US5344525A
Expired / Lapsed
US
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Process for etching semiconductor devices
Assignee: Micron Technology Inc
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Filing: 1992-12-23
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Granted: 1994-09-06
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Expires: 2012-12-23
Abstract
Abstract A process for etching a semiconductor device having a plurality of layers to form a predetermined etched pattern therein is provided. At least one of the layers of the semiconductor device comprise a layer formed of a low reactivity material. A low reactivity material is one which, when chemically reacted with an chemical etchant material, typically in gas phase, at a temperature of up to about 200 degrees C., does not form a substantial amount of volatile by-products from the chemical reaction. The temperature of the low reactivity material layer is therefore elevated, generally in a controllable and uniform manner, to a level which, upon reaction with the chemical etchant material in gas phase, will form a substantial amount of volatile gaseous by-products from the chemical reaction. Then, the semiconductor device is etched with an etchant material to form a predetermined pattern therein. In this way, the chemical etching reaction produces a substantial amount of volatile gaseous by-products. Since a substantial amount of volatile gaseous by-products is formed, the gaseous material can be readily removed from the etching area.
Inventors
- 👤 David A. Cathey, Jr.
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 09:02
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267
Claims Analysis
Total Claims: 25
Claim 1
Independent Claim
201 words
A process for etching a semiconductor device to form an etched pattern therein, comprising: providing in a etching area, a semiconductor device having a plurality of layers, at least one of said layers of said semiconductor device comprising a layer formed of a first material which, when chemically reacted with a chemical etchant in gas phase, at a temperature of up to about 200 degrees C., forms nonvolatile by-products from said chemical reaction, the presence of said nonvolatile gaseous by-products inhibiting the etching of the semiconductor device; elevating the temperature of each said layer of said first material to a level which, upon reaction with said chemical etchant, forms volatile gaseous by-products from said chemical reaction; anisotropically etching said semiconductor device with said chemical etchant, at said elevated temperature, to form a pattern therein, said etching of said semiconductor device producing said volatile gaseous by-products and said nonvolatile gaseous by-products which does not inhibit the effective etching of said semiconductor device; removing said gaseous volatile by-products from said etching area; and providing a foraminous member for supporting said semiconductor device within said etching work area, said foraminous member being unreactive with said semiconductor device and remaining intact at said elevated temperature.
Claim 2
Dependent Claim
201 words
A process for etching a semiconductor device to form an etched pattern therein, comprising: providing in a etching area, a semiconductor device having a plurality of layers, at least one of said layers of said semiconductor device comprising a layer formed of a first material which, when chemically reacted with a chemical etchant in gas phase, at a temperature of up to about 200 degrees C., forms nonvolatile by-products from said chemical reaction, the presence of said nonvolatile gaseous by-products inhibiting the etching of the semiconductor device; elevating the temperature of each said layer of said first material to a level which, upon reaction with said chemical etchant, forms volatile gaseous by-products from said chemical reaction; anisotropically etching said semiconductor device with said chemical etchant, at said elevated temperature, to form a pattern therein, said etching of said semiconductor device producing said volatile gaseous by-products and said nonvolatile gaseous by-products which does not inhibit the effective etching of said semiconductor device; removing said gaseous volatile by-products from said etching area; and providing a foraminous member for supporting said semiconductor device within said etching work area, said foraminous member being unreactive with said semiconductor device and remaining intact at said elevated temperature.
Claim 3
Dependent Claim
12 words
The process of claim 1, wherein said first material comprises a metal.
Claim 4
Dependent Claim
17 words
The process of claim 2, wherein said elevated temperature is in the range of 300 degrees C.
Claim 5
Dependent Claim
11 words
The process of claim 2, wherein said metal-containing material comprises copper.
Claim 6
Dependent Claim
60 words
The process of claim 1, which further includes the step of providing means located below said foraminous member for elevating the temperature of said semiconductor device; positioning said semiconductor device on said foraminous member; and elevating the temperature of said semiconductor device by introducing heat through said foraminous member from said means for elevating the temperature of said semiconductor device.
Claim 7
Dependent Claim
33 words
The process of claim 1, which further includes the step of positioning said semiconductor device in an etching work area, and elevating the temperature of said semiconductor device by heating the underside thereof.
Claim 8
Dependent Claim
40 words
The process of claim 1, which further includes the step of applying at least one of RF power and electrical bias to the semiconductor device while elevating the temperature of each layer of said first material in said semiconductor device.
