US5341002A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor light emitting device with ridged contact
Assignee: BT&D Technologies Ltd
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Filing: 1991-12-04
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Granted: 1994-08-23
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Expires: 2011-12-04
Abstract
Abstract A semiconductor device for amplifying radiation comprises an n-type substrate (1), a p-type layer (3) between which is located an active layer (2). Portions of the p-type layer (3) are removed by an etching process to create a central contact portion (11). Typically, the p-type layer portions are removed by an etching process in combination with a photoresist mask deposited on the top surface of the p-type layer (3). By using an etching process the contact portion can be shaped so that the photoresist layer then overhangs the contact portion (11). N-type ions are then implanted into the active layer (2) where the p-type layer (3) has been removed and the overhanging photoresist layer (4) creates non-implanted regions (10) in the active layer (20) which separates the implanted regions (8, 9) from the contact portion (11). The implanted regions (8, 9) have the effect of creating a potential barrier between the non-implanted regions of the first layer and the implanted regions and this prevents current injected into the contact portion (11) from spreading horizontally in the active layer (2).
Inventors
- 👤 Richard G. Plumb
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 14:02
CPC Classifications
H; H01; H01S; H01S5/00; H01S5/20; H10; H10H; H10H20/00; H10H20/01; H10H20/011; H10H20/013; H01S5/22; H01S5/2054; H01S5/2059
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
48 words
A light-emitting semiconductor device comprising a substrate, a first layer being an active layer on the substrate and a second layer forming a ridged contact portion on the active layer, wherein a potential barrier is formed by ion implantation into the active layer alongside the ridged contact portion.
Claim 2
Dependent Claim
48 words
A light-emitting semiconductor device comprising a substrate, a first layer being an active layer on the substrate and a second layer forming a ridged contact portion on the active layer, wherein a potential barrier is formed by ion implantation into the active layer alongside the ridged contact portion.
Claim 3
Dependent Claim
18 words
A semiconductor device as claimed in claim 1, wherein the active layer comprises a plurality of subsidiary layers.
Claim 4
Dependent Claim
18 words
A semiconductor device as claimed in claim 1 having a buffer layer between the substrate and active layer.
Claim 5
Dependent Claim
156 words
A semiconductor device for emitting radiation comprising a substrate of a first conductivity type; a first layer having a low carrier concentration and comprising a radiation emitting medium on the substrate; and a contact portion in the form of a ridge on the opposite side of the first layer from the substrate to which a voltage is applied in use, the contact portion being of second conductivity type opposite to the first conductivity type and regions of the first layer adjacent to the contact portion implanted with ions of the first conductivity type, wherein the concentration of the ions implanted into the first layer is such that a potential barrier is created between the implanted regions and regions of the first layer adjacent to the implanted regions which substantially reduces current leakage from the regions of the first layer adjacent to the implanted regions and under the contact portion into other regions of the first layer.
Claim 6
Dependent Claim
156 words
A semiconductor device for emitting radiation comprising a substrate of a first conductivity type; a first layer having a low carrier concentration and comprising a radiation emitting medium on the substrate; and a contact portion in the form of a ridge on the opposite side of the first layer from the substrate to which a voltage is applied in use, the contact portion being of second conductivity type opposite to the first conductivity type and regions of the first layer adjacent to the contact portion implanted with ions of the first conductivity type, wherein the concentration of the ions implanted into the first layer is such that a potential barrier is created between the implanted regions and regions of the first layer adjacent to the implanted regions which substantially reduces current leakage from the regions of the first layer adjacent to the implanted regions and under the contact portion into other regions of the first layer.
Claim 7
Dependent Claim
32 words
A semiconductor device according to claim 1 wherein the implanted regions in the first layer are separated from the contact portion by a region of the first layer which is not implanted.
Claim 8
Dependent Claim
31 words
A semiconductor device according to claim 1 wherein the substrate comprises a buffer layer adjacent to the first layer which has a lower carrier density than the rest of the substrate.
Claim 9
Dependent Claim
16 words
A semiconductor device according to claim 1 wherein the emitted radiation is generated by stimulated emission.
Claim 10
Dependent Claim
21 words
A semiconductor device according to claim 7, wherein the emitted radiation is the result of amplification of an incident optical signal.
Claim 11
Dependent Claim
15 words
A semiconductor device according to claim 1 wherein emitted radiation is generated by spontaneous emission.
Claim 12
Dependent Claim
11 words
A semiconductor device according to claim 1 wherein radiation is optical.
Claim 13
Dependent Claim
23 words
Semiconductor device according to claim 1 wherein implanted regions have a carrier density of not less than substantially 10 17 cm -3 .
Claim 14
Dependent Claim
24 words
A semiconductor device according to claim 11, wherein the implanted regions have a carrier density not greater than substantially 10 19 cm -3 .
Claim 15
Dependent Claim
22 words
A semiconductor device according to claim 1 comprising a binary composition of materials from groups III and V of the periodic table.
Claim 16
Independent Claim
186 words
A method of constructing a semiconductor device for emitting radiation, the method comprising the steps of forming on a crystalline substrate of a first conductivity type, a first layer comprising a radiation emitting medium and the first layer having a low carrier concentration, forming on the opposite side of the first layer from the substrate a second layer of a second conductivity type; removing portions of the second layer to form a contact portion in the form of a ridge on the first layer to which a voltage may be applied; and implanting ions of the first conductivity type in regions of the first layer which have been exposed by the removing of portions of the second layer, wherein the concentration and location of the ions implanted into the first layer is such that a potential barrier is created between the implanted regions and regions of the first layer adjacent to the implanted regions which substantially reduces current leakage from the regions of the first layer under the contact portion into other regions of the first layer when a voltage is applied to the contact portion.
Claim 17
Independent Claim
186 words
A method of constructing a semiconductor device for emitting radiation, the method comprising the steps of forming on a crystalline substrate of a first conductivity type, a first layer comprising a radiation emitting medium and the first layer having a low carrier concentration, forming on the opposite side of the first layer from the substrate a second layer of a second conductivity type; removing portions of the second layer to form a contact portion in the form of a ridge on the first layer to which a voltage may be applied; and implanting ions of the first conductivity type in regions of the first layer which have been exposed by the removing of portions of the second layer, wherein the concentration and location of the ions implanted into the first layer is such that a potential barrier is created between the implanted regions and regions of the first layer adjacent to the implanted regions which substantially reduces current leakage from the regions of the first layer under the contact portion into other regions of the first layer when a voltage is applied to the contact portion.
Claim 18
Dependent Claim
37 words
A method according to claim 14, wherein the ions are implanted into the first layer such that there are regions in the first layer adjacent to the implanted regions separating the contact portion from the implanted regions.
Claim 19
Dependent Claim
56 words
A method according to claim 15, wherein the regions of the first layer which separate the implanted regions of the first layer from the contact portion are formed by removing portions of the second layer from beneath a protective layer such that the protective layer overhangs and shields exposed regions of the first layer from implantation.
Claim 20
Dependent Claim
27 words
A method according to claim 16, wherein the protective layer is a photoresist layer and the portions of the second layer are removed by an etching process.
Claim 21
Dependent Claim
22 words
A semiconductor device as in claim 1 comprising a quaternary composition of materials from groups III and V of the periodic table.
Claim 22
Dependent Claim
22 words
A semiconductor device as in claim 1 comprising a quaternary composition of materials from groups III and V of the periodic table.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-08-22 | 1998-02-21 | 1998-08-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-08-22 | 2002-02-21 | 2002-08-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-08-22 | 2006-02-21 | 2006-08-23 | $7700.00 | Window Closed / Lapsed |