Patent US5310711A successfully refreshed from Google Patents.
US5310711A
Expired / Lapsed
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Method of forming doped shallow electrical junctions
Assignee: HP Inc
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Filing: 1993-08-02
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Granted: 1994-05-10
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Expires: 2013-08-02
Abstract
Abstract Very shallow electrical junctions may be formed in an oxide free surface of a semiconductor by introducing an inert or reducing gas into a vacuum processing chamber, heating the semiconductor to between 750° C. and 1100° C., introducing a dilute solution of a dopant gas into the chamber, and exposing the semiconductor to the gases for about 0.5 to about 100 minutes, preferably between 10 and 30 minutes. A relatively wide range of surface dopant concentrations may be achieved thereby with dopant concentration controlled independent of junction depth. Non-oxide free semiconductor surfaces may be made oxide free by first heating the semiconductor surface in the presence of the reducing gas. This technique provides uniform surface dopant concentrations and is suitable for the formation of junctions in deep trenches and other features having high aspect ratios.
Inventors
- 👤 Clifford I. Drowley
- 👤 John E. Turner
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 12:57
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/04; H10P72/0431; H10P72/0432; H10P32/00; H10P32/10; H10P32/12; H10P32/17; H10P32/171; Y; Y10; Y10S; Y10S118/00; Y10S118/90; Y10S148/00; Y10S148/017; Y10S148/03; Y10S148/144
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
93 words
A method of forming electrical junctions in semiconductor material comprising the steps of: exposing an oxide free region of the surface of a semiconductor material to an ambient including a dopant gas the concentration of which is from about 1 part per million to about 1 part per billion; heating the region to a temperature in the range of about 750° C. to about 1100° C.; and controlling the duration of exposure of the heated region to the said dopant gas to be in the range of about 0.5 to about 100 minutes.
Claim 2
Independent Claim
93 words
A method of forming electrical junctions in semiconductor material comprising the steps of: exposing an oxide free region of the surface of a semiconductor material to an ambient including a dopant gas the concentration of which is from about 1 part per million to about 1 part per billion; heating the region to a temperature in the range of about 750° C. to about 1100° C.; and controlling the duration of exposure of the heated region to the said dopant gas to be in the range of about 0.5 to about 100 minutes.
Claim 3
Dependent Claim
16 words
The method of claim 1 wherein the ambient includes a reducing gas as a carrier gas.
Claim 4
Dependent Claim
10 words
The method of claim 2 wherein the ambient includes hydrogen.
Claim 5
Dependent Claim
24 words
The method of claim 1 further comprising the step of: controlling the depth of the electrical junction by altering the duration of said exposure.
Claim 6
Dependent Claim
30 words
The method of claim 1 further comprising the step of: controlling the concentration of the dopant in the junction by adjusting the concentration of the dopant gas in the ambient.
Claim 7
Dependent Claim
31 words
The method of claim 1 further comprising the preliminary steps of: exposing the surface to a reducing gas; and the surface to a temperature and heating sufficient to remove surface oxides.
Claim 8
Dependent Claim
11 words
The method of claim 6 wherein the reducing gas includes hydrogen.
Claim 9
Dependent Claim
15 words
The method of claim 1 wherein the region is heated before exposure to the dopant.
Claim 10
Dependent Claim
22 words
The method of claim 1 wherein the region includes semiconductor features having aspect ratios in the range of about 1 or higher.
Claim 11
Dependent Claim
17 words
The method of claim 1 wherein the ambient is an oxygen free environment including an inert gas.
Claim 12
Dependent Claim
28 words
The method of claim 1 comprising he further step of: selectively preventing exposure of portions of the region to the dopant gas by use of a masking material.
References Cited (Backward Citations)
US5183777A
Cited
US5124272A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-05-09 | 1997-11-08 | 1998-05-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-05-09 | 2001-11-08 | 2002-05-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-05-09 | 2005-11-08 | 2006-05-10 | $7700.00 | Window Closed / Lapsed |