings in said insulating dielectric layer; and forming metal contacts in said contact openings in said insulating dielectric layer.
Claim 3
Dependent Claim
31 words
The method of claim 1 wherein said floating gate electrode extends over said inner edge of said source region, said lightly doped area, and said inner edge of said drain region.
Claim 4
Dependent Claim
24 words
The method of claim 1 wherein said floating gate electrode extends over said inner edge of said drain region and said lightly doped area.
Claim 5
Dependent Claim
14 words
The method of claim 1 wherein said semiconductor substrate is P conductivity type silicon.
Claim 6
Dependent Claim
36 words
The method of claim 1 wherein said normally directed ion implant beam is arsenic or phosphorus with between about 1×10 13 and 1×10 14 ions/cm 2 at an energy of between about 30 and 100 keV.
Claim 7
Dependent Claim
31 words
The method of claim 1 wherein said large angle ion implant beam is arsenic with between about 1×10 15 and 5×10 15 ions/cm 2 at between about 30 and 100 keV.
Claim 8
Dependent Claim
31 words
The method of claim 1 wherein the angle between said large angle implant beam and a line normal to the surface of said semiconductor substrate is between about 10° and 60°.
Claim 9
Dependent Claim
25 words
The method of claim 1 wherein said tunnel dielectric area is formed of SiO 2 with a thickness of between about 60 and 100 Angstroms.
Claim 10
Dependent Claim
28 words
The method of claim 1 wherein said tunnel dielectric area is formed of SiO 2 with a width across the substrate of between about 500 and 5000 Angstroms.
Claim 11
Dependent Claim
24 words
The method of claim 1 wherein said gate dielectric is formed of SiO 2 with a thickness of between about 150 and 500 Angstroms.
Claim 12
Dependent Claim
24 words
The method of claim 1 wherein said self-aligned dielectric is formed of SiO 2 with a thickness of between about 150 and 500 Angstroms.
Claim 13
Dependent Claim
19 words
The method of claim 1 wherein said floating gate electrode and said control gate electrode are formed of polysilicon.
Claim 14
Dependent Claim
22 words
The method of claim 1 wherein said interlevel dielectric layer is oxide/nitride/oxide with a thickness of between about 100 and 300 Angstroms.
References Cited (Backward Citations)
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| 3.5 Years (Year 4) | 1998-07-03 | 1999-01-02 | 1999-07-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-07-03 | 2003-01-02 | 2003-07-04 | $3760.00 | Window Closed / Lapsed |
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