Claims Analysis
Total Claims: 28
Claim 1
Independent Claim
275 words
A semiconductor integrated circuit including a sequential circuit capable of operating synchronously with a clock signal comprising: a first storage circuit having a write state and hold state where input data supplied from a main data input terminal can be written and held is controlled in accordance with first and second control signals; a second storage circuit coupled between said first storage circuit and a data output terminal, having a write state and hold state in which output data from the first storage circuit can be written and held are controlled in accordance with a third control signal; and a bypass circuit connected to the main data input terminal and the data output terminal, in which data transfer time until the input data supplied from the main data input terminal reaches the data output terminal is shorter than time taken for the input data to pass through both the storage circuits, an output operation of the bypass circuit is inhibited according to states of the second and third control signals when the second and third control signals master/slave operate the first and second storage circuits, and the output operation of the bypass circuit to transfer data to the data output terminal is enabled according to the state of the third control signal when the second storage circuit is instructed to operate in a normal write state and according to the states of the first and second control signals for controlling the state where the input data sent from the main data input terminal is written in the first storage circuit; wherein the sequential circuit comprises the first storage circuit, second storage circuit, and bypass circuit.
Claim 2
Dependent Claim
275 words
A semiconductor integrated circuit including a sequential circuit capable of operating synchronously with a clock signal comprising: a first storage circuit having a write state and hold state where input data supplied from a main data input terminal can be written and held is controlled in accordance with first and second control signals; a second storage circuit coupled between said first storage circuit and a data output terminal, having a write state and hold state in which output data from the first storage circuit can be written and held are controlled in accordance with a third control signal; and a bypass circuit connected to the main data input terminal and the data output terminal, in which data transfer time until the input data supplied from the main data input terminal reaches the data output terminal is shorter than time taken for the input data to pass through both the storage circuits, an output operation of the bypass circuit is inhibited according to states of the second and third control signals when the second and third control signals master/slave operate the first and second storage circuits, and the output operation of the bypass circuit to transfer data to the data output terminal is enabled according to the state of the third control signal when the second storage circuit is instructed to operate in a normal write state and according to the states of the first and second control signals for controlling the state where the input data sent from the main data input terminal is written in the first storage circuit; wherein the sequential circuit comprises the first storage circuit, second storage circuit, and bypass circuit.
Claim 3
Dependent Claim
51 words
A semiconductor integrated circuit according to claim 1, wherein the write state and hold state of the first storage circuit, in which diagnostic data sent from a diagnostic data input terminal to the first storage circuit can be written and held, is further controlled in accordance with a fourth control signal.
Claim 4
Dependent Claim
24 words
A semiconductor integrated circuit according to claim 2 further includes a diagnostic data output terminal coupled to another output of the second storage circuit.
Claim 5
Dependent Claim
40 words
A semiconductor integrated circuit according to claim 3, wherein an output gate circuit to be cut-off-controlled according to an output-ready state of the bypass circuit is provided between the output of the second storage circuit and the data output terminal.
Claim 6
Dependent Claim
30 words
A semiconductor integrated circuit according to claim 4, wherein the bypass circuit is provided with a drive circuit for driving a load to be connected to the data output terminal.
Claim 7
Dependent Claim
64 words
A semiconductor integrated circuit according to claim 5, wherein the bypass circuit has means for forcing data to be outputted to the data output terminal into a predetermined logical value according to a fifth control signal, and the first storage circuit has means for forcing the data held by the first storage circuit into a predetermined logical value according to the fifth control signal.
Claim 8
Dependent Claim
19 words
A semiconductor integrated circuit according to claim 1, wherein the circuit is formed in one chip as a microcomputer.
Claim 9
Dependent Claim
192 words
A semiconductor integrated circuit having a circuit, including: a storage circuit coupled to said circuit; and a diagnostic control circuit coupled to said storage circuit for controlling said storage circuit, wherein said storage circuit comprises: a data input terminal and a data output terminal; a first storage circuit coupled to the data input terminal, including means for writing input data from the data input terminal into said first storage circuit in response to a first state of a signal, and means for holding the written input data in response to a second state of the signal; a second storage circuit coupled between an output of the first storage circuit and the data output terminal, and including means for writing and holding output data from the first storage circuit; and a bypass circuit, coupled between the data input terminal and the data output terminal, coupled to the diagnostic control circuit, and including a first function for transmitting data in accordance with the input data from the data input terminal to the data output terminal and a second function for inhibiting an execution of the first function if the diagnostic control circuit indicates diagnosis.
Claim 10
Dependent Claim
192 words
A semiconductor integrated circuit having a circuit, including: a storage circuit coupled to said circuit; and a diagnostic control circuit coupled to said storage circuit for controlling said storage circuit, wherein said storage circuit comprises: a data input terminal and a data output terminal; a first storage circuit coupled to the data input terminal, including means for writing input data from the data input terminal into said first storage circuit in response to a first state of a signal, and means for holding the written input data in response to a second state of the signal; a second storage circuit coupled between an output of the first storage circuit and the data output terminal, and including means for writing and holding output data from the first storage circuit; and a bypass circuit, coupled between the data input terminal and the data output terminal, coupled to the diagnostic control circuit, and including a first function for transmitting data in accordance with the input data from the data input terminal to the data output terminal and a second function for inhibiting an execution of the first function if the diagnostic control circuit indicates diagnosis.
Claim 11
Dependent Claim
31 words
The semiconductor integrated circuit according to claim 8, wherein said storage circuit further comprises a gate circuit coupled between the data output terminal and an output of the second storage circuit.
