US5400209A
Expired / Lapsed
US
⏱️ 0.0 years remaining
In-situ real-time sheet resistance measurement system and method using an electrostatic chuck
Assignee: Texas Instruments Inc
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Filing: 1994-05-25
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Granted: 1995-03-21
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Expires: 2014-05-25
Abstract
Abstract A system 20 for measuring the sheet resistance of a conductive layer on the top surface of a semiconductor wafer 22 is disclosed herein. In one embodiment, the system includes a chuck 30 electrically coupled to the backside surface of the wafer 22. The chuck 30 is capable of supporting the wafer 22 electrostatically. A signal source 40 provides an excitation signal to the wafer 22 and circuitry for monitoring an induced signal is provided. The sheet resistance on the top surface of the wafer 22 is determined from the measurements of the excitation and induced electrical signals. Other systems and methods are also disclosed.
Inventors
- 👤 Mehrdad M. Moslehi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 05:59
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/70; H10P72/72; H10P72/722; C; C23; C23C; C23C16/00; C23C16/44; C23C16/458; C23C16/4582; C23C16/4583; C23C16/52; H10P74/00; H10P74/20; H10P74/207; Y; Y10; Y10T; Y10T279/00; Y10T279/23; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
130 words
A system for measuring output signals at selected locations on the top surface of a semiconductor wafer comprising: a chuck electrically coupled to the bottom surface of said wafer, said chuck capable of supporting said wafer electrostatically; a plurality of sensor electrodes attached to a surface of said chuck, said electrodes insulated from each other and from said chuck and said sensor electrodes electrically coupled to said bottom surface of said wafer, and wherein no sensor electrode is coupled to the frontside of said semiconductor wafer; a signal source coupled to at least one of said sensor electrodes to provide an excitation signal to said wafer and to induce signals in said wafer; and circuitry coupled to at least one other of said sensor electrodes for monitoring said induced signals.
Claim 2
Independent Claim
130 words
A system for measuring output signals at selected locations on the top surface of a semiconductor wafer comprising: a chuck electrically coupled to the bottom surface of said wafer, said chuck capable of supporting said wafer electrostatically; a plurality of sensor electrodes attached to a surface of said chuck, said electrodes insulated from each other and from said chuck and said sensor electrodes electrically coupled to said bottom surface of said wafer, and wherein no sensor electrode is coupled to the frontside of said semiconductor wafer; a signal source coupled to at least one of said sensor electrodes to provide an excitation signal to said wafer and to induce signals in said wafer; and circuitry coupled to at least one other of said sensor electrodes for monitoring said induced signals.
Claim 3
Dependent Claim
15 words
The system of claim 1 and further comprising means for heating or cooling said wafer.
Claim 4
Dependent Claim
16 words
The system of claim 1 wherein said sensor electrodes comprise a set of annular concentric electrodes.
Claim 5
Dependent Claim
31 words
The system of claim 1 wherein said wafer is supported electrostatically by applying a periodic signal to at least two chuck electrodes formed in said chuck and adjacent to said wafer.
Claim 6
Dependent Claim
19 words
The system of claim 4 wherein said periodic signal has a frequency of between about 10 and 10,000 Hz.
Claim 7
Dependent Claim
13 words
The system of claim 1 wherein said signal source is a current source.
Claim 8
Dependent Claim
57 words
The system of claim 4 wherein said periodic signal comprises a positive voltage followed by a ground voltage followed by a negative voltage and wherein the periodic signal applied to one of said at least two chuck electrodes is out of phase with the periodic signal applied to the other of said at least two chuck electrodes.
Claim 9
Dependent Claim
27 words
The system of claim 1 wherein said circuitry comprises a high impedance buffer, an amplifier coupled to said buffer, and an RMS detector coupled to said amplifier.
Claim 10
Dependent Claim
16 words
The system of claim 8 and further comprising an analog-to-digital converter coupled to said RMS detector.
Claim 11
Dependent Claim
15 words
The system of claim 9 and further comprising a controller coupled to said analog-to-digital converter.
Claim 12
Dependent Claim
22 words
The system of claim 1 wherein said excitation signal is a sinusoidal signal with a frequency between about 10 and 50 MHz.
Claim 13
Dependent Claim
16 words
The system of claim 1 and further comprising a capacitor in series with said signal source.
Claim 14
Dependent Claim
15 words
The system of claim 1 wherein said chuck is disposed within a semiconductor process chamber.
Claim 15
Dependent Claim
45 words
The system of claim 1 wherein said chuck comprises: a main chuck body; said sensor electrodes formed in said main chuck body; and a set of chuck electrodes formed in said main chuck body wherein said chuck electrodes are capable of supporting said wafer electrostatically.
Claim 16
Dependent Claim
16 words
The system of claim 1 wherein said sensor electrodes comprise a set of annular concentric electrodes.
Claim 17
Dependent Claim
18 words
The system of claim 15 wherein said set of chuck electrodes comprises a set of annular concentric electrodes.
Claim 18
Dependent Claim
19 words
The system of claim 15 wherein each of said annular concentric electrodes is divided into more than one portion.
Claim 19
Dependent Claim
13 words
The system of claim 14 wherein said main chuck body comprises boron nitride.
Claim 20
Dependent Claim
13 words
The system of claim 14 wherein said sensor and chuck electrodes comprise aluminum.
Claim 21
Dependent Claim
17 words
The system of claim 14 wherein said sensor and chuck electrodes comprise a high temperature metal alloy.
Claim 22
Dependent Claim
16 words
The system of claim 14 wherein said sensor and chuck electrodes further comprise an insulating layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-03-20 | 1998-09-19 | 1999-03-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-03-20 | 2002-09-19 | 2003-03-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-03-20 | 2006-09-19 | 2007-03-21 | $7700.00 | Window Closed / Lapsed |