Self-guiding receptacle for a semiconductor test socket

Claim 2

An intermediate receptacle for mounting between a semiconductor test socket and a test apparatus, the test socket having a plurality of male contact pins extending from one side, the receptacle comprising: a receptacle body including a plurality of male contact pins extending from one side and in electrical communication with a plurality of corresponding female contact pins for receiving at least some of the male contact pins of the semiconductor test socket; and protuberance means arranged on the receptacle body between the plurality of female contact pins for aligning the male contact pins of the semiconductor test socket with the female contact pins of the receptacle as the test socket is brought into engagement with the receptacle.

Claim 3

The receptacle of claim 1 wherein the protuberance means protrudes from the body for mating with a recess in the test socket.

Claim 4

The receptacle of claim 2 wherein the protuberance means is rectangular in cross-section.

Claim 5

The receptacle of claim 2 wherein the protuberance means includes a chamfered leading edge.

Claim 6

The receptacle of claim 2 wherein the protuberance means includes a distal end which is larger in cross-sectional area than an end near the body.

Claim 7

The receptacle of claim 2 wherein the protuberance means has a shoulder for abutting an edge of the recess.

Claim 8

The receptacle of claim 2 wherein the protuberance means is comprises a plurality of protruding members which are located between the plurality of female contact pins.

Claim 9

An intermediate receptacle for mounting between a semiconductor test socket and a testing apparatus, the test socket having a plurality of male contact pins extending from one side, the receptacle comprising: a body having a substantially planar surface; a plurality of female contact pins extending perpendicularly through the body, each of the female contact pins having an opening at one end through the planar surface; a plurality of male contact pins extending from the side opposite of the planar surface, said plurality of male contact pins being in electrical communication with said plurality of female contact pins; and a protuberance centrally located between the female contact pins of the body and extending from the substantially planar surface for mating with a recess in the one side of the test socket and for aligning the male contact pins of the test socket with at least some of the respective female contact pins of the receptacle.

Claim 10

An intermediate receptacle for mounting between a semiconductor test socket and a testing apparatus, the test socket having a plurality of male contact pins extending from one side, the receptacle comprising: a body having a substantially planar surface; a plurality of female contact pins extending perpendicularly through the body, each of the female contact pins having an opening at one end through the planar surface; a plurality of male contact pins extending from the side opposite of the planar surface, said plurality of male contact pins being in electrical communication with said plurality of female contact pins; and a protuberance centrally located between the female contact pins of the body and extending from the substantially planar surface for mating with a recess in the one side of the test socket and for aligning the male contact pins of the test socket with at least some of the respective female contact pins of the receptacle.

Claim 11

The receptacle of claim 8 wherein the protuberance is rectangular with a chamfered leading edge.

Claim 12

The receptacle of claim 9 wherein the rectangular protuberance includes a distal end which is larger than an end near the substantially planar surface.