Integrated circuit device having macro isolation test function

Claim 2

An integrated circuit device having at least one previously designed macro cell (31, 41; 81, 82) having a library of a standard large scale function block, and an interface block (76, 96) composed of a plurality of cells (51, 52, 53; 91 1 . . . 91 5 ) each designed as a library of a standard function block for transferring signals between external terminals and an internal region of an integrated circuit, said macro cell comprising: switching means (32, 47, 48) for switching a mode between a normal mode and a test mode in response to an input signal applied thereto; a first group of terminals (N in , N io , N out ) associated with said macro cell, said first group of terminals being made to be valid in said normal mode, said first group of terminals transferring signals to and from internal circuits in said macro cell during said normal mode while selected by said switching means; a second group of terminals (T in , T io , T out ) associated with said macro cell, said switching means having access to select said second group of terminals to replace said first group of terminals, said second group of terminals being made valid in said test mode for transferring signals to and from said internal circuit during said test mode when said second group of terminals are selected by said switching means; and means for placing said second group of terminals in a high impedance state while said first group of terminals are valid during said normal mode.

Claim 3

An integrated circuit device having at least one previously designed macro cell (31, 41; 81, 82) having a library of a standard large scale function block, and an interface block (76; 96) comprised of a plurality of cells (51, 52, 53; 91 1 . . . 91 5 ),each of said plurality of cells being designed as a library of a standard function block for transferring signals between external terminals and an internal region of said integrated circuit, said interface block comprising: switching means (58, 59, 60; 59, 60) for switching a mode between a normal mode and a test mode in response to an input signal applied thereto; a first group of terminals (N in , N out ) which are made to be valid while switched into said normal mode, said first group of terminals transferring signals to and from internal circuits in said macro cell during said normal mode while selected by said switching means; and a second group of terminals (T in , T out ) which may be selected, in place of said first group of terminals, said switching means making said second group of terminals valid while said integrated circuit is in said test mode, for transferring signals to and from the internal circuit in said macro cell during said test mode selected by said switching means.

Claim 4

An integrated circuit device having at least one previously designed macro cell (31, 41; 81, 82) having a library of a standard large scale function block, and an interface block (76; 96) comprised of a plurality of cells (51, 52, 53; 91 1 . . . 91 5 ),each of said plurality of cells being designed as a library of a standard function block for transferring signals between external terminals and an internal region of said integrated circuit, said interface block comprising: switching means (58, 59, 60; 59, 60) for switching a mode between a normal mode and a test mode in response to an input signal applied thereto; a first group of terminals (N in , N out ) which are made to be valid while switched into said normal mode, said first group of terminals transferring signals to and from internal circuits in said macro cell during said normal mode while selected by said switching means; and a second group of terminals (T in , T out ) which may be selected, in place of said first group of terminals, said switching means making said second group of terminals valid while said integrated circuit is in said test mode, for transferring signals to and from the internal circuit in said macro cell during said test mode selected by said switching means.

Claim 5

An integrated circuit device having at least one predesigned macro cell (31, 41; 81, 82) having a library of a standard large scale function block (76, 96), and an interface block (76; 96) comprising a plurality of cells (51, 52, 53; 91 1 . . . 91 5 ) each designed as a library of a standard function block for transferring signals between external terminals (A, B, C, D, E) and an internal region of said integrated circuit, said macro cell comprising: macro cell switching means (32, 47, 48) for switching a mode between a normal mode and a test mode in response to an input signal applied thereto; a first group of terminals (N in N io , N out ) which are made to be valid when said switching means switches into said normal mode, for transferring signals to and from an internal circuit of a micro cell during said normal mode selected by said macro cell switching means; a second group of terminals (T in , T io , T out ) which are made valid in place of said first group of terminals when said switching means switches into said test mode, for transferring signals to and from the internal circuit of said micro cell during said test mode selected by said macro cell switching means; and means for placing said second group of terminals in a high impedance state during said normal mode, said interface block comprising: interface block switching means for switching a mode between said normal mode and said test mode in response to the input signal applied thereto; a third group of terminals (N in , N out ) which are made valid in said normal mode, for transferring signals to and from an interface block internal circuit during said normal mode selected by said interface block switching means; and a fourth group of terminals (T in , T out ) which are made valid in place of said third group of terminals when said interface block switching means switches into said test mode, for transferring signals to and from the internal circuits of said macro cell during said test mode selected by said interface block switching means, and said integrated circuit comprising means for permitting said macro cell to be directly tested through said external terminals of the integrated circuit by directly connecting said second group of terminals of said macro cell to said fourth group of terminals of said interface block.

Claim 6

An integrated circuit device having at least one predesigned macro cell (31, 41; 81, 82) having a library of a standard large scale function block (76, 96), and an interface block (76; 96) comprising a plurality of cells (51, 52, 53; 91 1 . . . 91 5 ) each designed as a library of a standard function block for transferring signals between external terminals (A, B, C, D, E) and an internal region of said integrated circuit, said macro cell comprising: macro cell switching means (32, 47, 48) for switching a mode between a normal mode and a test mode in response to an input signal applied thereto; a first group of terminals (N in N io , N out ) which are made to be valid when said switching means switches into said normal mode, for transferring signals to and from an internal circuit of a micro cell during said normal mode selected by said macro cell switching means; a second group of terminals (T in , T io , T out ) which are made valid in place of said first group of terminals when said switching means switches into said test mode, for transferring signals to and from the internal circuit of said micro cell during said test mode selected by said macro cell switching means; and means for placing said second group of terminals in a high impedance state during said normal mode, said interface block comprising: interface block switching means for switching a mode between said normal mode and said test mode in response to the input signal applied thereto; a third group of terminals (N in , N out ) which are made valid in said normal mode, for transferring signals to and from an interface block internal circuit during said normal mode selected by said interface block switching means; and a fourth group of terminals (T in , T out ) which are made valid in place of said third group of terminals when said interface block switching means switches into said test mode, for transferring signals to and from the internal circuits of said macro cell during said test mode selected by said interface block switching means, and said integrated circuit comprising means for permitting said macro cell to be directly tested through said external terminals of the integrated circuit by directly connecting said second group of terminals of said macro cell to said fourth group of terminals of said interface block.

Claim 7

An integrated circuit device according to claim 3, further comprising at least one user macro (6) composed of standard basic cells, said user macro having input and output terminals (in, io, out) connected with said first group of terminals of said macro cell and said third group of terminals of said interface block.

Claim 8

An integrated circuit device according to claim 3, wherein said second group of terminals of said macro cell includes terminals (T in3 , T out3 ) individually dedicated to input and output.

Claim 9

An integrated circuit device according to claim 3, wherein each of cells of said interface block includes the second group of terminals (T in1 , T out1 ) individually dedicated to input and output.