Electrostatic discharge protection for CMOS integrated circuits

Claim 2

In a CMOS semiconductor device, a circuit for preventing damage to said device from electrostatic discharge comprising: a semiconductor substrate of a first conductivity type; a first and a second spaced conductive ring disposed on the top surface of said semiconductor substrate; said first and second rings electrically coupled by a capacitor; first and second signal pads; a three-terminal NPN transistor for passing electrostatic discharge current to said first pad from said first conductive ring; said NPN transistor having an emitter connected to said first pad, a collector connected to said first conductive ring and a base connected to said second conductive ring; a three-terminal PNP transistor for passing electrostatic discharge current from said second pad to said second conductive ring; said PNP transistor having an emitter connected to said second pad, a collector connected to said second conductive ring and a base connected to said first conductive ring whereby the base and collector of said NPN and said PNP transistors are connected in parallel with said coupling capacitor; and a clamp circuit electrically coupling said first and second rings, said clamp circuit including an electrostatic discharge detector; and a MOS transistor of a second conductivity type having a drain coupled to said first ring and a source connected to said second ring; said MOS transistor having a parasitic bipolar transistor having a base of said first conductivity type coupling said source and said drain; and a quick start capacitor for said MOS transistor comprising a first conductive plate overlapping the source diffusion of said MOS transistor; a second conductive plate overlapping said first conductive plate; a first dielectric layer between said first conductive plate and said diffusion; and a second dielectric layer between said first and second conductive plates so as to form a stacked capacitor.

Claim 3

The semiconductor device of claim 1 wherein said first and second rings are disposed substantially proximate to the perimeter of said semiconductor substrate.

Claim 4

The semiconductor device of claim 1 wherein said capacitor provides base drive for said transistors upon electrostatic discharge.

Claim 5

The semiconductor device of claim 3 wherein said NPN and said PNP transistors limit the voltage rise during electrostatic discharge to between 8 volts and 12 volts.

Claim 6

The semiconductor device of claim 3 wherein said NPN and said PNP transistors limit the voltage rise during electrostatic discharge to about 10 volts.

Claim 7

The semiconductor device of claim 1 wherein said NPN transistor comprises a lateral parasitic NPN transistor and said PNP transistor comprises a lateral parasitic PNP transistor.

Claim 8

The clamp circuit of claim 1 wherein said substrate is P-type; said MOS transistor is an enhancement-mode MOSFET; and said bipolar transistor is a lateral parasitic NPN transistor, associated with said MOS transistor, having its base and collector electrically connected to said source and said second ring and its emitter electrically connected to said drain and said first ring.

Claim 9

The semiconductor device of claim 1 wherein a plurality of contacts and vias connect said second conductive plate and said diffusion region.

Claim 10

The semiconductor device of claim 8 wherein said capacitor has a value sufficient to kick-start said bipolar transistor associated with said MOS transistor.

Claim 11

The semiconductor device of claim 9 wherein said capacitor has a value of about 25 femtofarads.

Claim 12

In a CMOS circuit formed on a semiconductor substrate of a first conductivity type, said circuit having a first power ring and a second power ring; a circuit means for shunting high current between said power rings comprising: a MOS transistor having a drain coupled to said first power ring, a source coupled to said second power ring and a parasitic, lateral bipolar transistor having its base and collector coupled to the source of said MOS transistor and its emitter coupled to the drain of said MOS transistor; a resistor coupled between the gate of said MOS transistor and said second power ring; and a capacitor coupled between the gate of said MOS transistor and said first power ring, said capacitor comprising a first conductive plate overlapping the source diffusion of said MOS transistor; a second conductive plate overlapping said first conductive plate; a first dielectric layer between said first conductive plate and said diffusion; and a second dielectric layer between said first and second conductive plates so as to form a stacked capacitor.

Claim 13

In a CMOS circuit formed on a semiconductor substrate of a first conductivity type, said circuit having a first power ring and a second power ring; a circuit means for shunting high current between said power rings comprising: a MOS transistor having a drain coupled to said first power ring, a source coupled to said second power ring and a parasitic, lateral bipolar transistor having its base and collector coupled to the source of said MOS transistor and its emitter coupled to the drain of said MOS transistor; a resistor coupled between the gate of said MOS transistor and said second power ring; and a capacitor coupled between the gate of said MOS transistor and said first power ring, said capacitor comprising a first conductive plate overlapping the source diffusion of said MOS transistor; a second conductive plate overlapping said first conductive plate; a first dielectric layer between said first conductive plate and said diffusion; and a second dielectric layer between said first and second conductive plates so as to form a stacked capacitor.

Claim 14

The capacitor of claim 11 wherein said capacitor has a capacitance less than 100 femtofarads.

Claim 15

In a semiconductor device, a clamp for coupling a VCC ring and a VSS ring during an electrostatic discharge event comprising: a resistor; a capacitor, said capacitor comprising a first conductive plate overlapping the drain diffusion of said MOS transistor; a second conductive plate overlapping said first conductive plate; a first dielectric layer between said first conductive plate and said diffusion; and a second dielectric layer between said first and second conductive plates so as to form a stacked capacitor; a lateral bipolar transistor having a first terminal connected to VCC, a second terminal connected to VSS and a base coupled to substrate; and A MOS transistor having a drain coupled to VCC, a source coupled to VSS, a body and a gate; said gate coupled to VCC by said capacitor and to VSS by said resistor whereby the body of said MOS transistor has a low resistance connection to the base of said bipolar transistor and whereby said capacitor kick-starts said bipolar transistor into conducting current, induced by said electrostatic discharge event, at a low non-destructive breakdown voltage.

