Patent US5400950A successfully refreshed from Google Patents.
US5400950A
Expired / Lapsed
US
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Method for controlling solder bump height for flip chip integrated circuit devices
Assignee: Delphi Technologies Inc
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Filing: 1994-02-22
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Granted: 1995-03-28
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Expires: 2014-02-22
Abstract
Abstract A method is provided for flip-chip bonding a flip chip to a substrate, which may be a ceramic substrate, printed wiring board, flexible circuit, or a silicon substrate, in which a number of input/output solder bumps are reflowed to both bond the flip chip to the circuit board as well as provide the necessary electrical connection between the flip chip and the circuit board's circuitry. The method enables the height of the input/output solder bumps to be closely controlled thereby providing sufficient spacing between the chip and its substrate, thus optimizing the cleanability and stress relief of the package. Generally, the preferred method involves the use of non-input/output, or "dummy" solder bumps which are present in sufficient numbers to overcome the tendency for the input/output solder bumps to draw the flip chip excessively close to the circuit board. Because the dummy solder bumps are electrically inactive, their height can be governed by electrically isolated pads on the surface of the circuit board. Consequently, definition of the input/output solder bumps and the dummy solder bumps does not require the use of solder stops or masks during formation or reflow of the solder bumps.
Inventors
- 👤 Bruce A. Myers
- 👤 Petrina L. Schnabel
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 17:28
CPC Classifications
H; H05; H05K; H05K3/00; H05K3/30; H05K3/32; H05K3/34; H05K3/341; H05K3/3431; H05K3/3436; H05K2201/00; H05K2201/09; H05K2201/09209; H05K2201/09654; H05K2201/09781; H10; H10W; H10W72/00; H10W72/071; H10W72/072; H10W72/07221; H10W72/07227; H10W72/07231; H10W72/07236; H10W72/07251; H10W72/07253; H10W72/20; H10W72/231; H10W72/237; H10W72/251; H10W72/252; Y; Y02; Y02P; Y02P70/00; Y02P70/50
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
136 words
A method for controlling the height of input/output solder bumps which electrically interconnect a monolithic semiconductor device to a substrate, the method comprising the steps of: forming non-input/output bumps and said input/output solder bumps on a surface of said monolithic semiconductor device; forming conductors on said substrate; mating said monolithic semiconductor device with said substrate such that said input/output solder bumps register with said conductors; and reflow soldering said monolithic semiconductor device to said substrate such that the height of each of said input/output solder bumps after reflow is dictated by the height of said non-input/output bumps, a sufficient number of said non-input/output bumps being present such that a buoyant force generated by said non-input/output bumps balances an opposing tensional force generated by the surface tension of said input/output solder bumps during said reflow soldering step.
Claim 2
Independent Claim
136 words
A method for controlling the height of input/output solder bumps which electrically interconnect a monolithic semiconductor device to a substrate, the method comprising the steps of: forming non-input/output bumps and said input/output solder bumps on a surface of said monolithic semiconductor device; forming conductors on said substrate; mating said monolithic semiconductor device with said substrate such that said input/output solder bumps register with said conductors; and reflow soldering said monolithic semiconductor device to said substrate such that the height of each of said input/output solder bumps after reflow is dictated by the height of said non-input/output bumps, a sufficient number of said non-input/output bumps being present such that a buoyant force generated by said non-input/output bumps balances an opposing tensional force generated by the surface tension of said input/output solder bumps during said reflow soldering step.
Claim 3
Dependent Claim
61 words
A method as recited in claim 1 further comprising the step of forming non-input/output pads on said substrate for registering with said non-input/output bumps, wherein said non-input/output bumps become molten during said reflow step such that the height of each of said non-input/output bumps after reflow is determined by the composition and size of a corresponding one of said non-input/output pads.
Claim 4
Dependent Claim
29 words
A method as recited in claim 2 wherein said non-input/output pads are formed on said substrate so as to be physically isolated from each other and from said conductors.
Claim 5
Dependent Claim
24 words
A method as recited in claim 1 wherein said non-input/output bumps and said input/output solder bumps are formed simultaneously from a single solder material.
Claim 6
Independent Claim
248 words
A method for controlling the height of input/output solder bumps which electrically interconnect a flip chip device to a substrate, the method comprising the steps of: forming non-input/output solder bumps and said input/output solder bumps on a surface of said flip chip device, said input/output solder bumps defining terminal locations on said flip chip device; forming a flip chip conductor pattern on said substrate which is complementary to said terminal locations on said flip chip device, said flip chip conductor pattern comprising a plurality of conductor pads on said substrate; forming non-input/output pads on said substrate for mating with said non-input/output solder bumps; mating said flip chip device with said substrate such that said terminal locations register with said flip chip conductor pattern so as to electrically interconnect said input/output solder bumps to said plurality of conductor pads, and such that said non-input/output solder bumps register with said non-input/output pads; and reflow soldering said flip chip device to said substrate such that the height of each of said non-input/output solder bumps is determined by the composition and size of a corresponding one of said non-input/output pads, a sufficient number of said non-input/output solder bumps being present such that a buoyant force generated by said non-input/output solder bumps balances an opposing tensional force generated by the surface tension of said input/output solder bumps during said reflow soldering step; whereby the height of each of said input/output solder bumps is substantially dictated by the height of said non-input/output solder bumps.
Claim 7
Independent Claim
248 words
A method for controlling the height of input/output solder bumps which electrically interconnect a flip chip device to a substrate, the method comprising the steps of: forming non-input/output solder bumps and said input/output solder bumps on a surface of said flip chip device, said input/output solder bumps defining terminal locations on said flip chip device; forming a flip chip conductor pattern on said substrate which is complementary to said terminal locations on said flip chip device, said flip chip conductor pattern comprising a plurality of conductor pads on said substrate; forming non-input/output pads on said substrate for mating with said non-input/output solder bumps; mating said flip chip device with said substrate such that said terminal locations register with said flip chip conductor pattern so as to electrically interconnect said input/output solder bumps to said plurality of conductor pads, and such that said non-input/output solder bumps register with said non-input/output pads; and reflow soldering said flip chip device to said substrate such that the height of each of said non-input/output solder bumps is determined by the composition and size of a corresponding one of said non-input/output pads, a sufficient number of said non-input/output solder bumps being present such that a buoyant force generated by said non-input/output solder bumps balances an opposing tensional force generated by the surface tension of said input/output solder bumps during said reflow soldering step; whereby the height of each of said input/output solder bumps is substantially dictated by the height of said non-input/output solder bumps.
Claim 8
Dependent Claim
25 words
A method as recited in claim 5 wherein said non-input/output solder bumps and said input/output solder bumps are formed simultaneously from a single solder material.
Claim 9
Dependent Claim
22 words
A method as recited in claim 5 wherein said conductor pads and said non-input/output pads are formed simultaneously from the same material.
Claim 10
Dependent Claim
34 words
A method as recited in claim 5 wherein said step of forming said non-input/output solder bumps and said input/output solder bumps comprises depositing a solder paste on said surface of said flip chip device.
Claim 11
Dependent Claim
30 words
A method as recited in claim 5 wherein said non-input/output pads are formed on said substrate so as to be physically isolated from each other and from said conductors pads.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-03-27 | 1998-09-26 | 1999-03-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-03-27 | 2002-09-26 | 2003-03-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-03-27 | 2006-09-26 | 2007-03-28 | $7700.00 | Window Closed / Lapsed |