US4931410A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process for producing semiconductor integrated circuit device having copper interconnections and/or wirings, and device produced
Assignee: Hitachi Ltd
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Filing: 1988-08-25
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Granted: 1990-06-05
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Expires: 2008-08-25
Abstract
Abstract Disclosed is a process for forming a patterned copper layer on a substrate, using a patterned photoresist layer for forming the patterned copper layer. Etching mask and anti-oxidizing layers are formed on a copper layer (from which the patterned copper layer is formed) prior to forming the patterned photoresist layer. The uppermost one of the etching mask and anti-oxidizing layers is etched using the patterned photoresist layer as a mask, and then the patterned photoresist layer is removed, by oxygen plasma treatment, with the copper layer covered by the lower one of the etching mask and anti-oxidizing layers. By removing the patterned photoresist layer, by oxygen plasma treatment, while the copper layer is covered, oxidation of the copper layer during the oxygen plasma treatment can be avoided. The patterned copper layer can be an interconnection or wiring of a semiconductor device, formed on a semiconductor substrate having semiconductor elements therein. Also disclosed is the product formed by this method, such product including at least a residue of the etching mask layer in addition to the anti-oxidizing layer.
Inventors
- 👤 Takafumi Tokunaga
- 👤 Masatoshi Tsuneoka
- 👤 Koichiro Mizukami
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 19:52
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267; H10P50/71; H10W; H10W20/00; H10W20/01; H10W20/40; H10W20/41; H10W20/425; Y; Y10; Y10S; Y10S438/00; Y10S438/942; Y10S438/945; Y10S438/948; Y10S438/95
Claims Analysis
Total Claims: 43
Claim 1
Independent Claim
147 words
A process for producing a patterned copper layer, comprising the steps of: (a) forming etching mask and anti-oxidizing layers on a copper layer, such that the anti-oxidizing layer is provided on the copper layer and the etching mask layer is provided on the anti-oxidizing layer; (b) forming a patterned photoresist layer on said etching mask layer; (c) etching the etching mask layer using the patterned photoresist layer as a mask, so as to form an etched etching mask layer; (d) removing the patterned photoresist layer, the copper layer being covered with the anti-oxidizing layer during removal of the patterned photoresist layer; (e) after removing the patterned photoresist layer, etching the anti-oxidizing layer using the etched mask layer as a mask, so as to expose portions of the copper layer; and (f) etching the exposed portions of the copper layer so as to form the patterned copper layer.
Claim 2
Dependent Claim
147 words
A process for producing a patterned copper layer, comprising the steps of: (a) forming etching mask and anti-oxidizing layers on a copper layer, such that the anti-oxidizing layer is provided on the copper layer and the etching mask layer is provided on the anti-oxidizing layer; (b) forming a patterned photoresist layer on said etching mask layer; (c) etching the etching mask layer using the patterned photoresist layer as a mask, so as to form an etched etching mask layer; (d) removing the patterned photoresist layer, the copper layer being covered with the anti-oxidizing layer during removal of the patterned photoresist layer; (e) after removing the patterned photoresist layer, etching the anti-oxidizing layer using the etched mask layer as a mask, so as to expose portions of the copper layer; and (f) etching the exposed portions of the copper layer so as to form the patterned copper layer.
Claim 3
Dependent Claim
18 words
A process according to claim 1, wherein the patterned photoresist layer is removed by an oxygen plasma treatment.
Claim 4
Dependent Claim
50 words
A process according to claim 1, wherein the anti-oxidizing layer is made of a material preventing migration of copper of the copper layer into the etching mask layer, such that the anti-oxidizing layer acts as a barrier to migration of copper from the copper layer into the etching mask layer.
Claim 5
Dependent Claim
15 words
. A process according to claim 3, wherein the anti-oxidizing layer is formed of TiN.
Claim 6
Dependent Claim
15 words
A process according to claim 4, wherein the etching mask layer is formed of Al.
Claim 7
Dependent Claim
14 words
A process according to claim 1, wherein the anti-oxidizing layer is formed of TiN.
Claim 8
Dependent Claim
57 words
A process according to claim 1, wherein the copper layer is provided over a substrate, the substrate is made of a material into which copper of the copper layer can migrate, and wherein a barrier layer is provided between the substrate and the copper layer to prevent migration of copper from the copper layer into the substrate.
Claim 9
Dependent Claim
14 words
A process according to claim 7, wherein said barrier layer is formed of TiN.
