Abstract A structure and method are provided for accurately compensating for the neighbor effect in reading the state of a memory cell in a virtual ground memory array. When the supply voltage Vcc of the memory array increases above a selected maximum value Vccmax, a programmed memory cell reads as an unprogrammed cell. Due to the neighbor effect, a neighboring cell, which was initially unprogrammed during the programming of the memory cell but was subsequently also programmed, causes Vccmax of the memory cell to be lower in a read cycle than in the previous program/verify cycle, resulting in discarding the memory device. In accordance with the present invention, circuitry activated during the read cycle compensates for the neighbor effect by including an unprogrammed replica EPROM transistor identical to the memory cell in parallel with the neighbor of the memory cell being read. This unprogrammed replica EPROM transistor essentially replaces the effect of the actual neighbor memory cell on the memory cell being read and thus ensures that the Vccmax of the memory cell in the read cycle is equal to or greater than the corresponding Vccmax of the memory cell in the program/verify mode.
A memory array comprising: a memory cell connected to a bit line; a neighboring memory cell connected to said bit line; an unprogrammed replica memory cell connectable to said bit line; means for connecting said unprogrammed replica memory cell between a supply voltage and said bit line to effectively replace the effect of said neighboring memory cell during a reading of said memory cell with the effect of said unprogrammed replica memory cell; a first pull-up device associated with said neighboring memory cell; and a second pull-up device connected in series with said unprogrammed replica memory cell, wherein said second pull-up device replicates the effect of said first pull-up device during a read of said memory cell.
Claim 2
Dependent Claim
117 words
A memory array comprising: a memory cell connected to a bit line; a neighboring memory cell connected to said bit line; an unprogrammed replica memory cell connectable to said bit line; means for connecting said unprogrammed replica memory cell between a supply voltage and said bit line to effectively replace the effect of said neighboring memory cell during a reading of said memory cell with the effect of said unprogrammed replica memory cell; a first pull-up device associated with said neighboring memory cell; and a second pull-up device connected in series with said unprogrammed replica memory cell, wherein said second pull-up device replicates the effect of said first pull-up device during a read of said memory cell.
Claim 3
Dependent Claim
33 words
The memory array of claim 1 further comprising: a switching device connected in series with said second pull-up device; wherein said switching device is switched on during said read of said memory cell.
Claim 4
Dependent Claim
23 words
The memory array of claim 2 wherein said memory cell, said neighboring memory cell, and said unprogrammed replica memory cell are EPROM transistors.
Claim 5
Dependent Claim
17 words
The memory array of claim 3 wherein said first and said second pull-up devices are N-channel transistors.
Claim 6
Dependent Claim
28 words
The memory array of claim 4 wherein said switching device is an N-channel transistor having a size and biasing much larger than that of said second pull-up device.