Method of controlling a self-test in a data processing system and data processing system suitable for this method

Claim 3

The method of claim 1 wherein the data processing system includes a second subsystem coupled between the parallel outputs of the serial shift register means and the input connections and wherein the supplying step occurs via the second subsystem, whereby the first subsystem does not have to be directly connected to the serial shift register means.

Claim 4

The method of claim 1, wherein the control pattern is a pair of successive standard patterns which standard patterns appear in the normal, non-test operating conditions of the first subsystem, but which pair does not appear in the normal, non-test operating conditions of the first subsystem.

Claim 5

The method of claim 1, further comprising the steps of providing a characterization of results of the self-test at output connections of the first subsystem; providing a predetermined set of input synchronization patterns from the parallel outputs of the serial shift register to the input connections from the second subsystem; and synchronizing the providing of the characterizations using the predetermined set of input synchronization patterns.

Claim 6

A method as claimed in claim 1 or 4, in which the first subsystem is a memory system having a write enable connection and an address input connection, the control pattern is effected by causing the drive of the address input connection to vary, while at the same time the write enable input is continuously activated.

Claim 7

A data processing system comprising: a subsystem having input connections and at least one output connection, which subsystem, under normal, non-test operating conditions, responds to elements from a collection of input patterns at the input connections, serial shift register means provided with parallel output means for supplying said input patterns to the input connections, and a detector, included in the subsystem, connected to the input connections, for causing the subsystem to initiate a self-test of the subsystem, in response to a control pattern in which self-test the subsystem supplies a test characterization at said at least one output connection for further evaluation, the control pattern being one which does not appear under the normal, non-test operating conditions of the subsystem, wherein the subsystem initiates the self-test without requiring additional inputs dedicated to receive the control pattern, and wherein the control pattern is (i) dedicated to initiate the self-test and (ii) not for the purpose of representing a fault in the data processing system.

Claim 8

A data processing system comprising: a subsystem having input connections and at least one output connection, which subsystem, under normal, non-test operating conditions, responds to elements from a collection of input patterns at the input connections, serial shift register means provided with parallel output means for supplying said input patterns to the input connections, and a detector, included in the subsystem, connected to the input connections, for causing the subsystem to initiate a self-test of the subsystem, in response to a control pattern in which self-test the subsystem supplies a test characterization at said at least one output connection for further evaluation, the control pattern being one which does not appear under the normal, non-test operating conditions of the subsystem, wherein the subsystem initiates the self-test without requiring additional inputs dedicated to receive the control pattern, and wherein the control pattern is (i) dedicated to initiate the self-test and (ii) not for the purpose of representing a fault in the data processing system.

Claim 9

A data processing system as claimed in claim 6, characterized in that the first subsystem comprises a clock, and upon the first subsystem initiating a self-test, the clock is started to synchronize execution of a test program.

Claim 10

A data processing system as claimed in claim 6, characterized in that the subsystem, in the self-test, supplies the characterization in a sequence of parts synchronized by pairs of input patterns received from the input connections.

Claim 11

A data processing system as claimed in claim 6, characterized in that the serial shift register means comprise input means for receiving the test characterization.

Claim 12

A subsystem as claimed in claim 6, characterized in that the subsystem is contained in a housing not comprising a connection exclusively intended for test purposes.

Claim 13

The system of claim 6, wherein the control pattern is a pair of successive input patterns from the collection, which pair does not occur in succession under the normal, non-test operating conditions.

Claim 14

A data processing system as claimed in claim 6, wherein the subsystem is a memory system having a write enable input connection and an address input connection and the control pattern to which the detector responds is a continuous activation of the write enable input connection during a variation of a signal present on the address input connection.

Claim 15

A data processing system as claimed in claim 12, characterized in that the subsystem is a support with memory IC's disposed thereon, the shift register means being arranged externally of the support.