← Back to Patent Explorer
US5359767A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of making multilayered circuit board

Assignee: International Business Machines Corp
•
Filing: 1993-08-26
•
Granted: 1994-11-01
•
Expires: 2013-08-26
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A method of making a multilayered circuit board wherein at least two layered subassemblies, each comprising a dielectric layer and at least one conductive layer therein, are bonded together. Each subassembly includes a through-hole extending therethrough which is aligned with a respective through-hole of the other prior to bonding. The subassemblies are compressed at a predetermined pressure (e.g., 300 psi) and then heated to a first temperature (e.g., 300° C.) for an established time period, resulting in formation of a bond between the two through-holes. The resulting alloy formed from this bond possesses a melting point significantly greater than that of the subassembly dielectric (e.g., PTFE). Following this time period, the compressed subassemblies are heated to an even greater temperature (e.g., 380° C.), again for an established time period, to assure dielectric flow. The subassembly is then cooled and the pressure removed. The method possesses two significant features: (1) effective engagement between respective pairs of through-holes in the compressed subassemblies; and (2) prevention of dielectric incursion within the bond formed between the respective pairs of through-holes, which incursion could adversely affect the electrical connection therebetween.

Inventors

  • 👤 William T. Chen
  • 👤 Thomas P. Gall
  • 👤 James R. Wilcox
  • 👤 Tien Y. Wu

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 07:18
CPC Classifications
H; H05; H05K; H05K3/00; H05K3/46; H05K3/4611; H05K3/4626; H05K3/4632; H05K3/4614; H05K3/462; H05K2201/00; H05K2201/01; H05K2201/0104; H05K2201/0129; H05K2201/0137; H05K2201/015; H05K2201/09; H05K2201/09209; H05K2201/095; H05K2201/09536; H05K2201/096; H05K3/30; H05K3/32; H05K3/328; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/49126; Y10T29/49155; Y10T29/49165

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 188 words
A method of making a multilayered circuit board assembly including at least two layered subassemblies each including at least one dielectric layer, electrically conductive wiring in the form of at least one conductive layer and at least one conductive through-hole therein, said method comprising the steps of: aligning said layered subassemblies relative to one another such that at least a first of said conductive through-holes of one layered subassembly is aligned with and engages a second conductive through-hole in a second layered subassembly, said first and second conductive through-holes each of a first height and including a layer of first metal thereon, said second conductive through-hole further including a layer of second metal thereon; subjecting said aligned and engaged layered subassemblies to a predetermined pressure sufficient to cause at least partial reduction of said first height of said first and second engaged conductive through-holes; heating said layered subassemblies having said through-holes having said reduction of said first height to a pre-established temperature for a predetermined time period sufficient to form a metallurgical bond between said first and second metals of said conductive through-holes; and cooling said layered subassemblies.
Claim 2
Independent Claim 188 words
A method of making a multilayered circuit board assembly including at least two layered subassemblies each including at least one dielectric layer, electrically conductive wiring in the form of at least one conductive layer and at least one conductive through-hole therein, said method comprising the steps of: aligning said layered subassemblies relative to one another such that at least a first of said conductive through-holes of one layered subassembly is aligned with and engages a second conductive through-hole in a second layered subassembly, said first and second conductive through-holes each of a first height and including a layer of first metal thereon, said second conductive through-hole further including a layer of second metal thereon; subjecting said aligned and engaged layered subassemblies to a predetermined pressure sufficient to cause at least partial reduction of said first height of said first and second engaged conductive through-holes; heating said layered subassemblies having said through-holes having said reduction of said first height to a pre-established temperature for a predetermined time period sufficient to form a metallurgical bond between said first and second metals of said conductive through-holes; and cooling said layered subassemblies.
Claim 3
Dependent Claim 48 words
The method of claim 1 wherein said pre-established temperature is within the range of from about 280° C. to about 320° C., said predetermined time period is from about 20 minutes to about 80 minutes, and said predetermined pressure is from about 200 PSI to about 400 PSI.
Claim 4
Dependent Claim 19 words
The method of claim 2 wherein said cooling occurs while said layered subassemblies are engaged at said predetermined pressure.
Claim 5
Dependent Claim 14 words
The method of claim 3 wherein said cooling is accomplished at an established rate.
Claim 6
Dependent Claim 17 words
The method of claim 1 wherein said first and second layered subassemblies are engaged at room temperature.
Claim 7
Dependent Claim 79 words
The method of claim 1 wherein said metallurgical bond comprises an alloy of said first and second metals having a melting point substantially greater than the melting point of the dielectric materials of said dielectric layers in said layered subassemblies, said method further comprising the step of heating said layered subassemblies after said predetermined time period and prior to said cooling to an elevated temperature greater than said pre-established temperature but less than said melting point of said alloy.
Claim 8
Dependent Claim 27 words
The method of claim 6 wherein said heating of said layered subassemblies to said elevated temperature occurs while said layered subassemblies are engaged at said predetermined pressure.
Claim 9
Dependent Claim 30 words
The method of claim 6 wherein said elevated temperature is sufficient to cause said dielectric materials to at least partially melt in the regions immediately surrounding said engaged conductive through-holes.
Claim 10
Dependent Claim 52 words
The method of claim 6 wherein said pre-established temperature is within the range of from about 280° C. to about 320° C., said predetermined time period is from about 20 minutes to about 80 minutes, and said elevated temperature is within the range of from about 330° C. to about 390° C.
Claim 11
Dependent Claim 22 words
The method of claim 6 wherein said predetermined pressure is within the range of from about 200 PSI to about 400 PSI.
Claim 12
Dependent Claim 19 words
The method of claim 6 wherein said cooling occurs while said layered subassemblies are engaged at said predetermined pressure.
Claim 13
Dependent Claim 14 words
The method of claim 11 wherein said cooling is accomplished at an established rate.
Claim 14
Dependent Claim 29 words
The method of claim 1 wherein said partial reduction of said first height of said through-holes is within the range of from about ten percent to about twenty percent.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-10-31 1998-05-02 1998-11-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-10-31 2002-05-02 2002-11-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-10-31 2006-05-02 2006-11-01 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag