Patent US5376223A successfully refreshed from Google Patents.
US5376223A
Expired / Lapsed
US
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Plasma etch process
Assignee: Varian Semiconductor Equipment Associates Inc
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Filing: 1992-01-09
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Granted: 1994-12-27
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Expires: 2012-01-09
Abstract
Abstract Method employing low pressure plasma having high electron density for rapid oxide etching employing hydrogen and argon and specific electron clyclotron resonance (ECR) operating parameters in an ECR having a non-oxygen contributing environment in the reaction chamber.
Inventors
- 👤 Siamak Salimian
- 👤 Michelangelo Delfino
- 👤 Bu-Chin Chung
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 03:46
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/32; H01J37/32431; H01J37/32458; H01J37/32477; H01J37/32009; H01J37/32192; H01J37/3266; H01J37/32678; H10; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6302; H10P14/6316; H10P14/65; H10P14/6502; H10P14/6504; H10P14/6512; H10P14/6514; H10P14/69; H10P14/694; H10P14/6943; H10P14/69433; H10P50/00; H10P50/20; H10P50/28; H10P50/282; H10P50/283; H01J2237/00; H01J2237/32; H01J2237/33; H01J2237/334; H01J2237/3341; Y; Y10; Y10S; Y10S438/00; Y10S438/907; Y10S438/908
Claims Analysis
Total Claims: 19
Claim 1
Independent Claim
180 words
A method for operating an ECR apparatus for simultaneously passivating and etching a silicon substrate without employing high energy ion beam bombardment comprising: flowing gases consisting of H 2 and Ar into an evacuated plasma chamber of said etching apparatus containing a silicon substrate and selecting the flow rate of H 2 and Ar so that the concentration of H 2 is greater than the concentration of Ar; applying sufficient net microwave power level to excite electron cyclotron resonance of said gases in the plasma chamber to form a plasma therein, said power being at a value higher than the discontinuity region in the curve of O 2 removal rate versus power for the said plasma chamber; and setting the pressure of said plasma chamber substantially equal to a first pressure at which maximum concentration of excited hydrogen species will be evolved with the same net microwave power level applied to said gases in said plasma chamber, said first pressure being determined during a calibration experiment at a time prior to using said apparatus for said passivating and etching method.
Claim 2
Independent Claim
180 words
A method for operating an ECR apparatus for simultaneously passivating and etching a silicon substrate without employing high energy ion beam bombardment comprising: flowing gases consisting of H 2 and Ar into an evacuated plasma chamber of said etching apparatus containing a silicon substrate and selecting the flow rate of H 2 and Ar so that the concentration of H 2 is greater than the concentration of Ar; applying sufficient net microwave power level to excite electron cyclotron resonance of said gases in the plasma chamber to form a plasma therein, said power being at a value higher than the discontinuity region in the curve of O 2 removal rate versus power for the said plasma chamber; and setting the pressure of said plasma chamber substantially equal to a first pressure at which maximum concentration of excited hydrogen species will be evolved with the same net microwave power level applied to said gases in said plasma chamber, said first pressure being determined during a calibration experiment at a time prior to using said apparatus for said passivating and etching method.
Claim 3
Dependent Claim
16 words
The method of claim 1 wherein the net microwave power level is greater than 600 watts.
Claim 4
Dependent Claim
20 words
The method of claim 2 where said first pressure of said plasma chamber is in the region of 2.2 mtorr.
Claim 5
Dependent Claim
15 words
The method of claim 1 wherein the ratio of Argon/hydrogen flow rates is approximately 1:7.
Claim 6
Dependent Claim
34 words
The method of claim 1 including the step, prior to initiating a plasma in said ECR apparatus of passivating the interior of the ECR plasma chamber to preclude chamber contribution of oxygen during operation.
Claim 7
Dependent Claim
37 words
The method of claim 5 wherein the step of passivating to preclude oxygen includes the step of coating the microwave window of the chamber of said ECR apparatus with an etch resistant material which will pass microwaves.
Claim 8
Dependent Claim
28 words
The process of claim 1 wherein the H 2 plasma includes a small percentage of argon, said small percentage being approximately five (5) atomic percent of said plasma.
