Fixture for burn-in testing of semiconductor wafers, and a semiconductor wafer

Claim 2

A semiconductor wafer testing fixture for conducting burn-in test cycling of a semiconductor wafer, the semiconductor wafer comprising a plurality of arrayed integrated circuits, test cycling circuitry for test cycling the integrated circuits, Vcc and Vss pads associated with the integrated circuits, a Vcc bus which electrically connects with the Vcc pads and test circuitry, and a Vss bus which electrically connects with the Vss pads, the fixture comprising: a housing sized to receive and register a semiconductor wafer in a selected orientation; a shelf provided in the housing for supporting the wafer within the housing, the shelf comprising back biasing means for supplying a back bias voltage to the wafer; and first and second conductive arms for supplying selected voltages to corresponding ones of the Vcc and Vss buses for imparting test cycling of the integrated circuits, the first arm having a first hand extending angularly therefrom above the shelf in the housing for engaging the Vcc bus on the wafer, the second arm having a second hand extending angularly therefrom above the shelf in the housing for engaging the Vss bus on the wafer.

Claim 3

A semiconductor wafer testing fixture according to claim 1 wherein: the housing has openings formed therein above the shelf; and the first and second arms are located outside of the housing with the first and second hands extending through the openings into the housing.

Claim 4

A semiconductor wafer testing fixture according to claim 2 wherein the first and second hands are mechanically biased downward from the openings toward the wafer supported on the shelf.

Claim 5

A semiconductor wafer testing fixture according to claim 1 wherein the first and second hands are mechanically biased to engage and hold the wafer on the shelf.

Claim 6

A semiconductor wafer testing fixture according to claim 1 wherein the first and second hands are crescent shaped and engage peripheral edges of the semiconductor wafer.

Claim 7

A semiconductor wafer testing fixture according to claim 1 wherein: the first hand comprises a plurality of fingers projecting at angles therefrom for contacting the wafer supported on the shelf; and the second hand comprises a plurality of fingers projecting at angles therefrom for contacting the wafer supported on the shelf.

Claim 8

A semiconductor wafer testing fixture for conducting burn-in test cycling of multiple semiconductor wafers; each semiconductor wafer comprising a plurality of arrayed integrated circuits, test cycling circuitry for test cycling the integrated circuits, Vcc and Vss pads associated with the integrated circuits, a Vcc bus which electrically connects with the Vcc pads and test circuitry, and a Vss bus which electrically connects with the Vss pads; the fixture comprising: a housing sized to receive and register a plurality of semiconductor wafers in selected orientations along an axis; a plurality of shelves provided at spaced distances in the housing for supporting individual semiconductor wafers within the housing, the shelves comprising back biasing means for supplying a back bias voltage to the wafers supported on the shelves; first and second conductive arms positioned on opposing sides of the housing for supplying selected voltages to corresponding ones of the Vcc and Vss buses for imparting test cycling of the integrated circuits upon application of the selected voltages; the first arm comprising: multiple first hands aligned at selected distances along the first arm corresponding to the spaced distances of the shelves in the housing and projecting radially inward from the first arm toward the axis so that individual first hands are provided for corresponding individual shelves, the first hands engaging the Vcc buses on the wafers supported on the corresponding shelves; and the second arm comprising: multiple second hands aligned at selected distances along the second arm corresponding to the spaced distances of the shelves in the housing and projecting radially inward from the second arm toward the axis so that individual second hands are provided for corresponding individual shelves, the second hands engaging the Vss buses on the wafers supported on the corresponding shelves.

Claim 9

A semiconductor wafer testing fixture for conducting burn-in test cycling of multiple semiconductor wafers; each semiconductor wafer comprising a plurality of arrayed integrated circuits, test cycling circuitry for test cycling the integrated circuits, Vcc and Vss pads associated with the integrated circuits, a Vcc bus which electrically connects with the Vcc pads and test circuitry, and a Vss bus which electrically connects with the Vss pads; the fixture comprising: a housing sized to receive and register a plurality of semiconductor wafers in selected orientations along an axis; a plurality of shelves provided at spaced distances in the housing for supporting individual semiconductor wafers within the housing, the shelves comprising back biasing means for supplying a back bias voltage to the wafers supported on the shelves; first and second conductive arms positioned on opposing sides of the housing for supplying selected voltages to corresponding ones of the Vcc and Vss buses for imparting test cycling of the integrated circuits upon application of the selected voltages; the first arm comprising: multiple first hands aligned at selected distances along the first arm corresponding to the spaced distances of the shelves in the housing and projecting radially inward from the first arm toward the axis so that individual first hands are provided for corresponding individual shelves, the first hands engaging the Vcc buses on the wafers supported on the corresponding shelves; and the second arm comprising: multiple second hands aligned at selected distances along the second arm corresponding to the spaced distances of the shelves in the housing and projecting radially inward from the second arm toward the axis so that individual second hands are provided for corresponding individual shelves, the second hands engaging the Vss buses on the wafers supported on the corresponding shelves.

