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US5400740A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of preparing compound semiconductor

Assignee: Mitsubishi Chemical Corp
•
Filing: 1993-06-01
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Granted: 1995-03-28
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Expires: 2013-06-01
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Abstract

Abstract A method of preparing a compound semiconductor is carried out, by introducing the group III organic metals gas and/or the hydrides containing group V elements, or group V organic metals gas into a growth chamber, in addition to a carrier gas and an etching gas, in a method of preparing a group III-V compound semiconductor including the process to effect the gas etching of a single crystal sustrate surface and/or a single crystal thin-film surface in the growth chamber, just before a vapor phase growth of a compound semiconductor thin-film is performed, using the hydrides and the organic metals gas. According to the present invention, the impurity pollution, the oxide film, the thermometamorphism and the hike, in an interface between the single crystal substrate and the epitaxial layer as well as in the regrown interface can be removed, thereby making it possible to get a clean surface of the interface and to restrain the accumulation or the depletion of carrier-concentration which has not been intended. As a result, the quality of the device can be greatly improved as compared with that of the one obtained by a usual preparing method.

Inventors

  • 👤 Hideki Goto
  • 👤 Kenji Shimoyama

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 04:28
CPC Classifications
H; H10; H10P; H10P90/00; H10P90/12; H10P90/126; H10P14/00; H10P14/20; H10P14/24; H10P14/29; H10P14/2901; H10P14/2907; H10P14/2911; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3421; H10P14/3438; H10P14/3441; H10P14/3442; H10P14/36; H10P50/00; H10P50/20; H10P50/24; H10P50/246

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 88 words
In a method of preparing a III-V group compound semiconductor including a process of effecting gas etching of a single crystal substrate surface and/or a single crystal thin-film surface in a crystal growth chamber, just before vapor phase growth of a compound semiconductor thin-film is carried out using hydrides and an organic metals gas, the improvement comprises introducing the hydrides containing III-group organic metals gas and/or V-group elements, or V-group organic metals gas into the crystal growth chamber, in addition to a carrier gas and a etching gas.
Claim 2
Dependent Claim 88 words
In a method of preparing a III-V group compound semiconductor including a process of effecting gas etching of a single crystal substrate surface and/or a single crystal thin-film surface in a crystal growth chamber, just before vapor phase growth of a compound semiconductor thin-film is carried out using hydrides and an organic metals gas, the improvement comprises introducing the hydrides containing III-group organic metals gas and/or V-group elements, or V-group organic metals gas into the crystal growth chamber, in addition to a carrier gas and a etching gas.
Claim 3
Dependent Claim 65 words
A method of preparing a III-V group compound semiconductor according to claim 1, wherein the III-group organic metals gas is introduced when a dopant to enter the III-group site is used, and the hydrides containing V-group elements or the V-group organic metals gas is introduced when a dopant to enter the V-group site is used, in case where doping is effected just after gas etching.
Claim 4
Dependent Claim 43 words
A method of preparing a III-V group compound semiconductor according to claim 1, wherein the compound semiconductor thin-film is regrown or selectively grown on a mesa shape substrate or on an epitaxial layer formed by a gas etching in a crystal growth chamber.
Claim 5
Dependent Claim 20 words
A method of preparing III-V group compound semiconductor according to claim 1, wherein the etching gas contains a halogens gas.
Claim 6
Dependent Claim 43 words
A method of preparing a III-V group compound semiconductor according to claim 1, wherein the etching gas contains at least one chlorine-series reaction gas selected from the group consisting of HCl, CCl 2 F 2 , AsCl 3 , and Cl 2 .

References Cited (Backward Citations)

US4147571A Cited
US4488914A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-03-27 1998-09-26 1999-03-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-03-27 2002-09-26 2003-03-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-03-27 2006-09-26 2007-03-28 $7700.00 Window Closed / Lapsed

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