US5382484A
Expired / Lapsed
US
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Method of correcting defects in the pattern of phase shift mask
Assignee: Renesas Electronics Corp
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Filing: 1993-04-29
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Granted: 1995-01-17
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Expires: 2013-04-29
Abstract
Abstract A method of correcting a pattern defect in a phase shift mask allowing planarization of bump and divot defects in a phase shift mask with high accuracy is disclosed. In the case of a bump defect, the region including the bump defect is irradiated with an FIB and supplied with a deposition gas, thereby forming a planarization film, and then the planarization film is etched back with the FIB. Thereafter, a layer containing ions is removed away using a laser beam. In the case of a divot defect, the region including the divot defect is planarized by application of an SOG film, and then the unnecessary part of the SOG film other than in the region of the divot defect is removed away by etching back to the interface of the SOG film with the FIB and developing the same. Thereafter, the layer containing ions is removed away utilizing a laser beam.
Inventors
- 👤 Kunihiro Hosono
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 04:44
CPC Classifications
G; G03; G03F; G03F1/00; G03F1/26; G03F1/68; G03F1/72; G03F1/74
Claims Analysis
Total Claims: 27
Claim 1
Independent Claim
71 words
A method of correcting a pattern defect in a phase shift mask including a substrate, a phase shifter, and a light shielding film and having a bump defect, comprising the steps of: forming a correction film to surround and cover said bump defect; and removing away said bump defect together with said correction film by etching back said correction film, wherein said etching back is performed utilizing a focused ion beam.
Claim 2
Independent Claim
71 words
A method of correcting a pattern defect in a phase shift mask including a substrate, a phase shifter, and a light shielding film and having a bump defect, comprising the steps of: forming a correction film to surround and cover said bump defect; and removing away said bump defect together with said correction film by etching back said correction film, wherein said etching back is performed utilizing a focused ion beam.
Claim 3
Dependent Claim
72 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 1, wherein said step of etching back includes the steps of, leaving ion residue and concave correction film residue by irradiating said ion beam except for the circumference of said correction film, and removing said ion residue and said correction film residue by irradiating said ion residue and said correction film residue with a laser beam.
Claim 4
Dependent Claim
40 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 1, wherein said step of forming the correction film includes forming said correction film by supplying a deposition gas while irradiating the ion beam.
Claim 5
Independent Claim
89 words
A method of correcting a pattern defect in a phase shift mask having a bump defect, comprising the steps of: forming a planarization film covering said bump defect by irradiating an ion beam upon a region containing said bump defect while supplying a deposition gas; etching back said planarization film by irradiating a focused ion beam upon a surface of said planarization film; and removing a layer containing ions remaining in the region after the planarization film is etched by irradiating a laser beam upon the layer containing ions.
Claim 6
Independent Claim
89 words
A method of correcting a pattern defect in a phase shift mask having a bump defect, comprising the steps of: forming a planarization film covering said bump defect by irradiating an ion beam upon a region containing said bump defect while supplying a deposition gas; etching back said planarization film by irradiating a focused ion beam upon a surface of said planarization film; and removing a layer containing ions remaining in the region after the planarization film is etched by irradiating a laser beam upon the layer containing ions.
Claim 7
Dependent Claim
78 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 4, wherein said step of forming a planarization film includes a first step of irradiating an ion beam upon the region containing said bump defect while supplying said deposition gas thereto, and a second step of only irradiating an ion beam to the region containing said bump defect, said first step and said second step being conducted alternately at prescribed time intervals.
Claim 8
Dependent Claim
44 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 4, wherein said step of forming a planarization film includes a step of forming the planarization film by irradiating an ion beam while continuously supplying a deposition gas.
Claim 9
Dependent Claim
41 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 4, wherein said ion beam includes an ion beam utilizing one ion selected from the group consisting of Ga, Au, Si, Be, In, and Zn.
Claim 10
Dependent Claim
46 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 4, wherein said deposition gas includes one deposition gas selected from the group constituting of a hydrocarbon based gas, an organic metal based gas, and a metal carbonyl based gas.