Claim 9
Dependent Claim
141 words
A new method for using an integrated cluster tool including an ECR apparatus for making Si 3 N 4 films on a silicon water comprising: cleaning the surface of said silicon water by placing said wafer to be nitrated in said ECR plasma generating apparatus employing an excited H 2 plasma; and passing said silicon wafer in vacuum after said cleaning to a vacuum isolated deposition apparatus where it is heated to a first temperature and exposed to NH 3 to promote nitridation; said cleaning step including operating said ECR at the pressure near which maximum excited hydrogen species are generated and a net power level great enough to excite electron cyclotron resonance, which power level is greater than the power level region at which the discontinuity in the oxygen removal rate versus net power occurs for the said ECR chamber.
Claim 10
Dependent Claim
141 words
A new method for using an integrated cluster tool including an ECR apparatus for making Si 3 N 4 films on a silicon water comprising: cleaning the surface of said silicon water by placing said wafer to be nitrated in said ECR plasma generating apparatus employing an excited H 2 plasma; and passing said silicon wafer in vacuum after said cleaning to a vacuum isolated deposition apparatus where it is heated to a first temperature and exposed to NH 3 to promote nitridation; said cleaning step including operating said ECR at the pressure near which maximum excited hydrogen species are generated and a net power level great enough to excite electron cyclotron resonance, which power level is greater than the power level region at which the discontinuity in the oxygen removal rate versus net power occurs for the said ECR chamber.
Claim 11
Dependent Claim
30 words
The process of claim 8 wherein said first temperature for nitridation is greater than 1000° C. and the time for exposure to said NH 3 is greater than 1 minute.
Claim 12
Dependent Claim
37 words
The process of claim 8 wherein the H 2 plasma includes a small percentage of argon, where said small percentage of argon is approximately five (5) atomic percent of the total number of atoms is said plasma.
Claim 13
Dependent Claim
34 words
The method of claim 8 including the step, prior to initiating a plasma in said ECR apparatus of passivating the interior of the ECR plasma chamber to preclude chamber contribution of oxygen during operation.
Claim 14
Dependent Claim
34 words
The method of claim 11 wherein the step of passivating includes the step of coating the microwave window of the chamber of said ECR apparatus with an etch resistant material which will pass microwaves.
Claim 15
Dependent Claim
155 words
A new method for using an integrated cluster tool including an ECR high electron density, low plasma sheath potential plasma generating apparatus for making Si 3 N 4 films on a silicon wafer comprising: cleaning the surface of said silicon wafer by placing said wafer to be nitrated in said plasma generating apparatus employing an excited H 2 plasma; and passing said silicon wafer in vacuum after said cleaning to a vacuum isolated deposition apparatus where it is heated to a first temperature and exposed to NH 3 to promote nitridation; said cleaning step including operating said plasma generating apparatus at the pressure near which maximum concentration of excited hydrogen species are generated and a net power level great enough to excite electron cyclotron resonance, which power level is greater than the power level at the region at which the discontinuity in the oxygen removal rate versus net power occurs for the said apparatus chamber.
Claim 16
Dependent Claim
155 words
A new method for using an integrated cluster tool including an ECR high electron density, low plasma sheath potential plasma generating apparatus for making Si 3 N 4 films on a silicon wafer comprising: cleaning the surface of said silicon wafer by placing said wafer to be nitrated in said plasma generating apparatus employing an excited H 2 plasma; and passing said silicon wafer in vacuum after said cleaning to a vacuum isolated deposition apparatus where it is heated to a first temperature and exposed to NH 3 to promote nitridation; said cleaning step including operating said plasma generating apparatus at the pressure near which maximum concentration of excited hydrogen species are generated and a net power level great enough to excite electron cyclotron resonance, which power level is greater than the power level at the region at which the discontinuity in the oxygen removal rate versus net power occurs for the said apparatus chamber.
Claim 17
Dependent Claim
29 words
The process of claim 13 wherein said temperature for nitridation is greater than 1000° C. and the time for exposure to said NH 3 is greater than 1 minute.
Claim 18
Dependent Claim
32 words
The method of claim 13 including the step, prior to initiating a plasma in said apparatus of passivating the interior of the plasma chamber to preclude chamber contribution of oxygen during operation.
Claim 19
Dependent Claim
33 words
The method of claim 15 wherein the step of passivating includes the step of coating the microwave window of the chamber of said apparatus with an etch resistant material which will pass microwaves.
References Cited (Backward Citations)
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| 7.5 Years (Year 8) | 2001-12-26 | 2002-06-27 | 2002-12-27 | $3760.00 | Window Closed / Lapsed |
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