Claims Analysis
Total Claims: 29
Claim 1
Independent Claim
95 words
A semiconductor device comprising: a doped polycrystalline semiconducting diamond layer; and a refractory metal carbide layer on said polycrystalline semiconducting diamond layer and forming a rectifying contact therewith, said refractory metal carbide layer and said polycrystalline semiconducting diamond layer defining a substantially chemically nonreactive interface therebetween for reducing outdiffusion of carbon atoms from said polycrystalline semiconducting diamond layer to said refractory metal carbide layer to thereby reduce electrically active defects in said polycrystalline semiconducting diamond layer, said refractory metal carbide layer having a plurality of portions of different predetermined proportions of refractory metal and carbon.
Claim 2
Dependent Claim
95 words
A semiconductor device comprising: a doped polycrystalline semiconducting diamond layer; and a refractory metal carbide layer on said polycrystalline semiconducting diamond layer and forming a rectifying contact therewith, said refractory metal carbide layer and said polycrystalline semiconducting diamond layer defining a substantially chemically nonreactive interface therebetween for reducing outdiffusion of carbon atoms from said polycrystalline semiconducting diamond layer to said refractory metal carbide layer to thereby reduce electrically active defects in said polycrystalline semiconducting diamond layer, said refractory metal carbide layer having a plurality of portions of different predetermined proportions of refractory metal and carbon.
Claim 3
Dependent Claim
47 words
A semiconductor device according to claim 1, wherein one of said plurality of portions of said refractory metal carbide layer having substantially stoichiometric proportions of refractory metal and carbon so that a ratio of carbon to refractory metal is in a range of about 0.8 to 1.2.
Claim 4
Dependent Claim
32 words
A semiconductor device according to claim 1 wherein a refractory metal of said refractory metal carbide layer is selected from the group consisting of Group IV, V, and VI transition element metals.
Claim 5
Dependent Claim
31 words
A semiconductor device according to claim 1 wherein a refractory metal of said refractory metal carbide layer is selected from the group consisting of titanium, tantalum, tungsten, molybdenum, hafnium and niobium.
Claim 6
Dependent Claim
49 words
A semiconductor device according to claim 1 wherein said semiconductor device is a metal semiconductor field effect transistor; wherein said polycrystalline diamond layer includes a source region, a drain region, and a channel region; and wherein said refractory metal carbide layer defines a gate electrode overlying said channel region.
Claim 7
Dependent Claim
15 words
A semiconductor device according to claim 1 wherein said polycrystalline semiconducting diamond layer is p-type.
Claim 8
Dependent Claim
23 words
A semiconductor device according to claim 1 further comprising a nondiamond substrate on said polycrystalline diamond layer opposite said refractory metal carbide layer.
Claim 9
Dependent Claim
116 words
A semiconductor device comprising: a polycrystalline semiconducting diamond layer; a first refractory metal carbide layer on said polycrystalline diamond layer, said first refractory metal carbide layer having substantially stoichiometric proportions of refractory metal and carbon so that a ratio of carbon to refractory metal is in a range of about 0.8 to 1.2; and a second refractory metal carbide layer on said first refractory metal carbide layer, said second refractory metal carbide layer having proportions of refractory metal and carbon so that a ratio of carbon to refractory metal is less than about 0.8 defining a metal-rich layer; whereby said polycrystalline diamond layer and said first and second refractory carbide metal layers form a rectifying contact.
Claim 10
Dependent Claim
116 words
A semiconductor device comprising: a polycrystalline semiconducting diamond layer; a first refractory metal carbide layer on said polycrystalline diamond layer, said first refractory metal carbide layer having substantially stoichiometric proportions of refractory metal and carbon so that a ratio of carbon to refractory metal is in a range of about 0.8 to 1.2; and a second refractory metal carbide layer on said first refractory metal carbide layer, said second refractory metal carbide layer having proportions of refractory metal and carbon so that a ratio of carbon to refractory metal is less than about 0.8 defining a metal-rich layer; whereby said polycrystalline diamond layer and said first and second refractory carbide metal layers form a rectifying contact.
Claim 11
Dependent Claim
43 words
A semiconductor device according to claim 8 wherein said polycrystalline diamond layer and said first refractory metal carbide layer define a chemically non-reactive interface therebetween for reducing outdiffusion of carbon atoms from said polycrystalline diamond layer to said first refractory metal carbide layer.
Claim 12
Dependent Claim
22 words
A semiconductor device according to claim 8 wherein said first and second refractory metal carbide layers define a graded interface region therebetween.
Claim 13
Dependent Claim
21 words
A semiconductor device according to claim 8 wherein said first and second refractory metal carbide layers include a same refractory metal.