Claim 10
Dependent Claim
27 words
A process according to claim 7, wherein said substrate is a semiconductor substrate having an insulating layer thereon, the copper layer being provided on the insulating layer.
Claim 11
Dependent Claim
42 words
A process according to claim 9, wherein the semiconductor substrate has semiconductor elements formed therein, whereby an integrated circuit device is provided, the patterned copper layer constituting at least one of a wiring layer and an interconnection of said integrated circuit device.
Claim 12
Dependent Claim
20 words
A process according to claim 10, wherein the exposed portions of the copper layer are etched by reactive ion etching.
Claim 13
Dependent Claim
20 words
A process according to claim 11, wherein the reactive ion etching is performed at a temperature of 200° C.-500° C.
Claim 14
Dependent Claim
18 words
A process according to claim 12, wherein the reactive ion etching is performed using a chlorine etching gas.
Claim 15
Dependent Claim
21 words
A process according to claim 13, wherein the etching of the etching mask layer is performed using a chlorine etching gas.
Claim 16
Dependent Claim
20 words
A process according to claim 14 wherein the etching of the anti-oxidizing layer is performed using a fluorine etching gas.
Claim 17
Dependent Claim
27 words
A process according to claim 10, wherein the semiconductor elements in the semiconductor substrate include a bipolar transistor, whereby an integrated circuit bipolar transistor device is formed.
Claim 18
Dependent Claim
35 words
A process according to claim 10, wherein said copper layer is the fourth copper layer over the semiconductor substrate, the first three copper layers constituting respective interconnection or wiring layers of the integrated circuit device.
Claim 19
Dependent Claim
17 words
A process according to claim 17, wherein a solder bump is formed on the fourth copper layer.
Claim 20
Dependent Claim
26 words
A process according to claim 1, wherein the exposed portions of the copper layer are etched by reactive ion etching to form the patterned copper layer.
Claim 21
Dependent Claim
20 words
A process according to claim 19, wherein the reactive ion etching is performed at a temperature of 200° C.-500° C.
Claim 22
Dependent Claim
28 words
A process according to claim 20, wherein the reactive ion etching is performed in a single step, in a chlorine-containing atmosphere, at the temperature of 200° C.-500° C.
Claim 23
Dependent Claim
17 words
A process according to claim 19, wherein said reactive ion etching is performed in a chlorine-containing atmosphere.
Claim 24
Dependent Claim
34 words
A process according to claim 22, wherein the chlorine-containing atmosphere includes at least one chlorine-containing gas selected from the group consisting of Cl 2 , BCl 3 , SiCl 4 and CCl 4 .
Claim 25
Dependent Claim
59 words
A process according to claim 22, wherein the reactive ion etching is performed in a two-step procedure, a first step in which chlorine in the atmosphere is caused to react with copper of the copper layer, so as to form copper chloride; and a second step, at a temperature between 200°-500° C., whereby the copper chloride is volatilized off.
Claim 26
Dependent Claim
29 words
A process according to claim 24, wherein said first step of the reactive ion etching is performed at a temperature such that the copper chloride does not volatilize off.
Claim 27
Dependent Claim
33 words
A process according to claim 19, wherein the reactive ion etching is performed at a pressure of 0.1 mTorr to 10 mTorr, so as to substantially avoid undercutting copper of the copper layer.
Claim 28
Dependent Claim
42 words
A process according to claim 1, wherein the copper layer is substantially completely covered with the anti-oxidizing layer at the time of removing the patterned photoresist layer, so as to avoid oxidation of the copper layer when removing the patterned photoresist layer.
Claim 29
Dependent Claim
57 words
A process according to claim 1, wherein a material for the anti-oxidizing layer is selected from the group consisting of TiN, TaN, NbN, ZrN, VN and Cr, and a material for the etching mask layer is selected from the group consisting of Al, Si, Ga, Sn, Mo, MoSi 2 , W, WSi 2 and SiO 2 .
Claim 30
Dependent Claim
39 words
A process according to claim 1, wherein the anti-oxidizing layer has a thickness greater than 0.5 μm, the etching mask layer has a thickness greater than 0.1 μm, and the copper layer has a thickness greater than 0.5 μm.
Claim 31
Dependent Claim
34 words
A process according to claim 1, wherein a material for the anti-oxidizing layer is selected from the group consisting of a nitride or boride of Cr, and borides of Zr, V, Ta and Nb.
