Vacuum actuated multiple level printed circuit board test fixture

Claim 2

A circuit board test fixture for selectively contacting test points on a circuit board, said fixture comprising: a base plate; a plurality of first test probes resiliently supported on said base plate and extending orthogonally therefrom; a plurality of second test probes resiliently supported on said base plate and extending orthogonally therefrom a greater distance than said first test probes; a second plate arranged parallel to said base plate, said base and second plates being movable toward one another; resilient perimetral sealing means arranged between said base and second plates thereby providing a vacuum chamber defined by said base plate, said second plate and said sealing means, said vacuum chamber having a variable volume related to spacing of said plates from one another; board mounting means on said second plate for sealingly mounting a circuit board to be tested on a surface of said second plate away from said base plate; apertures in said second plate arranged for passage of said test probes therethrough and to a circuit board to be tested; resilient bias means mounted between said plates for springably biasing said plates away from one another; a vacuum source in fluid communication with said vacuum chamber for drawing said plates together against said bias means; stop elements arranged between said plates for spacing said plates apart a first fixed distance when a vacuum applied to said vacuum chamber overcomes said resilient bias means, said first fixed distance enabling all said test probes to contact test points on said circuit board in a first test mode; vacuum control means interposed between said vacuum source and said vacuum chamber to regulate the amount of vacuum applied to said chamber; and adjustable position sensing means sensing the distance between said base and second plates, said position sensing means operatively connected to said vacuum control means in a feedback configuration to controllably supply vacuum to said vacuum chamber to maintain a preset second distance in a second test mode, said second distance enabling only said plurality of second test probes to contact test points on said circuit board while said plurality of first test probes are spaced away from said circuit board, said second distance between said plates being greater than said first distance.

Claim 3

The fixture according to claim 1, further comprising atmosphere valve means interposed between said vacuum chamber and ambient atmosphere, said atmosphere valve means being activated in cooperation with said vacuum control means in moving from said first test mode to said second test mode by admitting atmospheric air into said vacuum chamber, said atmosphere valve means being provided with a mechanism which interrupts fluid communication between said ambient atmosphere and said vacuum chamber when said preset second distance is reached.

Claim 4

A circuit board test fixture for selectively contacting test points on a circuit board, said fixture comprising: a base plate; a plurality of n populations of test probes resiliently supported on said base plate and extending upward orthogonally therefrom, all of the probes of a particular population extending upward substantially the same distance, and each population extending upward a different distance than other populations; a second plate arranged parallel to said base plate, said base and second plates being movable toward one another; resilient perimetral sealing means arranged between said base and second plates thereby providing a vacuum chamber defined by said base plate, said second plate and said sealing means, said vacuum chamber having a variable volume related to spacing of said plates from one another; board mounting means on said second plate for sealingly mounting a circuit board to be tested on a surface of said second plate away from said base plate; apertures in said second plate arranged for passage of said test probes therethrough and to a circuit board to be tested; resilient bias means mounted between said plates for springably biasing said plates away from one another; a vacuum source in fluid communication with said vacuum chamber for drawing said plates together against said bias means; stop elements arranged between said plates for spacing said plates apart a fixed distance when a vacuum applied to said vacuum chamber completely overcomes said resilient bias means, said fixed distance enabling all said test probes to contact test points on said circuit board in a first test mode; vacuum control means interposed between said vacuum source and said vacuum chamber to regulate the amount of vacuum applied to said chamber; adjustable position sensing means sensing the distance between said base and second plates, said position sensing means operatively connected to said vacuum control means in a feedback configuration to controllably supply vacuum to said vacuum chamber to selectively maintain a series of n-1 preset distances between plates in a series of n-1 test modes; a first member of said series of preset distances enabling all but the shortest population of probes to contact said circuit board in a second test mode, the first preset distance being greater than said fixed distance; and each subsequent member of said series of preset distances being greater than a preceding member of said series of preset distances and spacing away from said circuit board one additional population of test probes in a subsequent test mode in said series of test modes.

Claim 5

A circuit board test fixture for selectively contacting test points on a circuit board, said fixture comprising: a base plate; a plurality of n populations of test probes resiliently supported on said base plate and extending upward orthogonally therefrom, all of the probes of a particular population extending upward substantially the same distance, and each population extending upward a different distance than other populations; a second plate arranged parallel to said base plate, said base and second plates being movable toward one another; resilient perimetral sealing means arranged between said base and second plates thereby providing a vacuum chamber defined by said base plate, said second plate and said sealing means, said vacuum chamber having a variable volume related to spacing of said plates from one another; board mounting means on said second plate for sealingly mounting a circuit board to be tested on a surface of said second plate away from said base plate; apertures in said second plate arranged for passage of said test probes therethrough and to a circuit board to be tested; resilient bias means mounted between said plates for springably biasing said plates away from one another; a vacuum source in fluid communication with said vacuum chamber for drawing said plates together against said bias means; stop elements arranged between said plates for spacing said plates apart a fixed distance when a vacuum applied to said vacuum chamber completely overcomes said resilient bias means, said fixed distance enabling all said test probes to contact test points on said circuit board in a first test mode; vacuum control means interposed between said vacuum source and said vacuum chamber to regulate the amount of vacuum applied to said chamber; adjustable position sensing means sensing the distance between said base and second plates, said position sensing means operatively connected to said vacuum control means in a feedback configuration to controllably supply vacuum to said vacuum chamber to selectively maintain a series of n-1 preset distances between plates in a series of n-1 test modes; a first member of said series of preset distances enabling all but the shortest population of probes to contact said circuit board in a second test mode, the first preset distance being greater than said fixed distance; and each subsequent member of said series of preset distances being greater than a preceding member of said series of preset distances and spacing away from said circuit board one additional population of test probes in a subsequent test mode in said series of test modes.

Claim 6

The fixture according to claim 3, further comprising atmosphere valve means interposed between said vacuum chamber and ambient atmosphere, said atmosphere valve means being activated in cooperation with said vacuum control means in moving between certain test modes by admitting atmospheric air into said vacuum chamber, said atmosphere valve means being provided with a mechanism which interrupts fluid communication between said ambient atmosphere and said vacuum chamber when a preset distance is reached.