Image projection method and semiconductor device manufacturing method using the same

Claim 2

In an image projection method wherein a fine pattern having longitudinal and transverse patterns is illuminated and wherein diffraction light caused by the fine pattern is projected on a pupil of a projection optical system, for projection of an image of the fine pattern, the improvements residing in: that the fine pattern is illuminated with light which defines on the pupil an effective light source of ring-like shape having sides extending in directions of elongation of the longitudinal and transverse patterns, respectively, and having a substantially uniform intensity therewithin; that an inside peripheral configuration of the effective light source is mainly composed of sides extending in said directions, respectively; that the sides of the inside peripheral configuration of the effective light source comprise a first pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and in parallel to the transverse pattern, and a second pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and in parallel to the longitudinal pattern: that an outside peripheral configuration of the effective light source is mainly composed of sides extending in said directions, respectively; and that the sides of the outside peripheral configuration comprise a third pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and in parallel to the transverse pattern, and a fourth pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and in parallel to the longitudinal pattern.

Claim 3

A method according to claim 1, wherein the inside and outside peripheral configurations of the effective light source form an approximately rectangular shape.

Claim 4

A method according to claim 1, wherein the following relations are satisfied: 0.1≦R1≦0.65 0.25≦R2≦0.71 where the radius of the pupil is 1, R1 denotes the distance from the optical axis to the first and second pairs of sides and R2 denotes the distance from the optical axis to the third and fourth pairs of sides.

Claim 5

In a semiconductor device manufacturing method wherein a circuit pattern having longitudinal and transverse patterns is illuminated and wherein diffraction light caused by the circuit pattern is projected on a pupil of a projection optical system, for projection of an image of the circuit pattern on a wafer for transfer of the circuit pattern image to the wafer, the improvements residing in: that the circuit pattern is illuminated with light which defines on the pupil an effective light source of ring-like shape having sides extending in directions of elongation of the longitudinal and transverse patterns, respectively, and having a substantially uniform intensity therewithin; that an inside peripheral configuration of the effective light source is mainly composed of sides extending in said directions, respectively; that the sides of the inside peripheral configuration of the effective light source comprise a first pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and in parallel to the transverse pattern, and a second pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and in parallel to the longitudinal pattern; that an outside peripheral configuration of the effective light source is mainly composed of sides extending in said directions, respectively; and that the sides of the outside peripheral configuration comprise a third pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and in parallel to the transverse pattern, and a fourth pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and in parallel to the longitudinal pattern.

Claim 6

In a semiconductor device manufacturing method wherein a circuit pattern having longitudinal and transverse patterns is illuminated and wherein diffraction light caused by the circuit pattern is projected on a pupil of a projection optical system, for projection of an image of the circuit pattern on a wafer for transfer of the circuit pattern image to the wafer, the improvements residing in: that the circuit pattern is illuminated with light which defines on the pupil an effective light source of ring-like shape having sides extending in directions of elongation of the longitudinal and transverse patterns, respectively, and having a substantially uniform intensity therewithin; that an inside peripheral configuration of the effective light source is mainly composed of sides extending in said directions, respectively; that the sides of the inside peripheral configuration of the effective light source comprise a first pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and in parallel to the transverse pattern, and a second pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and in parallel to the longitudinal pattern; that an outside peripheral configuration of the effective light source is mainly composed of sides extending in said directions, respectively; and that the sides of the outside peripheral configuration comprise a third pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and in parallel to the transverse pattern, and a fourth pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and in parallel to the longitudinal pattern.

Claim 7

A method according to claim 4, wherein the inside and outside peripheral configurations of the effective light source form an approximately rectangular shape.

Claim 8

A method according to claim 4, wherein the following relations are satisfied: 0.1≦R1≦0.65 0.25≦R2≦0.71 where the radius of the pupil is 1, R1 denotes the distance from the optical axis to the first and second pairs of sides and R2 denotes the distance from the optical axis to the third and fourth pairs of sides.

Claim 9

In a semiconductor device manufacturing method wherein a circuit pattern having longitudinal and transverse pattern is illuminated and wherein diffraction light caused by the circuit pattern is projected on a pupil of a projection optical system for projection of an image of the circuit pattern on a wafer for transfer of the circuit pattern image to the wafer, the improvements residing in: that the circuit pattern is illuminated with light from a secondary light source of a predetermined shape so that zeroth order diffraction light and first order diffraction light caused by the longitudinal and transverse patterns of the circuit pattern are distributed along an approximately rectangular configuration defined about the center of the pupil.

Claim 10

In a semiconductor device manufacturing method wherein a circuit pattern having longitudinal and transverse pattern is illuminated and wherein diffraction light caused by the circuit pattern is projected on a pupil of a projection optical system for projection of an image of the circuit pattern on a wafer for transfer of the circuit pattern image to the wafer, the improvements residing in: that the circuit pattern is illuminated with light from a secondary light source of a predetermined shape so that zeroth order diffraction light and first order diffraction light caused by the longitudinal and transverse patterns of the circuit pattern are distributed along an approximately rectangular configuration defined about the center of the pupil.

Claim 11

A projection exposure apparatus comprising: means for illuminating a fine pattern having longitudinal and transverse patterns; and a projection optical system for projecting the illuminated fine pattern onto a substrate to be exposed, wherein the fine pattern is illuminated with light which defines on a pupil an effective light source of ring-like shape having sides extending in directions of elongation of the longitudinal and transverse patterns, respectively, and having a substantially uniform intensity therewithin, the inside peripheral configuration of the effective light source is mainly comprised of sides extending in said directions, respectively, the sides of the inside peripheral configuration of the effective light source comprise a first pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and parallel to the transverse pattern, and a second pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and parallel to the longitudinal pattern, the outside peripheral configuration of the effective light source is mainly comprised of sides extending in said directions, respectively, and the sides of the outside peripheral configuration comprise a third pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and parallel to the transverse pattern, and a fourth pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and parallel to the longitudinal pattern.

Claim 12

A projection exposure apparatus comprising: means for illuminating a fine pattern having longitudinal and transverse patterns; and a projection optical system for projecting the illuminated fine pattern onto a substrate to be exposed, wherein the fine pattern is illuminated with light which defines on a pupil an effective light source of ring-like shape having sides extending in directions of elongation of the longitudinal and transverse patterns, respectively, and having a substantially uniform intensity therewithin, the inside peripheral configuration of the effective light source is mainly comprised of sides extending in said directions, respectively, the sides of the inside peripheral configuration of the effective light source comprise a first pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and parallel to the transverse pattern, and a second pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and parallel to the longitudinal pattern, the outside peripheral configuration of the effective light source is mainly comprised of sides extending in said directions, respectively, and the sides of the outside peripheral configuration comprise a third pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and parallel to the transverse pattern, and a fourth pair of sides which are symmetrical with each other with respect to an axis extending through the center of the pupil and parallel to the longitudinal pattern.

Claim 13

An apparatus according to claim 8, wherein the inside and outside peripheral configurations of the effective light source form an approximately rectangular shape.

Claim 14

An apparatus according to claim 8, wherein the following relations are satisfied: 0.1≦R1≦0.65 0.25≦R2≦0.71 where the radius of the pupil is 1, R1 denotes the distance from the optical axis to the first and second pairs of sides and R2 denotes the distance from the optical axis to the third and fourth pairs of sides.