Claim 14
Dependent Claim
26 words
A semiconductor device according to claim 11 wherein said refractory metal is selected from the group consisting of Group IV, V, and VI transition element metals.
Claim 15
Dependent Claim
25 words
A semiconductor device according to claim 11 wherein said refractory metal is selected from the group consisting of titanium, tantalum, tungsten, molybdenum, hafnium and niobium.
Claim 16
Dependent Claim
52 words
A semiconductor device according to claim 8 wherein said semiconductor device is a metal semiconductor field effect transistor; wherein said polycrystalline diamond layer includes a source region, a drain region, and a channel region; and wherein said first and second refractory metal carbide layers define a gate electrode overlying said channel region.
Claim 17
Dependent Claim
15 words
A semiconductor device according to claim 8 wherein said polycrystalline semiconducting diamond layer is p-type.
Claim 18
Dependent Claim
24 words
A semiconductor device according to claim 8 further comprising a nondiamond substrate on said polycrystalline diamond layer opposite said first refractory metal carbide layer.
Claim 19
Dependent Claim
160 words
A semiconductor device comprising: a polycrystalline semiconducting diamond layer; a first refractory metal carbide layer on said diamond layer, said first refractory metal carbide layer having proportions of refractory metal and carbon so that a ratio of carbon to refractory metal is greater than about 1.2 defining a carbon-rich layer; a second refractory metal carbide layer on said first refractory metal carbide layer, said second refractory metal carbide layer having substantially stoichiometric proportions of refractory metal and carbon so that a ratio of carbon to refractory metal is in a range of about 0.8 to 1.2; and a third refractory metal carbide layer on said second refractory metal carbide layer, said third refractory metal carbide layer having proportions of refractory metal and carbon so that a ratio of carbon to refractory metal is less than about 0.8 defining a metal-rich layer; whereby said polycrystalline diamond layer and said first, second, and third refractory metal carbide layers form a rectifying contact.
Claim 20
Dependent Claim
160 words
A semiconductor device comprising: a polycrystalline semiconducting diamond layer; a first refractory metal carbide layer on said diamond layer, said first refractory metal carbide layer having proportions of refractory metal and carbon so that a ratio of carbon to refractory metal is greater than about 1.2 defining a carbon-rich layer; a second refractory metal carbide layer on said first refractory metal carbide layer, said second refractory metal carbide layer having substantially stoichiometric proportions of refractory metal and carbon so that a ratio of carbon to refractory metal is in a range of about 0.8 to 1.2; and a third refractory metal carbide layer on said second refractory metal carbide layer, said third refractory metal carbide layer having proportions of refractory metal and carbon so that a ratio of carbon to refractory metal is less than about 0.8 defining a metal-rich layer; whereby said polycrystalline diamond layer and said first, second, and third refractory metal carbide layers form a rectifying contact.
Claim 21
Dependent Claim
43 words
A semiconductor device according to claim 17 wherein said polycrystalline diamond layer and said first refractory metal carbide layer define a chemically non-reactive interface therebetween for reducing outdiffusion of carbon atoms from said polycrystalline diamond layer to said first refractory metal carbide layer.
Claim 22
Dependent Claim
23 words
A semiconductor device according to claim 17 wherein said first and second refractory metal carbide layers define a first graded interface region therebetween.
Claim 23
Dependent Claim
23 words
A semiconductor device according to claim 19 wherein said second and third refractory metal carbide layers define a second graded interface region therebetween.
Claim 24
Dependent Claim
22 words
A semiconductor device according to claim 17 wherein said first, second, and third refractory metal carbide layers include a same refractory metal.
Claim 25
Dependent Claim
26 words
A semiconductor device according to claim 21 wherein said refractory metal is selected from the group consisting of Group IV, V, and VI transition element metals.
Claim 26
Dependent Claim
25 words
A semiconductor device according to claim 21 wherein said refractory metal is selected from the group consisting of titanium, tantalum, tungsten, molybdenum, hafnium and niobium.
Claim 27
Dependent Claim
53 words
A semiconductor device according to claim 17 wherein said semiconductor device is a metal semiconductor field effect transistor; wherein said polycrystalline diamond layer includes a source region, a drain region, and a channel region; and wherein said first, second and third refractory metal carbide layers define a gate electrode overlying said channel region.
Claim 28
Dependent Claim
15 words
A semiconductor device according to claim 17 wherein said polycrystalline semiconducting diamond layer is p-type.
Claim 29
Dependent Claim
24 words
A semiconductor device according to claim 17 further comprising a nondiamond substrate on said polycrystalline diamond layer opposite said first refractory metal carbide layer.