US5400277A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor on insulator static random access meory cell utilizing polysilicon resistors formed in trenches
Assignee: Philips Semiconductors Inc
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Filing: 1993-10-29
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Granted: 1995-03-21
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Expires: 2013-10-29
Abstract
Abstract A resistor is connected to the source/drain of a transistor and used as a load element of a memory cell. A trench is formed which extends from a top of the wafer through an isolation region of the wafer to a silicon base of the wafer. The silicon base of the wafer is located below the isolation region of the wafer. A resistive layer of material is formed in the trench. The resistive layer extends from the top of the wafer through the isolation region of the wafer and is electrically connected to the silicon base of the wafer. The resistor is connected to other circuitry on the wafer, for example, by implanting into the wafer atoms of a first conductivity type into a region immediately adjacent to the resistive layer of material in the trench. In the preferred embodiment, the resistive layer of material is deposited polysilicon.
Inventors
- 👤 Edward D. Nowak
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 20:46
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/40; H10D1/47; H10B; H10B10/00; H10B10/15; H10D86/00; H10D86/201; H10W; H10W20/00; H10W20/01; H10W20/021; Y; Y10; Y10S; Y10S257/00; Y10S257/903
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
114 words
An integrated circuit comprising: a top layer of semiconductive material extending across a top surface of the integrated circuit; an isolation layer of insulating material extending across the integrated circuit immediately under the top surface; a silicon base layer of semiconductive material extending across a bottom surface of the integrated circuit; and, a memory cell including selection means for selecting the memory cell, and a first load element, coupled to the selection means, the first load element comprising a resistive layer of material which extends from the top layer of the integrated circuit through the isolation layer of the integrated circuit and is electrically coupled to the silicon base layer of the integrated circuit.
Claim 2
Dependent Claim
114 words
An integrated circuit comprising: a top layer of semiconductive material extending across a top surface of the integrated circuit; an isolation layer of insulating material extending across the integrated circuit immediately under the top surface; a silicon base layer of semiconductive material extending across a bottom surface of the integrated circuit; and, a memory cell including selection means for selecting the memory cell, and a first load element, coupled to the selection means, the first load element comprising a resistive layer of material which extends from the top layer of the integrated circuit through the isolation layer of the integrated circuit and is electrically coupled to the silicon base layer of the integrated circuit.
Claim 3
Dependent Claim
15 words
An integrated circuit as in claim 1 wherein the resistive layer of material comprises polysilicon.
Claim 4
Dependent Claim
157 words
An integrated circuit as in claim 1 wherein the selection means includes: a word line; a bit line; an inverted bit line; a ground line; a power line connected to the silicon base of the integrated circuit; a first transistor having a first end coupled to the inverted bit line, a second end, and a gate coupled to the word line; a second transistor having a first end, a second end coupled to the bit line, and a gate coupled to the word line; a third transistor having a first end coupled to the second end of the first transistor, a second end coupled to the ground line, and a gate coupled to the first end of the second transistor; and, a fourth transistor having a first end coupled to the first end of the second transistor, a second end coupled to the ground line, and a gate coupled to the second end of the first transistor.
Claim 5
Dependent Claim
125 words
An integrated circuit comprising: a top layer of semiconductive material extending across a top surface of the integrated circuit; an isolation layer of insulating material extending across the integrated circuit immediately under the top surface; a silicon base layer of semiconductive material extending across a bottom surface of the integrated circuit; and, a resistor including a resistive layer of material in a trench, the trench extending from the top layer of the integrated circuit through the isolation layer of the integrated circuit to the silicon base layer of the integrated circuit, wherein the resistive layer extends from the top layer of the integrated circuit through the isolation layer of the integrated circuit and is electrically coupled to the silicon base layer of the integrated circuit.
Claim 6
Dependent Claim
125 words
An integrated circuit comprising: a top layer of semiconductive material extending across a top surface of the integrated circuit; an isolation layer of insulating material extending across the integrated circuit immediately under the top surface; a silicon base layer of semiconductive material extending across a bottom surface of the integrated circuit; and, a resistor including a resistive layer of material in a trench, the trench extending from the top layer of the integrated circuit through the isolation layer of the integrated circuit to the silicon base layer of the integrated circuit, wherein the resistive layer extends from the top layer of the integrated circuit through the isolation layer of the integrated circuit and is electrically coupled to the silicon base layer of the integrated circuit.
Claim 7
Dependent Claim
59 words
An integrated circuit as in claim 4 wherein the integrated circuit additionally comprises additional circuitry, the resistor being connected to the additional circuitry by a region immediately adjacent to the resistive layer of material in the trench, atoms of a first conductivity type being implanted into the region immediately adjacent to the resistive layer of material in the trench.
Claim 8
Dependent Claim
16 words
An integrated circuit as in claim 4 wherein the resistive layer of material is deposited polysilicon.
References Cited (Backward Citations)
US4933739A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-03-20 | 1998-09-19 | 1999-03-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-03-20 | 2002-09-19 | 2003-03-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-03-20 | 2006-09-19 | 2007-03-21 | $7700.00 | Window Closed / Lapsed |