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US5368915A Expired / Lapsed US ⏱️ 0.0 years remaining

Active matrix substrate

Assignee: Sharp Corp
•
Filing: 1992-02-18
•
Granted: 1994-11-29
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Expires: 2012-02-18
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Abstract

Abstract An active matrix substrate comprising storage capacitors each having an insulating film formed of a single perovskite oxide or a solid solution composed of a plurality of the perovskite oxides. Since the perovskite oxide has a significantly high relative dielectric constant, the area of storage capacitor can be reduced while keeping or increasing the capacitance thereof. Further, the insulating film can be thickened as far as the insulation property thereof is not affected without the capacitance thereof being reduced, thereby preventing leakage current.

Inventors

  • 👤 Tohru Ueda

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 05:02
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/682; G; G02; G02F; G02F1/00; G02F1/01; G02F1/13; G02F1/133; G02F1/136; G02F1/1362; G02F1/136213; H01; H01B; H01B3/00; H01B3/02; H01B3/12; H10D30/00; H10D30/60; H10D30/67; H10D30/6729; H10D30/6737; H10D30/6739; Y; Y10; Y10T; Y10T428/00; Y10T428/24; Y10T428/24802; Y10T428/24917; Y10T428/24926

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 107 words
An active matrix substrate comprising thin film transistors and storage capacitors arranged in a matrix, wherein each of the storage capacitors includes a pair of electrodes facing each other and an insulating film interposed therebetween, one of the pair of electrodes being connected to one of said thin film transistors, and wherein the insulating film is a perovskite oxide expressed by a formula ABO 3 where A is selected from a group of Sr, Ba, Pb, Ca, La and Nd, B is selected from a group of Ti, Zr, V. Bi, Co and Ir, and O is oxygen, and said insulating film is a thin film deposit.
Claim 2
Dependent Claim 107 words
An active matrix substrate comprising thin film transistors and storage capacitors arranged in a matrix, wherein each of the storage capacitors includes a pair of electrodes facing each other and an insulating film interposed therebetween, one of the pair of electrodes being connected to one of said thin film transistors, and wherein the insulating film is a perovskite oxide expressed by a formula ABO 3 where A is selected from a group of Sr, Ba, Pb, Ca, La and Nd, B is selected from a group of Ti, Zr, V. Bi, Co and Ir, and O is oxygen, and said insulating film is a thin film deposit.
Claim 3
Dependent Claim 23 words
An active matrix substrate according to claim 1, wherein the insulating film is formed by a radio-frequency magnetron sputtering, evaporation or CVD method.
Claim 4
Dependent Claim 26 words
An active matrix substrate according to claim 1, wherein one of the pair of electrodes is a pixel electrode and the other is a gate bus.
Claim 5
Dependent Claim 104 words
An active matrix substrate comprising thin film transistors and storage capacitors arranged in a matrix, wherein each of the storage capacitors includes a pair of electrodes facing each other and an insulating film interposed therebetween, one of the pair of electrodes being connected to one of said thin film transistors, and wherein the insulating film is a solid solution deposit composed of a perovskite oxide expressed by a formula ABO 3 where A is selected from a group of Sr, Ba, Pb, Ca, La and Nd, B is selected from a group of Ti, Zr, V, Bi, Co and Ir, and O is oxygen.
Claim 6
Dependent Claim 104 words
An active matrix substrate comprising thin film transistors and storage capacitors arranged in a matrix, wherein each of the storage capacitors includes a pair of electrodes facing each other and an insulating film interposed therebetween, one of the pair of electrodes being connected to one of said thin film transistors, and wherein the insulating film is a solid solution deposit composed of a perovskite oxide expressed by a formula ABO 3 where A is selected from a group of Sr, Ba, Pb, Ca, La and Nd, B is selected from a group of Ti, Zr, V, Bi, Co and Ir, and O is oxygen.
Claim 7
Dependent Claim 31 words
An active matrix substrate according to claim 4, wherein the solid solution is a composition expressed by a formula Ba.sub.(1-X) Sr X TiO 3 where X is 0.3 to 0.6 inclusive.
Claim 8
Dependent Claim 23 words
An active matrix substrate according to claim 4, wherein the insulating film is formed by a radio-frequency magnetron sputtering, evaporation or CVD method.
Claim 9
Dependent Claim 26 words
An active matrix substrate according to claim 4, wherein one of the pair of electrodes is a pixel electrode and the other is a gate bus.

References Cited (Backward Citations)

US3682766A Cited
US4260663A Cited
US4309295A Cited
US4367265A Cited
US4490429A Cited
JPS5935098A Cited
JPS6443235A Cited
US5139856A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-11-28 1998-05-30 1998-11-29 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-11-28 2002-05-30 2002-11-29 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-11-28 2006-05-30 2006-11-29 $7700.00 Window Closed / Lapsed

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