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US5408114A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor memory device having cylindrical capacitor and manufacturing method thereof

Assignee: Mitsubishi Electric Corp
•
Filing: 1993-06-03
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Granted: 1995-04-18
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Expires: 2013-06-03
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Abstract

Abstract The semiconductor memory device includes a semiconductor substrate 1 having a conductive layer 6 formed on its main surface. Word lines 4c, 4d and a bit line 11 is formed on the semiconductor substrate. Insulating films 8, 12 are provided to cover the word lines 4c, 4d and the bit line 11. A barrier film 14 is provided on the insulating films 8, 12 for protecting the insulating films 8, 12 from etchant. A cylindrical storage node 170 is electrically connected to the conductive layer 6. The cylindrical storage node 170 includes a bottom conductive portion 17a and a sidewall conductive portion 17b. An outer surface of the storage node 170 is covered with a capacitor insulating film 112. The outer surface of the cylindrical storage node 170 is covered with a cell plate 22, with the capacitor insulating film 112 interposed therebetween.

Inventors

  • 👤 Mitsuya Kinoshita
  • 👤 Tatsuo Okamoto
  • 👤 Hideaki Arima
  • 👤 Atsushi Hachisuka

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-06 16:18
CPC Classifications
H; H10; H10B; H10B12/00; H10B12/01; H10B12/02; H10B12/03; H10B12/033; H10B12/30; H10B12/31; H10B12/318

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 131 words
A semiconductor memory device having a cylindrical capacitor, comprising: a memory cell array including said cylindrical capacitor; said cylindrical capacitor having a storage node including a bottom conductive portion and a sidewall conductive portion provided along a periphery of said bottom conductive portion and extending upwardly, a peripheral circuit; a horizontal member extending horizontally and made of the same material as said bottom conductive portion, provided on a boundary between said memory cell array and said peripheral circuit; a vertical member extending upwardly and made of the same material as said sidewall conductive portion, provided to be connected to said horizontal member; and an oxide film formed on said horizontal member and being adjacent to said vertical member and having a thickness substantially equal to a height of said vertical member.
Claim 2
Dependent Claim 131 words
A semiconductor memory device having a cylindrical capacitor, comprising: a memory cell array including said cylindrical capacitor; said cylindrical capacitor having a storage node including a bottom conductive portion and a sidewall conductive portion provided along a periphery of said bottom conductive portion and extending upwardly, a peripheral circuit; a horizontal member extending horizontally and made of the same material as said bottom conductive portion, provided on a boundary between said memory cell array and said peripheral circuit; a vertical member extending upwardly and made of the same material as said sidewall conductive portion, provided to be connected to said horizontal member; and an oxide film formed on said horizontal member and being adjacent to said vertical member and having a thickness substantially equal to a height of said vertical member.

References Cited (Backward Citations)

US5272367A Cited
US5047817A Cited
US5323343A Cited
US5072270A Cited
JPH04755A Cited
US5102820A Cited
US5084405A Cited
US5315140A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-04-17 1998-10-17 1999-04-18 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-04-17 2002-10-17 2003-04-18 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-04-17 2006-10-17 2007-04-18 $7700.00 Window Closed / Lapsed

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