← Back to Patent Explorer
US5358897A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of manufacturing radiation-emitting semiconductor devices

Assignee: Viavi Solutions Inc
•
Filing: 1993-12-17
•
Granted: 1994-10-25
•
Expires: 2013-12-17
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract Radiation-emitting semiconductor diodes in the form of diode lasers or LEDs are used inter alia in information processing systems. There is a particular demand for diodes having a low wavelength. A diode laser which emits at 633 nm is a particularly attractive alternative to a helium-neon gas laser. According to the invention, a method of making a the buffer layer of such a radiation-emitting semiconductor diode comprises aluminium-gallium arsenide, the aluminium content having at least a minimum value belonging to the band gap of the active layer. The minimum Al content is approximately 6 at % for an InGaP band gap of 1.88 eV, and approximately 9 at % for 1.92 eV. As a result, an active layer comprising InGaP emits, for example, at 650 nm while the semiconductor layers still possess a good crystal quality and morphology. When the active layer of a diode laser has a multiple quantum well structure with comparatively thick (approximately 5 nm) well layers, it even emits at 633 nm. In this method according to the invention, a comparatively high growing temperature-preferably approximately 760 DEG C.-and a buffer layer comprising AlGaAs with a suitable aluminium content are used. Ordering of the structure in semiconductor layers comprising InGaP and InAlGaP is counteracted by this.

Inventors

  • 👤 Adriaan Valster
  • 👤 Coen T. H. F. Liedenbaum

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 16:19
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/80; H10H20/81; H10H20/822; H10H20/824; B; B82; B82Y; B82Y20/00; H01; H01S; H01S5/00; H01S5/30; H01S5/32; H01S5/323; H01S5/32308; H01S5/32325; H01S5/34; H01S5/343; H01S5/34326; H10H20/01; H10H20/011; H10H20/013; H10H20/811; H10H20/812; H01S5/20; H01S5/22; H01S5/3211

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 124 words
A method of manufacturing a radiation-emitting semiconductor diode comprising the steps, whereby at least a first cladding layer of indium-aluminium-gallium phosphide and of a first conductivity type, an active layer of indium-gallium phosphide, and a second cladding layer of indium-aluminium-gallium phosphide and of a second conductivity type are provided in that order on a semiconductor substrate of gallium arsenide and of the first conductivity type, a buffer layer being provided before the application of the first cladding layer, characterized in that the semiconductor material chosen for the buffer layer is aluminium-gallium arsenide with an aluminium content which is at least equal to a minimum value belonging to the band gap of the active layer, while a growing temperature is chosen higher than 700° C.
Claim 2
Independent Claim 124 words
A method of manufacturing a radiation-emitting semiconductor diode comprising the steps, whereby at least a first cladding layer of indium-aluminium-gallium phosphide and of a first conductivity type, an active layer of indium-gallium phosphide, and a second cladding layer of indium-aluminium-gallium phosphide and of a second conductivity type are provided in that order on a semiconductor substrate of gallium arsenide and of the first conductivity type, a buffer layer being provided before the application of the first cladding layer, characterized in that the semiconductor material chosen for the buffer layer is aluminium-gallium arsenide with an aluminium content which is at least equal to a minimum value belonging to the band gap of the active layer, while a growing temperature is chosen higher than 700° C.
Claim 3
Dependent Claim 38 words
A method as claimed in claim 1, characterized in that a growing temperature of at least approximately 730° C. is chosen and an aluminium content for the buffer layer of at least approximately 6 atom percents is chosen.
Claim 4
Dependent Claim 38 words
A method as claimed in claim 2, characterized in that a growing temperature of at least approximately 760° C. is chosen and an aluminium content for the buffer layer of at least approximately 9 atom percents is chosen.
Claim 5
Dependent Claim 59 words
A method as claimed in claim 3, in which the technique chosen for providing the layers on the substrate is the MOVPE technique, characterized in that the substrate chosen is a (001) substrate, the growing temperature chosen is a growing temperature of approximately 760° C., and the V/III ratio chosen is one which lies between approximately 100 and 400.
Claim 6
Dependent Claim 38 words
A method as claimed in claim 1, characterized in that a growing temperature of at least approximately 760° C. is chosen and an aluminum content for the buffer layer of at least approximately 9 atom percent is chosen.
Claim 7
Dependent Claim 59 words
A method as claimed in claim 1, in which the technique chosen for providing the layers on the substrate is the MOVPE technique, characterized in that the substrate chosen is a (001) substrate, the growing temperature chosen is a growing temperature of approximately 760° C., and the V/III ratio chosen is one which lies between approximately 100 and 400.

References Cited (Backward Citations)

US4585491A Cited
US5060236A Cited
US5036521A Cited
US5003549A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-10-24 1998-04-25 1998-10-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-10-24 2002-04-25 2002-10-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-10-24 2006-04-25 2006-10-25 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag