Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
153 words
In an integrated circuit including a user-accessible input pin to which may be applied a user-selected logic level, and a random access memory cell having an output node connectable to a bit line through a select device, said select device driven by a signal from a word line driver on a word line and said bit line driven by a bit line driver, apparatus for setting said random access memory cell to said user-selected logic level during a power-up interval of said integrated circuit while a potential difference powering said integrated circuit increases from zero volts to an operating value, said apparatus comprising: first means for disconnecting the bit line driver from the bit line during the power-up interval; second means for disconnecting the word line driver from the bit line during the power-up interval; third means for writing the user-selected logic level into the random access memory cell during the power-up interval.
Claim 2
Dependent Claim
153 words
In an integrated circuit including a user-accessible input pin to which may be applied a user-selected logic level, and a random access memory cell having an output node connectable to a bit line through a select device, said select device driven by a signal from a word line driver on a word line and said bit line driven by a bit line driver, apparatus for setting said random access memory cell to said user-selected logic level during a power-up interval of said integrated circuit while a potential difference powering said integrated circuit increases from zero volts to an operating value, said apparatus comprising: first means for disconnecting the bit line driver from the bit line during the power-up interval; second means for disconnecting the word line driver from the bit line during the power-up interval; third means for writing the user-selected logic level into the random access memory cell during the power-up interval.
Claim 3
Dependent Claim
216 words
In an integrated circuit including a user-accessible input pin to which may be applied a user-selected logic level, said integrated circuit powered by a first potential difference to ground and further including at least one random access memory cell powered by a source of a second potential difference to ground larger than said first potential difference, said at least one random access memory cell comprising a cross-coupled latch having an output node connectable to a bit line through a select device, said select device driven by a signal from a word line driver on a word line and said bit line driven by a bit line driver, apparatus for setting said at least one random access memory cell to said user-selected logic level during a power-up interval of said integrated circuit while said second potential difference increases from zero volts to an operating value, said apparatus comprising: first means for disconnecting the word line driver from the select device and for turning on the select device during the power-up interval; second means for disconnecting the bit line driver from the bit line and for connecting the second potential difference to the bit line during the power-up interval; and third means for writing the user-selected logic level into the random access memory cell during the power-up interval.
Claim 4
Dependent Claim
216 words
In an integrated circuit including a user-accessible input pin to which may be applied a user-selected logic level, said integrated circuit powered by a first potential difference to ground and further including at least one random access memory cell powered by a source of a second potential difference to ground larger than said first potential difference, said at least one random access memory cell comprising a cross-coupled latch having an output node connectable to a bit line through a select device, said select device driven by a signal from a word line driver on a word line and said bit line driven by a bit line driver, apparatus for setting said at least one random access memory cell to said user-selected logic level during a power-up interval of said integrated circuit while said second potential difference increases from zero volts to an operating value, said apparatus comprising: first means for disconnecting the word line driver from the select device and for turning on the select device during the power-up interval; second means for disconnecting the bit line driver from the bit line and for connecting the second potential difference to the bit line during the power-up interval; and third means for writing the user-selected logic level into the random access memory cell during the power-up interval.
Claim 5
Dependent Claim
158 words
In an integrated circuit including a random access memory cell and a user-accessible input pin to which may be applied a user-selected logic level, said random access memory cell having an output node connectable to a bit line through a select device, said select device driven by a signal from a word line driver on a word line and said bit line driven by a bit line driver, apparatus for setting said random access memory cell to said user-selected logic level during a power-up interval of said integrated circuit while a potential difference powering said integrated circuit increases form zero volts to an operating value, said apparatus comprising: first means for disconnecting the bit line driver from the bit line during the power-up interval; second means for disconnecting the word line driver from the bit line during the power-up interval; third means for writing the user-selected logic level into the random access memory cell during the power-up interval.
Claim 6
Dependent Claim
158 words
In an integrated circuit including a random access memory cell and a user-accessible input pin to which may be applied a user-selected logic level, said random access memory cell having an output node connectable to a bit line through a select device, said select device driven by a signal from a word line driver on a word line and said bit line driven by a bit line driver, apparatus for setting said random access memory cell to said user-selected logic level during a power-up interval of said integrated circuit while a potential difference powering said integrated circuit increases form zero volts to an operating value, said apparatus comprising: first means for disconnecting the bit line driver from the bit line during the power-up interval; second means for disconnecting the word line driver from the bit line during the power-up interval; third means for writing the user-selected logic level into the random access memory cell during the power-up interval.
Claim 7
Dependent Claim
208 words
In an integrated circuit including a user-accessible input pin to which may be applied a user-selected logic level, said integrated circuit powered by a first potential difference to ground and further including at least one random access memory cell powered by a source of a second potential difference to ground larger than said first potential difference, said at least one random access memory cell comprising a cross-coupled latch having an output node connectable to a bit line through a select device, said select device driven by a signal from a word line driver on a word line and said bit line driven by a bit line driver, apparatus for setting said at least one random access memory cell to said user-selected logic level during a power-up interval of said integrated circuit while said second potential difference increases form zero volts to an operating value, said apparatus comprising: first means for disconnecting the word line driver from the select device and for turning on the select device during the power-up interval; and second means for disconnecting the bit line driver from the bit line and for connecting a signal representing the user-selected logic level derived from the user accessible input pin to the bit line during said power-up interval.
Claim 8
Dependent Claim
208 words
In an integrated circuit including a user-accessible input pin to which may be applied a user-selected logic level, said integrated circuit powered by a first potential difference to ground and further including at least one random access memory cell powered by a source of a second potential difference to ground larger than said first potential difference, said at least one random access memory cell comprising a cross-coupled latch having an output node connectable to a bit line through a select device, said select device driven by a signal from a word line driver on a word line and said bit line driven by a bit line driver, apparatus for setting said at least one random access memory cell to said user-selected logic level during a power-up interval of said integrated circuit while said second potential difference increases form zero volts to an operating value, said apparatus comprising: first means for disconnecting the word line driver from the select device and for turning on the select device during the power-up interval; and second means for disconnecting the bit line driver from the bit line and for connecting a signal representing the user-selected logic level derived from the user accessible input pin to the bit line during said power-up interval.