US5346581A
Expired / Lapsed
US
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Method of making a compound semiconductor device
Assignee: Nokia Bell Labs
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Filing: 1993-04-01
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Granted: 1994-09-13
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Expires: 2013-04-01
Abstract
Abstract In a preferred embodiment, the disclosed method of making a compound semiconductor (e.g., InP, GaAs) device comprises etching of a semiconductor body by exposure of the body to a chemical beam or beams that comprise an etching medium (e.g., PCl 3 , AsCl 3 ) and a precursor chemical (e.g., trimethylindium, trimethylgallium), followed by chemical beam epitaxy (CBE) growth of semiconductor material on the etched surface without exposure of the semiconductor body to the ambient atmosphere. Presence of the precursor chemical in the etching beam can result in significantly improved surface morphology, with attendant high quality re-growth. Multiple etching/growth sequences are facilitated by the almost instantaneous (e.g., about 1s) switching between the etching and growth modes that is possible in a reactor according to the invention.
Inventors
- 👤 Won-Tien Tsang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 21:35
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/29; H10P14/2901; H10P14/2907; H10P14/2909; H10P14/24; H10P14/32; H10P14/3202; H10P14/3214; H10P14/3218; H10P14/3221; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3418; H10P14/3421; H10P50/00; H10P50/20; H10P50/24; H10P50/246; Y; Y10; Y10S; Y10S438/00; Y10S438/913; Y10S438/942; Y10S438/944
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
143 words
In a method of making a semiconductor device comprising a) providing a semiconductor body that comprises III/V semiconductor material; b) removing at least a portion of said III/V semiconductor material by a process that comprises contacting at least a part of said III/V semiconductor material with a gaseous etching medium such that an etched semiconductor surface results; and the improvement comprising the method further comprises c) carrying out step b) in a reactor chamber with less than 10 -2 Torr background pressure, the reactor chamber comprising means adapted for simultaneously exposing said III/V semiconductor material to a beam or beams of said gaseous etching medium and a III/V semiconductor precursor chemical, and the III/V semiconductor material is exposed, during at least a part of the removing step, to a beam or beams of said gaseous etching medium and the III/V semiconductor precursor chemical.
Claim 2
Dependent Claim
143 words
In a method of making a semiconductor device comprising a) providing a semiconductor body that comprises III/V semiconductor material; b) removing at least a portion of said III/V semiconductor material by a process that comprises contacting at least a part of said III/V semiconductor material with a gaseous etching medium such that an etched semiconductor surface results; and the improvement comprising the method further comprises c) carrying out step b) in a reactor chamber with less than 10 -2 Torr background pressure, the reactor chamber comprising means adapted for simultaneously exposing said III/V semiconductor material to a beam or beams of said gaseous etching medium and a III/V semiconductor precursor chemical, and the III/V semiconductor material is exposed, during at least a part of the removing step, to a beam or beams of said gaseous etching medium and the III/V semiconductor precursor chemical.
Claim 3
Dependent Claim
59 words
Method according to claim 1, wherein step c) comprises growing, in said reactor chamber and without exposing said etched semiconductor surface to the ambient atmosphere, epitaxial III/V semiconductor material on at least some of said etched semiconductor surface by a process that comprises exposing said etched surface to a beam or beams that comprise said III/V semiconductor precursor chemical.
Claim 4
Dependent Claim
27 words
Method according to claim 1, wherein said III/V semiconductor precursor chemical is a compound that comprises an element selected from the group consisting of In and Ga.
Claim 5
Dependent Claim
25 words
Method according to claim 1, wherein during at least part of step b) the semiconductor body is at a temperature of at least 450° C.
Claim 6
Dependent Claim
23 words
Method according to claim 1, wherein the III/V semiconductor precursor chemical is selected from the group consisting of triethylindium, trimethylindium, triethylgallium and trimethylgallium.
Claim 7
Dependent Claim
27 words
Method according to claim 1, wherein the gaseous etching medium is selected from the group consisting of Pcl 3 , AsCl 3 , carbon tetrachloride and trichlorethane.
Claim 8
Dependent Claim
11 words
Method according to claim 1, wherein the device is a laser.
Claim 9
Dependent Claim
13 words
Method according to claim 1, wherein the device is a heterojunction bipolar transistor.
Claim 10
Dependent Claim
26 words
Method according to claim 2, comprising maintaining a shadow mask in contact with said etched semiconductor surface, such that patterned growth of III/V semiconductor material occurs.
Claim 11
Dependent Claim
25 words
Method according to claim 1, comprising maintaining a shadow mask in contact with said semiconductor body, such that patterned removal of III/V semiconductor material occurs.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1997-09-12 | 1998-03-14 | 1998-09-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-09-12 | 2002-03-14 | 2002-09-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-09-12 | 2006-03-14 | 2006-09-13 | $7700.00 | Window Closed / Lapsed |