Claim 11
Dependent Claim
25 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 4, wherein said laser beam includes an Nd:YAG laser.
Claim 12
Dependent Claim
36 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 4, wherein said planarization film is etched at a speed substantially identical to the speed of etching said bump defect.
Claim 13
Dependent Claim
65 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 4, wherein said step of etching back a planarization film includes stopping said etching back by detecting a secondary signal at the time of etching back said planarization film, thereby detecting a signal change in said secondary signal in the interface between a mask substrate and said planarization film.
Claim 14
Independent Claim
96 words
A method of correcting a pattern defect in a phase shift mask including a substrate, a phase shifter having a divot defect, and a light shielding film, comprising the steps of: forming on said phase shifter having said divot defect, a correction film having about the same refractive index as said phase shifter and solution selectivity to said phase shifter, and etching back said correction film to leave part of said correction film in said divot defect, and removing the other part of correction film, wherein said etching back is performed utilizing a focused ion beam.
Claim 15
Independent Claim
96 words
A method of correcting a pattern defect in a phase shift mask including a substrate, a phase shifter having a divot defect, and a light shielding film, comprising the steps of: forming on said phase shifter having said divot defect, a correction film having about the same refractive index as said phase shifter and solution selectivity to said phase shifter, and etching back said correction film to leave part of said correction film in said divot defect, and removing the other part of correction film, wherein said etching back is performed utilizing a focused ion beam.
Claim 16
Independent Claim
131 words
A method of correcting a pattern defect in a phase shift mask having a divot defect, comprising the steps of: covering a first phase shifter layer having said divot defect by forming a second phase shifter layer having solution selectivity to said first phase shifter layer and the region subjected to irradiation of an ion beam; etching back a prescribed part of said second phase shifter layer by irradiating a focused ion beam upon a surface of said second phase shifter layer; removing said second phase shifter layer other than the region subjected to irradiation of said ion beam by developing said second phase shifter layer; and removing a layer containing ions remaining in the region subjected to said ion beam by irradiating a laser beam upon said layer containing ions.
Claim 17
Independent Claim
131 words
A method of correcting a pattern defect in a phase shift mask having a divot defect, comprising the steps of: covering a first phase shifter layer having said divot defect by forming a second phase shifter layer having solution selectivity to said first phase shifter layer and the region subjected to irradiation of an ion beam; etching back a prescribed part of said second phase shifter layer by irradiating a focused ion beam upon a surface of said second phase shifter layer; removing said second phase shifter layer other than the region subjected to irradiation of said ion beam by developing said second phase shifter layer; and removing a layer containing ions remaining in the region subjected to said ion beam by irradiating a laser beam upon said layer containing ions.
Claim 18
Dependent Claim
38 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 13, wherein said first phase shifter layer is an SiO 2 film, and said second phase shifter layer is an SOG film.
Claim 19
Dependent Claim
43 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 13, wherein said ion beam includes an ion beam utilizing one kind of ion selected from the group constituting of Ga, Au, Si, Be, In, and Zn.
Claim 20
Dependent Claim
79 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 13, wherein said step of etching back a prescribed part of said second phase shifter layer includes a step of stopping said etching back by detecting a secondary signal at the time of etching back said second phase shifter layer, thereby detecting signal change in said secondary signal in the interface between said first phase shifter layer and said second phase shifter layer.
Claim 21
Dependent Claim
26 words
A method of correcting a pattern defect in a phase shift mask as recited in claim 13, wherein said laser beam includes an Nd: YAG laser.
Claim 22
Independent Claim
149 words
A method of correcting a pattern defect in a phase shift mask having a bump defect, comprising the steps of: forming a planarization film covering said bump defect by irradiating an ion beam upon a region containing said bump defect while supplying a deposition gas; etching back said planarization film by irradiating an ion beam upon a surface of said planarization film; and removing a layer containing ions remaining in the region after the planarization film is etched by irradiating a laser beam upon the layer containing ions, wherein said step of forming a planarization film includes a first step of irradiating an ion beam upon the region containing said bump defect while supplying said deposition gas thereto, and a second step of irradiating an ion beam only to the region containing said bump defect, said first step and said second step being conducted alternately at prescribed time intervals.
