US5406197A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus for controlling test inputs of circuits on an electronic module
Assignee: International Business Machines Corp
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Filing: 1992-07-31
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Granted: 1995-04-11
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Expires: 2012-07-31
Abstract
Abstract A circuit reduces the cost of electronic systems that contain integrated circuit chips with test leads by reducing the number of off-module connections required to drive these test leads in the assembled system. Instead of driving each such test lead through an intermodule interconnector, a single MODULE TEST line coming in through the intermodule interconnector is input to a circuit that then drives all chip test leads to an appropriate state in the assembled system, while leaving those test leads in a high-impedance state during test, allowing a module tester to drive them as required by its test program.
Inventors
- 👤 Stephen J. Mercier
- 👤 Everett G. Vail, III
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 03:23
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3185; G01R31/318505; G01R31/31701
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
286 words
In an electronic module, including: a module support member; a plurality of integrated circuits mounted on the module support member, each integrated circuit including a test inhibit input means for receiving a test inhibit signal; and an intermodule connector mounted on the module support member; a combination on the module support member for controlling testing of the integrated circuits, the combination comprising: a plurality of circuit test signal input lines on the module support member, each circuit test signal input line connected to a respective test inhibit input means, each circuit test signal input line for conducting a test signal to the test inhibit input means to which it is connected; a single module test control input line on the module support member; the module test control input line connected to a single intermodule connection pin in the intermodule connector for receiving a module test control signal; in a single integrated circuit of the plurality of integrated circuits, a plurality of driver circuit means, each driver circuit means having a first input connected to the module test control input line, and an output connected to a respective circuit test input line, each driver circuit means for: placing a predetermined signal on the respective circuit test signal input line to which it is connected in response to a first state of the module test control signal, thereby preventing a test signal from being placed on the respective circuit test signal input line; and presenting a high impedance to the respective circuit test input line to which it is connected in response to a second state of the module test control signal, thereby permitting a test signal to be placed on the respective circuit test signal input line.
Claim 2
Dependent Claim
286 words
In an electronic module, including: a module support member; a plurality of integrated circuits mounted on the module support member, each integrated circuit including a test inhibit input means for receiving a test inhibit signal; and an intermodule connector mounted on the module support member; a combination on the module support member for controlling testing of the integrated circuits, the combination comprising: a plurality of circuit test signal input lines on the module support member, each circuit test signal input line connected to a respective test inhibit input means, each circuit test signal input line for conducting a test signal to the test inhibit input means to which it is connected; a single module test control input line on the module support member; the module test control input line connected to a single intermodule connection pin in the intermodule connector for receiving a module test control signal; in a single integrated circuit of the plurality of integrated circuits, a plurality of driver circuit means, each driver circuit means having a first input connected to the module test control input line, and an output connected to a respective circuit test input line, each driver circuit means for: placing a predetermined signal on the respective circuit test signal input line to which it is connected in response to a first state of the module test control signal, thereby preventing a test signal from being placed on the respective circuit test signal input line; and presenting a high impedance to the respective circuit test input line to which it is connected in response to a second state of the module test control signal, thereby permitting a test signal to be placed on the respective circuit test signal input line.
Claim 3
Dependent Claim
47 words
The combination of claim 1, further including a plurality of module test connection pads not connected to the intermodule connector, each module test connection pad connected to a respective circuit test signal input line for coupling a test signal to the respective circuit test signal input line.
Claim 4
Dependent Claim
46 words
The combination of claim 1, wherein each driver circuit means includes a CMOS driver having a drive input connected to a predetermined logic level, an enable input connected to the module test control input line, and an output connected to a respective circuit test input line.
Claim 5
Independent Claim
276 words
An apparatus for testing an electronic module, comprising: a module support member; a plurality of circuit chips on the module support member, each circuit chip including a test INHIBIT input pin; an intermodule connector mounted on the module member for conducting intermodule signals to and from the electronic module; a plurality of test equipment pads on the module support member for applying test signals to the module support member; a plurality of test configuration signal input lines, each test configuration signal input line connected to a respective test equipment pad and to a respective test INHIBIT input pin, but not connected to the intermodule connector; a single module test control input line connected to the intermodule connector; the module test control input line connected to a single intermodule connection pin in the intermodule connector for receiving a module test control signal through the intermodule connector; a plurality of driver circuit means in the plurality of circuit chips, each driver circuit means having a first circuit input connected to the module test control input line, and a circuit output connected to a respective test configuration signal input line, each driver circuit means for: coupling an INHIBIT signal to the respective test configuration signal input line to which it is connected in response to the module test control signal, thereby inhibiting application of a test configuration signal to the respective test configuration signal input line; and presenting a high impedance to the respective test configuration input line to which it is connected in response to absence of the module test control signal, thereby permitting a test configuration signal to be placed on the respective test configuration input line.
Claim 6
Independent Claim
276 words
An apparatus for testing an electronic module, comprising: a module support member; a plurality of circuit chips on the module support member, each circuit chip including a test INHIBIT input pin; an intermodule connector mounted on the module member for conducting intermodule signals to and from the electronic module; a plurality of test equipment pads on the module support member for applying test signals to the module support member; a plurality of test configuration signal input lines, each test configuration signal input line connected to a respective test equipment pad and to a respective test INHIBIT input pin, but not connected to the intermodule connector; a single module test control input line connected to the intermodule connector; the module test control input line connected to a single intermodule connection pin in the intermodule connector for receiving a module test control signal through the intermodule connector; a plurality of driver circuit means in the plurality of circuit chips, each driver circuit means having a first circuit input connected to the module test control input line, and a circuit output connected to a respective test configuration signal input line, each driver circuit means for: coupling an INHIBIT signal to the respective test configuration signal input line to which it is connected in response to the module test control signal, thereby inhibiting application of a test configuration signal to the respective test configuration signal input line; and presenting a high impedance to the respective test configuration input line to which it is connected in response to absence of the module test control signal, thereby permitting a test configuration signal to be placed on the respective test configuration input line.
Claim 7
Dependent Claim
74 words
The apparatus of claim 4, wherein the plurality of driver circuit means is contained in a single circuit chip of the plurality of circuit chips, the single circuit chip including: a plurality of signal leads; a single input signal lead in the plurality of signal leads being connected to all first inputs of the set of driver circuit means; and the single input signal lead being connected to the module test control input line.
Claim 8
Dependent Claim
50 words
The apparatus of claim 4 or claim 5, wherein each driver circuit means includes CMOS driver having a drive input connected to a predetermined logic INHIBIT level, and enabling an input connected to the module test control input line, and an output connected to a respective test configuration input line.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-04-10 | 1998-10-10 | 1999-04-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-04-10 | 2002-10-10 | 2003-04-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-04-10 | 2006-10-10 | 2007-04-11 | $7700.00 | Window Closed / Lapsed |