Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
147 words
An evaluation apparatus for measuring the fluctuation of a voltage and a current on a power supply line and evaluating the result of said measurement, comprising: a dummy load connected to the power supply line to measure the fluctuation of the voltage and the current on the power supply line, said dummy load comprising: a capacitive load, a resistive load connected in parallel with said capacitive load, a current control circuit, connected to said capacitive load and to said resistive load, which controls the current flow to said capacitive load and said resistive load, and a time constant circuit connected to said current control circuit for controlling the flow of current to said current control circuit; and a switch connected to said dummy load for turning ON/OFF said dummy load and thereby simulating an operation of inserting/removing the dummy load to and from the power supply line.
Claim 2
Dependent Claim
147 words
An evaluation apparatus for measuring the fluctuation of a voltage and a current on a power supply line and evaluating the result of said measurement, comprising: a dummy load connected to the power supply line to measure the fluctuation of the voltage and the current on the power supply line, said dummy load comprising: a capacitive load, a resistive load connected in parallel with said capacitive load, a current control circuit, connected to said capacitive load and to said resistive load, which controls the current flow to said capacitive load and said resistive load, and a time constant circuit connected to said current control circuit for controlling the flow of current to said current control circuit; and a switch connected to said dummy load for turning ON/OFF said dummy load and thereby simulating an operation of inserting/removing the dummy load to and from the power supply line.
Claim 3
Dependent Claim
38 words
An evaluation apparatus as claimed in claim 1, wherein said dummy load further comprises: a load voltage setting circuit, connected between the current control circuit and the capacitive and resistive loads, which sets the voltage across the loads.
Claim 4
Dependent Claim
23 words
An evaluation apparatus as claimed in claim 2, wherein said load voltage setting circuit comprises a resistor connected in series to the loads.
Claim 5
Dependent Claim
56 words
An evaluation apparatus as recited in claim 1, wherein: said switch comprises a switching control circuit connected to said dummy load for continuously turning ON/OFF said dummy load and thereby changing the ON/OFF state of said dummy load and correspondingly thereby simulating continuous operations of inserting/removing the dummy load to and from the power supply line.
Claim 6
Dependent Claim
92 words
An evaluation apparatus as claimed in claim 5, wherein said dummy load further comprises: a plurality of parallel-connected capacitive load modules; a plurality of parallel-connected resistive load modules; a current control circuit connected to said plurality of parallel-connected capacitive load modules and said plurality of parallel-connected resistive load modules, said current control circuit controlling a current to said plurality of parallel-connected capacitive load modules and said plurality of parallel-connected resistive load modules; and a time constant circuit connected to said current control circuit which controls the current to said current control circuit.
Claim 7
Dependent Claim
113 words
An evaluation apparatus as claimed in claim 4, wherein said switching control circuit further comprises: a first switch which selects a single pulse mode; a second switch which selects a continuous pulse mode; an oscillator which generates a continuous clock signal; three D-type flip-flop circuits which shift an ON signal from said first switch in response to said clock signal from said oscillator; a J-type flip-flop circuit which generates an inverted clock signal in response to said clock signal from said oscillator; a first NAND gate connected to said first switch through said three D-type flip-flop circuits; and a second NAND gate connected to said second switch and to said J-type flip-flop circuit.