Claim 23
Independent Claim
149 words
A method of correcting a pattern defect in a phase shift mask having a bump defect, comprising the steps of: forming a planarization film covering said bump defect by irradiating an ion beam upon a region containing said bump defect while supplying a deposition gas; etching back said planarization film by irradiating an ion beam upon a surface of said planarization film; and removing a layer containing ions remaining in the region after the planarization film is etched by irradiating a laser beam upon the layer containing ions, wherein said step of forming a planarization film includes a first step of irradiating an ion beam upon the region containing said bump defect while supplying said deposition gas thereto, and a second step of irradiating an ion beam only to the region containing said bump defect, said first step and said second step being conducted alternately at prescribed time intervals.
Claim 24
Independent Claim
136 words
A method of correcting a pattern defect in a phase shift mask having a bump defect, comprising the steps of: forming a planarization film covering said bump defect by irradiating an ion beam upon a region containing said bump defect while supplying a deposition gas; etching back said planarization film by irradiating an ion beam upon a surface of said planarization film; and removing a layer containing ions remaining in the region after the planarization film is etched by irradiating a laser beam upon the layer containing ions, wherein said step of etching back a planarization film includes stopping said etching back by detecting a secondary signal at the time of etching back said planarization film, thereby detecting a signal change in said secondary signal in the interface between a mask substrate and said planarization film.
Claim 25
Independent Claim
136 words
A method of correcting a pattern defect in a phase shift mask having a bump defect, comprising the steps of: forming a planarization film covering said bump defect by irradiating an ion beam upon a region containing said bump defect while supplying a deposition gas; etching back said planarization film by irradiating an ion beam upon a surface of said planarization film; and removing a layer containing ions remaining in the region after the planarization film is etched by irradiating a laser beam upon the layer containing ions, wherein said step of etching back a planarization film includes stopping said etching back by detecting a secondary signal at the time of etching back said planarization film, thereby detecting a signal change in said secondary signal in the interface between a mask substrate and said planarization film.
Claim 26
Independent Claim
192 words
A method of correcting a pattern defect in a phase shift mask having a divot defect, comprising the steps of: covering a first phase shifter layer having said divot defect by forming a second phase shifter layer having solution selectivity to said first phase shifter layer and the region subjected to irradiation of an ion beam; etching back a prescribed part of said second phase shifter layer by irradiating an ion beam upon a surface of said second phase shifter layer; removing said second phase shifter layer other than the region subjected to irradiation of said ion beam by developing said second phase shifter layer; and removing a layer containing ions remaining in the region subjected to said ion beam by irradiating a laser beam upon said layer containing ions, wherein said step of etching back a prescribed part of said second phase shifter layer includes a step of stopping said etching back by detecting a secondary signal at the time of etching back said second phase shifter layer, thereby detecting signal change in said secondary signal in the interface between said first phase shifter layer and said second phase shifter layer.
Claim 27
Independent Claim
192 words
A method of correcting a pattern defect in a phase shift mask having a divot defect, comprising the steps of: covering a first phase shifter layer having said divot defect by forming a second phase shifter layer having solution selectivity to said first phase shifter layer and the region subjected to irradiation of an ion beam; etching back a prescribed part of said second phase shifter layer by irradiating an ion beam upon a surface of said second phase shifter layer; removing said second phase shifter layer other than the region subjected to irradiation of said ion beam by developing said second phase shifter layer; and removing a layer containing ions remaining in the region subjected to said ion beam by irradiating a laser beam upon said layer containing ions, wherein said step of etching back a prescribed part of said second phase shifter layer includes a step of stopping said etching back by detecting a secondary signal at the time of etching back said second phase shifter layer, thereby detecting signal change in said secondary signal in the interface between said first phase shifter layer and said second phase shifter layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-01-16 | 1998-07-18 | 1999-01-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-01-16 | 2002-07-18 | 2003-01-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-01-16 | 2006-07-18 | 2007-01-17 | $7700.00 | Window Closed / Lapsed |