US5319479A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Deposited multi-layer device with a plastic substrate having an inorganic thin film layer
Assignee: Ricoh Co Ltd
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Filing: 1991-08-30
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Granted: 1994-06-07
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Expires: 2011-08-30
Abstract
Abstract A deposited multi-layer device of an electronic element and a plastic substrate on which an inorganic substance thin film layer is simultaneously formed on both surfaces of the substrate wherein each of the electronic element, plastic substrate and inorganic thin film have internal and thermal stress not equal to zero. The device is free from peeling, deformation or curl of the substrate and degradation due to impurities such as acid, alkali and water.
Inventors
- 👤 Katsuyuki Yamada
- 👤 Eiichi Ohta
- 👤 Kenji Kameyama
- 👤 Hitoshi Kondo
- 👤 Yuji Kimura
- 👤 Masaetsu Takahashi
- 👤 Makoto Tanabe
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 00:09
CPC Classifications
C; C23; C23C; C23C14/00; C23C14/06; C23C14/0623; C23C14/0676; G; G02; G02F; G02F1/00; G02F1/01; G02F1/13; G02F1/133; G02F1/1333; G02F1/133305; H; H10; H10N; H10N70/00
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
119 words
A deposited multi-layer device comprising an electronic element and a plastic substrate including first and second surfaces provided with a first inorganic thin film and a second inorganic thin film formed simultaneously on respective first and second surfaces of said substrate, wherein the electronic element, the plastic substrate and the inorganic thin films each have internal and thermal stress not equal to zero, wherein the total value of internal and thermal stress in said first inorganic thin film on which said electronic element is fabricated plus the stress in the electronic element is equal to the value of the internal and thermal stress in said second inorganic thin film on said substrate, thereby preventing deformation of said multi-layer device.
Claim 2
Dependent Claim
119 words
A deposited multi-layer device comprising an electronic element and a plastic substrate including first and second surfaces provided with a first inorganic thin film and a second inorganic thin film formed simultaneously on respective first and second surfaces of said substrate, wherein the electronic element, the plastic substrate and the inorganic thin films each have internal and thermal stress not equal to zero, wherein the total value of internal and thermal stress in said first inorganic thin film on which said electronic element is fabricated plus the stress in the electronic element is equal to the value of the internal and thermal stress in said second inorganic thin film on said substrate, thereby preventing deformation of said multi-layer device.
Claim 3
Dependent Claim
26 words
The device according to claim 1, wherein at least one of said first and second inorganic thin films consists essentially of a fluorine containing silicon compound.
Claim 4
Dependent Claim
29 words
The device according to claim 2, wherein said at least one of said first and second inorganic thin films consists essentially of a silicon compound not substantially containing fluorine.
Claim 5
Dependent Claim
59 words
A deposited multi-layer device comprising an electronic element and a plastic substrate, both having internal and thermal stress not equal to zero, wherein an inorganic thin film cancels the total internal and thermal stress of said electronic element and plastic substrate is formed at least on one surface of said plastic substrate, thereby preventing deformation of said multi-layer device.
Claim 6
Dependent Claim
59 words
A deposited multi-layer device comprising an electronic element and a plastic substrate, both having internal and thermal stress not equal to zero, wherein an inorganic thin film cancels the total internal and thermal stress of said electronic element and plastic substrate is formed at least on one surface of said plastic substrate, thereby preventing deformation of said multi-layer device.
Claim 7
Dependent Claim
19 words
The device according to claim 4, wherein said inorganic thin film consists essentially of a fluorine containing silicon compound.
Claim 8
Dependent Claim
21 words
The device according to claim 4, wherein said inorganic thin film consists essentially of a silicon compound not substantially containing fluorine.
Claim 9
Dependent Claim
15 words
The device according to claim 1 or 4, wherein said device is a MIM device.
Claim 10
Dependent Claim
21 words
The device according to claim 1 or 4, wherein said device has a hard carbon film as an additional insulating film.
Claim 11
Independent Claim
126 words
A method for making a deposited multi-layer device comprising an electronic element and a plastic substrate provided with an inorganic thin film on both a first and second surface of the substrate comprising: simultaneously forming said inorganic thin film on both a first and second surface of said substrate, wherein each of the electronic element, plastic substrate and inorganic thin film have internal and thermal stress not equal to zero, wherein the total value of internal and thermal stress in said first inorganic thin film on which said electronic element is fabricated plus the stress in the electronic element is equal to the value of the internal and thermal stress in said second inorganic thin film on said substrate, thereby preventing deformation of said multi-layer device.
Claim 12
Independent Claim
126 words
A method for making a deposited multi-layer device comprising an electronic element and a plastic substrate provided with an inorganic thin film on both a first and second surface of the substrate comprising: simultaneously forming said inorganic thin film on both a first and second surface of said substrate, wherein each of the electronic element, plastic substrate and inorganic thin film have internal and thermal stress not equal to zero, wherein the total value of internal and thermal stress in said first inorganic thin film on which said electronic element is fabricated plus the stress in the electronic element is equal to the value of the internal and thermal stress in said second inorganic thin film on said substrate, thereby preventing deformation of said multi-layer device.
Claim 13
Dependent Claim
19 words
The method according to claim 9, wherein said inorganic thin film consists essentially of a fluorine containing silicon compound.
Claim 14
Dependent Claim
21 words
The method according to claim 9, wherein said inorganic thin film consists essentially of a silicon compound not substantially containing fluorine.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-06-06 | 1997-12-06 | 1998-06-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-06-06 | 2001-12-06 | 2002-06-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-06-06 | 2005-12-06 | 2006-06-07 | $7700.00 | Window Closed / Lapsed |