Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
170 words
A system for reducing testing time of digital integrated circuits by decreasing the number of test vectors utilized while maintaining high fault coverage without deterministic testing, comprising: means for first determining all faults for a predetermined integrated circuit and for generating a set of calculated weights; means for testing said integrated circuit with said set of calculated weights for generating a reduced list of undetected faults; means for iteratively testing said integrated circuit with calculated weights from successively reduced lists of undetected faults by calculating additional weights directly from the reduced list of undetected faults from the previous iteration, said iteration to continue until a predetermined low number of undetected faults exists; a weighted pattern generator for producing test vectors coupled to inputs to said integrated circuit; and, means for applying said calculated sets of weights to said weighted pattern generator, thereby to provide said generator with an optimal set of weights that decrease the number of test vectors provided by said weighted pattern generator to reduce said testing time.
Claim 2
Independent Claim
170 words
A system for reducing testing time of digital integrated circuits by decreasing the number of test vectors utilized while maintaining high fault coverage without deterministic testing, comprising: means for first determining all faults for a predetermined integrated circuit and for generating a set of calculated weights; means for testing said integrated circuit with said set of calculated weights for generating a reduced list of undetected faults; means for iteratively testing said integrated circuit with calculated weights from successively reduced lists of undetected faults by calculating additional weights directly from the reduced list of undetected faults from the previous iteration, said iteration to continue until a predetermined low number of undetected faults exists; a weighted pattern generator for producing test vectors coupled to inputs to said integrated circuit; and, means for applying said calculated sets of weights to said weighted pattern generator, thereby to provide said generator with an optimal set of weights that decrease the number of test vectors provided by said weighted pattern generator to reduce said testing time.
Claim 3
Dependent Claim
57 words
The system of claim 1, wherein said integrated circuit includes two sets of circuits having opposite responses to the same set of input signals and further including means for determining optimal weighting test vectors for each of said two sets of circuits, and means for isolating said two sets of circuits during testing based on said determination.
Claim 4
Dependent Claim
122 words
The system of claim 2, wherein said integrated circuit has an input block having a fanout stem, a series of branches associated therewith, and a series of blocks, each associated with a different branch and each including different subcircuits, said system further including: means for separately examining weights calculated for each of said branches of said integrated circuit to ascertain and indicate if a set of weights for any branch indicates a weight bias towards more frequent generation of logic level "1" signals, while weights for other branches indicate more frequent generation of logic level "0" signals; and means for dropping from testing all branches having sets of weights with a weight bias toward more frequent generation of a "1" or "0".
Claim 5
Dependent Claim
28 words
The system of claim 3, wherein said dropping means operates on the basis of selecting for testing those branches having circuits with a larger number of detectable faults.
Claim 6
Dependent Claim
78 words
The system of claim 4, wherein the branches having the larger number of detectable faults are associated with an identifiable fanout stem, wherein said identifiable fanout stem is provided with a selected set of weights and further including means after having a selected set of weights for said identifiable fanout stem for adjusting the weights for associated branches such that the sets of weights for associated branches are consistent with the set of weights for said fanout stem.