Claim 10

A semiconductor wafer testing fixture according to claim 7 wherein: the housing has opposing side walls with vertical arrays of openings formed therein, the openings being located above individual shelves; and the first and second arms are located outside of the housing and the first and second hands extend from respective first and second arms through the openings into the housing.

Claim 11

A semiconductor wafer testing fixture according to claim 8 wherein the first and second hands are mechanically biased downward from the openings toward corresponding wafers supported on the shelves.

Claim 12

A semiconductor wafer testing fixture according to claim 7 wherein: the housing has opposing side walls with vertical arrays of openings formed therein, the openings being located above individual shelves; the first and second arms are located outside of the housing and aligned substantially parallel to the axis; the first hands extend through the openings in one side wall into the housing; and the second hands extend through the openings in the opposing side wall into the housing.

Claim 13

A semiconductor wafer testing fixture according to claim 7 wherein the first and second hands are mechanically biased to engage and hold the wafer on the shelf.

Claim 14

A semiconductor wafer testing fixture according to claim 7 wherein the first and second hands are crescent shaped and engage peripheral edges of the semiconductor wafer.

Claim 15

A semiconductor wafer testing fixture according to claim 7 wherein: individual first hands comprise a plurality of fingers projecting at angles therefrom for contacting the corresponding wafers supported on the shelves; and individual second hands comprise a plurality of fingers projecting at angles therefrom for contacting the corresponding wafers supported on the shelves.

Claim 16

A semiconductor wafer testing fixture for conducting burn-in test cycling of a semiconductor wafer, the semiconductor wafer comprising a plurality of arrayed integrated circuits, test cycling circuitry for test cycling the integrated circuits, Vcc and Vss pads associated with the integrated circuits, a Vcc bus which electrically connects with the Vcc pads and test circuitry, and a Vss bus which electrically connects with the Vss pads, the fixture comprising: a housing sized to receive and register a semiconductor wafer in a selected orientation along an axis; a shelf provided in the housing for supporting a wafer within the housing, the shelf comprising back biasing means for supplying a back bias voltage to the wafer supported on the shelf; first and second conductive arms positioned outside of opposing sides of the housing for supplying selected voltages to corresponding ones of the Vcc and Vss buses for imparting test cycling of the integrated circuits upon application of the selected voltages, the first and second arms being aligned substantially parallel to the axis; a first hand projecting radially inward from the first arm through the housing toward the axis, the first hand being biased toward the semiconductor wafer supported on the shelf; a second hand projecting radially inward from the second arm through the housing toward the axis, the second hand being biased toward the semiconductor wafer supported on the shelf; at least one first finger projecting at an angle from the first hand for engaging the Vcc bus on-the wafer supported on the shelf; and at least one second finger projecting at an angle from the second hand for engaging the Vss bus on the wafer supported on the shelf.

Claim 17

A semiconductor wafer testing fixture for conducting burn-in test cycling of a semiconductor wafer, the semiconductor wafer comprising a plurality of arrayed integrated circuits, test cycling circuitry for test cycling the integrated circuits, Vcc and Vss pads associated with the integrated circuits, a Vcc bus which electrically connects with the Vcc pads and test circuitry, and a Vss bus which electrically connects with the Vss pads, the fixture comprising: a housing sized to receive and register a semiconductor wafer in a selected orientation along an axis; a shelf provided in the housing for supporting a wafer within the housing, the shelf comprising back biasing means for supplying a back bias voltage to the wafer supported on the shelf; first and second conductive arms positioned outside of opposing sides of the housing for supplying selected voltages to corresponding ones of the Vcc and Vss buses for imparting test cycling of the integrated circuits upon application of the selected voltages, the first and second arms being aligned substantially parallel to the axis; a first hand projecting radially inward from the first arm through the housing toward the axis, the first hand being biased toward the semiconductor wafer supported on the shelf; a second hand projecting radially inward from the second arm through the housing toward the axis, the second hand being biased toward the semiconductor wafer supported on the shelf; at least one first finger projecting at an angle from the first hand for engaging the Vcc bus on-the wafer supported on the shelf; and at least one second finger projecting at an angle from the second hand for engaging the Vss bus on the wafer supported on the shelf.