Claim 12
Dependent Claim
54 words
The semiconductor integrated circuit according to claim 8, wherein data transfer time which is required to transfer data in accordance with the input data from the data input terminal to the data output terminal is shorter than time taken for transmitting the data through both the first storage circuit and the second storage circuit.
Claim 13
Dependent Claim
63 words
The semiconductor integrated circuit according to claim 8, wherein said storage circuit further comprises a diagnostic input terminal coupled to the first storage circuit, and wherein the first storage circuit is coupled to the diagnostic control circuit and includes a means for writing and holding diagnostic data from the diagnostic input terminal in response to a diagnostic indication from the diagnostic control circuit.
Claim 14
Dependent Claim
53 words
The semiconductor integrated circuit according to claim 11, wherein said storage circuit further comprises a diagnostic output terminal coupled to the second storage circuit, and wherein the second storage circuit includes a means for outputting diagnostic data to the diagnostic output terminal in response to a diagnostic indication from the diagnostic control circuit.
Claim 15
Dependent Claim
26 words
The semiconductor integrated circuit according to claim 12, wherein said storage circuit further comprises diagnostic control terminals for receiving diagnostic indications from the diagnostic control circuit.
Claim 16
Dependent Claim
54 words
The semiconductor integrated circuit according to claim 13, wherein data transfer time which is required to transfer data in accordance with the input data from the data input terminal to the data output terminal is shorter than time taken for transmitting the data through both the first storage circuit and the second storage circuit.
Claim 17
Dependent Claim
30 words
The semiconductor integrated circuit according to claim 14, wherein said storage circuit comprises a gate circuit coupled between the data output terminal and an output of the second storage circuit.
Claim 18
Dependent Claim
51 words
The semiconductor integrated circuit according to claim 8, wherein said storage circuit further comprises a diagnostic output terminal coupled to the second storage circuit, the second storage circuit including a means for outputting diagnostic data to the diagnostic output terminal in response to a diagnostic indication from the diagnostic control circuit.
Claim 19
Dependent Claim
136 words
A semiconductor integrated circuit having a circuit, including: a storage circuit coupled to said circuit; and a diagnostic control circuit coupled to said storage circuit for controlling said storage circuit, wherein said storage circuit comprises: a data input terminal and a data output terminal; a master flip-flop circuit coupled to the data input terminal; a slave flip-flop circuit coupled between an output of the master flip-flop circuit and the data output terminal; and a bypass circuit, coupled between the data input terminal and the data output terminal, coupled to the diagnostic control circuit, and including a first function for transmitting data in accordance with the input data from the data input terminal to the data output terminal and a second function for inhibiting an execution of the first function if the diagnostic control circuit indicates diagnosis.
Claim 20
Dependent Claim
136 words
A semiconductor integrated circuit having a circuit, including: a storage circuit coupled to said circuit; and a diagnostic control circuit coupled to said storage circuit for controlling said storage circuit, wherein said storage circuit comprises: a data input terminal and a data output terminal; a master flip-flop circuit coupled to the data input terminal; a slave flip-flop circuit coupled between an output of the master flip-flop circuit and the data output terminal; and a bypass circuit, coupled between the data input terminal and the data output terminal, coupled to the diagnostic control circuit, and including a first function for transmitting data in accordance with the input data from the data input terminal to the data output terminal and a second function for inhibiting an execution of the first function if the diagnostic control circuit indicates diagnosis.
Claim 21
Dependent Claim
52 words
The semiconductor integrated circuit according to claim 17, wherein data transfer time required to transfer data in accordance with the input data from the data input terminal to the data output terminal is shorter than time taken for transmitting the data through both the master flip-flop circuit and the slave flip-flop circuit.
Claim 22
Dependent Claim
69 words
The semiconductor integrated circuit device according to claim 17 wherein said storage circuit further comprises a diagnostic input terminal coupled to the master flip-flop circuit, and wherein the master flip-flop circuit is coupled to the diagnostic control circuit and includes a means for writing and holding in the master flip-flop circuit diagnostic data from the diagnostic input terminal in response to a diagnostic indication from the diagnostic control circuit.
Claim 23
Dependent Claim
53 words
The semiconductor integrated circuit according to claim 19, wherein the storage circuit further comprises a diagnostic output terminal coupled to the slave flip-flop circuit, and wherein the slave flip-flop circuit includes a means for outputting diagnostic data to the diagnostic output terminal in response to a diagnostic indication from the diagnostic control circuit.
Claim 24
Dependent Claim
54 words
The semiconductor integrated circuit according to claim 19, wherein data transfer time which is required to transfer data in accordance with the input data from the data input terminal to the data output terminal is shorter than time taken for transmitting the data through both the master flip-flop circuit and the slave flip-flop circuit.
Claim 25
Dependent Claim
31 words
The semiconductor integrated circuit according to claim 21, wherein said storage circuit further comprises a gate circuit coupled between the data output terminal and the output of the slave flip-flop circuit.
Claim 26
Dependent Claim
53 words
The semiconductor integrated circuit according to claim 17, wherein said storage circuit further comprises a diagnostic output terminal coupled to the slave flip-flop circuit, and wherein the slave flip-flop circuit includes a means for outputting diagnostic data to the diagnostic output terminal in response to a diagnostic indication from the diagnostic control circuit.
Claim 27
Dependent Claim
22 words
The semiconductor integrated circuit device according to claim 14, wherein the semiconductor integrated circuit is formed in one chip as a microcomputer.
Claim 28
Dependent Claim
21 words
The semiconductor integrated circuit according to claim 21, wherein the semiconductor integrated circuit is formed in one chip as a microcomputer.