Claim 9
Dependent Claim
40 words
The process of claim 1, wherein said anisotropic etching includes the use of electro cyclotron resonance, magnetically confined reactor, magnetron dry etcher, plasma etching, reactive ion etching, point plasma etching, or magnetically confined plasma etch patterning of the semiconductor device.
Claim 10
Dependent Claim
29 words
The process of claim 1, which further includes means connected to said foraminous member for applying at least one of RF power and electrical bias to said foraminous member.
Claim 11
Dependent Claim
26 words
The process of claim 1, wherein said foraminous member comprises a plasma electrode defining at least one opening for introducing said heat through said foraminous member.
Claim 12
Dependent Claim
17 words
The process of claim 1, wherein said foraminous member comprises a mesh or grid-like plasma electrode plate.
Claim 13
Dependent Claim
168 words
A process for etching a semiconductor device to form a etched pattern therein, comprising: providing an etching area and a foraminous member located within said etching area for supporting said semiconductor device; supporting said semiconductor device on said foraminous member, said semiconductor device having a plurality of layers at least one of said layers comprising a layer formed of a first material which does not form volatile gaseous by-products by a chemical reaction; elevating the temperature of each said layers formed of a first material, to a level which, upon reaction with said chemical etchant material in a gas phase which emits volatile gaseous by-products from said chemical reaction by introducing heat through said foraminous member to said semiconductor device; anisotropically etching said semiconductor device with said etchant material to form a pattern therein, said non-reactive layer undergoing said chemical reaction thereby producing volatile gaseous by-products; and removing said volatile gaseous by-products from said etching area; said first material comprises a metal; and said metal-containing material comprises copper.
Claim 14
Dependent Claim
168 words
A process for etching a semiconductor device to form a etched pattern therein, comprising: providing an etching area and a foraminous member located within said etching area for supporting said semiconductor device; supporting said semiconductor device on said foraminous member, said semiconductor device having a plurality of layers at least one of said layers comprising a layer formed of a first material which does not form volatile gaseous by-products by a chemical reaction; elevating the temperature of each said layers formed of a first material, to a level which, upon reaction with said chemical etchant material in a gas phase which emits volatile gaseous by-products from said chemical reaction by introducing heat through said foraminous member to said semiconductor device; anisotropically etching said semiconductor device with said etchant material to form a pattern therein, said non-reactive layer undergoing said chemical reaction thereby producing volatile gaseous by-products; and removing said volatile gaseous by-products from said etching area; said first material comprises a metal; and said metal-containing material comprises copper.
Claim 15
Dependent Claim
15 words
The process of claim 12, wherein said elevated temperature is at least 300 degrees C.
Claim 16
Dependent Claim
39 words
The process of claim 12, wherein said anisotropic etching includes the use of magnetically confined reactor, magnetron dry etcher, electron cyclotron resonance, plasma etching, reactive ion, point plasma etching, or magnetically confined plasma etch patterning of the semiconductor device.
Claim 17
Dependent Claim
29 words
The process of claim 12, which further includes means connected to said foraminous member for applying at least one of RF power and electrical bias to said foraminous member.
Claim 18
Dependent Claim
23 words
The process of claim 12, wherein said elevation of the temperature of said semiconductor device comprises heating one side of said semiconductor device.
Claim 19
Dependent Claim
41 words
The process of claim 12, which further includes means for positioning said semiconductors device in an etching work area and wherein said means for elevating the temperature of said semiconductor device comprise means for heating the underside of said semiconductor device.
Claim 20
Dependent Claim
22 words
The process of claim 12, wherein said means for supporting said semiconductor device within said etching work area comprises a foraminous member.
Claim 21
Dependent Claim
53 words
The process of claim 18, wherein said foraminous member is located above said means for elevating the temperature of said semiconductor device, and the temperature of said semiconductor device is elevated by introducing heat from said means for elevating the temperature of said semiconductor device through said foraminous member to said semiconductor device.
Claim 22
Dependent Claim
26 words
The process of claim 18, wherein said foraminous member comprises a plasma electrode defining at least one opening for introducing said heat through said foraminous member.
Claim 23
Dependent Claim
17 words
The process of claim 12, wherein said foraminous member comprises a mesh or grid-like plasma electrode plate.
Claim 24
Dependent Claim
40 words
The process of claim 12, which further includes the step of applying at least one of RF power and electrical bias to the semiconductor device while elevating the temperature of each layer of said first material in said semiconductor devices.
Claim 25
Dependent Claim
23 words
The process of claim 1, wherein said elevation of the temperature of said semiconductor device comprises heating one side of said semiconductor device.
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