Claim 32
Dependent Claim
34 words
A process according to claim 1, comprising a further step, after etching the exposed portions of the copper layer, of forming a further anti-oxidation layer on exposed side surfaces of the patterned copper layer.
Claim 33
Dependent Claim
23 words
A process according to claim 31, wherein said further anti-oxidation layer and the anti-oxidation layer in combination completely cover the patterned copper layer.
Claim 34
Dependent Claim
68 words
A process according to claim 31, wherein said further anti-oxidation layer is formed by forming a film of material of the further anti-oxidation layer on the patterned copper layer, including on the exposed side surfaces thereof, and subjecting said film of material of the further anti-oxidation layer to anisotropic etching so as to leave the further anti-oxidation layer on the exposed side surfaces of the patterned copper layer.
Claim 35
Dependent Claim
181 words
A process for producing a semiconductor device having wiring layers and interconnections, comprising the steps of: (a) forming a copper layer over a semiconductor substrate having at least one semiconductor element therein; (b) forming etching mask and anti-oxidizing layers on said copper layer, such that the anti-oxidizing layer is provided on said copper layer and the etching mask layer is provided on the anti-oxidizing layer; (c) forming a patterned photoresist layer on said etching mask layer; (d) etching the etching mask layer using the patterned photoresist layer as a mask, so as to form an etched etching mask layer; (e) removing the patterned photoresist layer by an oxygen plasma treatment, the copper layer being covered with the anti-oxidizing layer during removal of the patterned photoresist layer; (f) after removing the patterned photoresist layer, etching the anti-oxidizing layer, so as to expose portions of the copper layer, using the etched etching mask layer as a mask; and (g) etching the exposed portions of the copper layer so as to form at least one of interconnections and wiring layers of the semiconductor device.
Claim 36
Dependent Claim
181 words
A process for producing a semiconductor device having wiring layers and interconnections, comprising the steps of: (a) forming a copper layer over a semiconductor substrate having at least one semiconductor element therein; (b) forming etching mask and anti-oxidizing layers on said copper layer, such that the anti-oxidizing layer is provided on said copper layer and the etching mask layer is provided on the anti-oxidizing layer; (c) forming a patterned photoresist layer on said etching mask layer; (d) etching the etching mask layer using the patterned photoresist layer as a mask, so as to form an etched etching mask layer; (e) removing the patterned photoresist layer by an oxygen plasma treatment, the copper layer being covered with the anti-oxidizing layer during removal of the patterned photoresist layer; (f) after removing the patterned photoresist layer, etching the anti-oxidizing layer, so as to expose portions of the copper layer, using the etched etching mask layer as a mask; and (g) etching the exposed portions of the copper layer so as to form at least one of interconnections and wiring layers of the semiconductor device.
Claim 37
Dependent Claim
36 words
A process according to claim 34, wherein steps (a)-(g) are repeated at least once, so as to from at least one further level of interconnections and wiring layers of the semiconductor device over the semiconductor substrate.
Claim 38
Dependent Claim
33 words
A process according to claim 35, wherein steps (a)-(g) are repeated 3 times, to form a total of four levels of interconnections and wiring layers of the semiconductor device over the semiconductor substrate.
Claim 39
Dependent Claim
47 words
A process according to claim 34, wherein, prior to performing step (a), a barrier layer for preventing migration of copper from said copper layer into the semiconductor substrate is provided on the semiconductor substrate, whereby said barrier layer is interposed between the substrate and the copper layer.
Claim 40
Dependent Claim
21 words
A process according to claim 34, wherein the etching of exposed portions of the copper is performed by reactive ion etching.
Claim 41
Dependent Claim
19 words
A process according to claim 38, wherein the reactive ion etching is performed at temperatures of 200° C.-500° C.
Claim 42
Dependent Claim
42 words
A process according to claim 34, wherein the copper layer is substantially completely covered with the anti-oxidizing layer at the time of removing the patterned photoresist layer, so as to avoid oxidation of the copper layer when removing the patterned photoresist layer.
Claim 43
Dependent Claim
53 words
A process according to claim 34, wherein the exposed portions of the copper layer are etched to form a plurality of the at least one of wiring layers and interconnections, the wiring layers and interconnection being less than 1 μm in width and being spaced from each other by less than 1 μm.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1993-06-04 | 1993-12-04 | 1994-06-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-06-04 | 1997-12-04 | 1998-06-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-06-04 | 2001-12-04 | 2002-06-05 | $7700.00 | Window Closed / Lapsed |