Claim 18

A semiconductor wafer testing fixture according to claim 14 wherein: the first and second hands are crescent shaped; and the first and second fingers engage peripheral edges of the semiconductor wafer supported on the shelf.

Claim 19

A semiconductor wafer testing fixture for conducting burn-in test cycling of a semiconductor wafer, the semiconductor wafer comprising a plurality of arrayed integrated circuits between opposing first and second peripheral edges of the wafer, test cycling circuitry for test cycling the integrated circuits, Vcc and Vss pads associated with the integrated circuits, Vcc buses which electrically connect with the Vcc pads and test circuitry, the Vcc buses being connected to a common Vcc region at the first peripheral edge of the wafer, and Vss buses which electrically connect with the Vss pads, the Vss buses being connected to a common Vss region at the second peripheral edge of the wafer; the fixture comprising: a housing sized to receive and register a semiconductor wafer in a selected orientation along an axis; a shelf provided in the housing for supporting a wafer within the housing, the shelf comprising back biasing means for supplying a back bias voltage to the wafer supported on the shelf; first and second conductive arms positioned on opposing sides of the housing for supplying selected voltages to corresponding ones of the Vcc and Vss buses for imparting test cycling of the integrated circuits upon application of the selected voltages; the first arm comprising: a first hand projecting radially inward from the first arm toward the axis for engaging the Vcc region at the first peripheral edge of the wafer supported on the shelf; and the second arm comprising: a second hand projecting radially inward from the second arm toward the axis for engaging the Vss region at the second peripheral edge of the wafer supported on the shelf.

Claim 20

A semiconductor wafer testing fixture for conducting burn-in test cycling of a semiconductor wafer, the semiconductor wafer comprising a plurality of arrayed integrated circuits between opposing first and second peripheral edges of the wafer, test cycling circuitry for test cycling the integrated circuits, Vcc and Vss pads associated with the integrated circuits, Vcc buses which electrically connect with the Vcc pads and test circuitry, the Vcc buses being connected to a common Vcc region at the first peripheral edge of the wafer, and Vss buses which electrically connect with the Vss pads, the Vss buses being connected to a common Vss region at the second peripheral edge of the wafer; the fixture comprising: a housing sized to receive and register a semiconductor wafer in a selected orientation along an axis; a shelf provided in the housing for supporting a wafer within the housing, the shelf comprising back biasing means for supplying a back bias voltage to the wafer supported on the shelf; first and second conductive arms positioned on opposing sides of the housing for supplying selected voltages to corresponding ones of the Vcc and Vss buses for imparting test cycling of the integrated circuits upon application of the selected voltages; the first arm comprising: a first hand projecting radially inward from the first arm toward the axis for engaging the Vcc region at the first peripheral edge of the wafer supported on the shelf; and the second arm comprising: a second hand projecting radially inward from the second arm toward the axis for engaging the Vss region at the second peripheral edge of the wafer supported on the shelf.

Claim 21

A semiconductor wafer testing fixture according to claim 16 wherein: the housing has openings formed therein above the shelf; the first and second arms are located outside of the housing; and the first and second hands extend from the respective first and second arms through the openings into the housing.

Claim 22

A semiconductor wafer testing fixture according to claim 16 wherein the first and second hands are crescent shaped for engaging the peripheral edges of the semiconductor wafer.

Claim 23

A semiconductor wafer testing fixture according to claim 16 wherein: the first hand comprises at least one finger projecting at an angle therefrom for contacting the first peripheral edge of the wafer supported on the shelf; and the second hand comprises at least one finger projecting at an angle therefrom for contacting the second peripheral edge of the wafer supported on the shelf.