Claim 16

In a semiconductor device, a clamp for coupling a VCC ring and a VSS ring during an electrostatic discharge event comprising: a resistor; a capacitor, said capacitor comprising a first conductive plate overlapping the drain diffusion of said MOS transistor; a second conductive plate overlapping said first conductive plate; a first dielectric layer between said first conductive plate and said diffusion; and a second dielectric layer between said first and second conductive plates so as to form a stacked capacitor; a lateral bipolar transistor having a first terminal connected to VCC, a second terminal connected to VSS and a base coupled to substrate; and A MOS transistor having a drain coupled to VCC, a source coupled to VSS, a body and a gate; said gate coupled to VCC by said capacitor and to VSS by said resistor whereby the body of said MOS transistor has a low resistance connection to the base of said bipolar transistor and whereby said capacitor kick-starts said bipolar transistor into conducting current, induced by said electrostatic discharge event, at a low non-destructive breakdown voltage.

Claim 17

The circuit of claim 13 wherein said resistor has a value of about 10 kilo-ohms.

Claim 18

In a CMOS semiconductor device, a circuit for preventing damage to said semiconductor device by an electrostatic discharge event comprising: a semiconductor substrate of a first conductivity type; a power bus (VCC); a first (VSS), a second (DVCC) and a third (DVSS) spaced conductive ring disposed on the top surface of said semiconductor substrate; said bus and said first ring electrically coupled by a capacitor (72) and a first clamp means (66); said first and second rings coupled by a second clamp means (122); said first and third rings coupled by a fourth clamp means (123); said bus further coupled to said first and third rings by a first lateral transistor (104) of a second conductivity type where said lateral transistor has a collector connected to said third ring, a base connected to said first ring and an emitter connected to said bus; said first ring further coupled to said second and third rings by a second lateral transistor (120) of said second conductivity type where said second lateral transistor has a collector connected to said third ring, a base connected to said first ring and an emitter connected to said second ring; a first lateral transistor (112) of said first conductivity type having an emitter connected to said third ring, a collector connected to said first ring and a base connected to said bus; and a third lateral transistor (96) of said second conductivity type having an emitter connected to said second ring, a collector connected to said bus and a base connected to said first ring; said capacitor adapted to provide base current to forward bias said first, second, third and fourth clamp means said first, second and third lateral transistors of said second conductivity type and said first lateral transistor of said first conductivity type during an electrostatic discharge event to ensure that each clamp and transistor switches either into the forward conducting mode conducting substantially upon initiation of said electrostatic event whereby said first lateral transistor of said first conductivity type provides base drive to said lateral transistors of said second conductivity type through said substrate, or into reverse kick-start mode whereby said transistor conducts in the reverse breakdown region substantially upon initiation of said electrostatic event.

Claim 19

In a CMOS semiconductor device, a circuit for preventing damage to said semiconductor device by an electrostatic discharge event comprising: a semiconductor substrate of a first conductivity type; a power bus (VCC); a first (VSS), a second (DVCC) and a third (DVSS) spaced conductive ring disposed on the top surface of said semiconductor substrate; said bus and said first ring electrically coupled by a capacitor (72) and a first clamp means (66); said first and second rings coupled by a second clamp means (122); said first and third rings coupled by a fourth clamp means (123); said bus further coupled to said first and third rings by a first lateral transistor (104) of a second conductivity type where said lateral transistor has a collector connected to said third ring, a base connected to said first ring and an emitter connected to said bus; said first ring further coupled to said second and third rings by a second lateral transistor (120) of said second conductivity type where said second lateral transistor has a collector connected to said third ring, a base connected to said first ring and an emitter connected to said second ring; a first lateral transistor (112) of said first conductivity type having an emitter connected to said third ring, a collector connected to said first ring and a base connected to said bus; and a third lateral transistor (96) of said second conductivity type having an emitter connected to said second ring, a collector connected to said bus and a base connected to said first ring; said capacitor adapted to provide base current to forward bias said first, second, third and fourth clamp means said first, second and third lateral transistors of said second conductivity type and said first lateral transistor of said first conductivity type during an electrostatic discharge event to ensure that each clamp and transistor switches either into the forward conducting mode conducting substantially upon initiation of said electrostatic event whereby said first lateral transistor of said first conductivity type provides base drive to said lateral transistors of said second conductivity type through said substrate, or into reverse kick-start mode whereby said transistor conducts in the reverse breakdown region substantially upon initiation of said electrostatic event.

Claim 20

The semiconductor device of claim 15 further comprising: an input pad having a first electrostatic protection circuit means connected to said second ring for protecting against positive electrostatic events at said input pad; and a fourth lateral transistor of said second conductivity type having an emitter connected to said input pad, a collector connected to said third ring and a base connected to said first ring; and an output pad having a second electrostatic protection circuit means connected to said second ring for protecting against positive electrostatic events at said output pad; and a fifth lateral transistor of said second conductivity type having its emitter resistively coupled to said output pad, its base connected to said first ring and its collector connected to said third ring, and a diode connecting said first ring to said output pad.

Claim 21

The semiconductor device of claim 16 wherein said first and second electrostatic protection circuit means comprises a three-terminal PNP transistor for passing electrostatic discharge current from said pad to said second and third conductive rings; said PNP transistor having an emitter connected to said pad, a collector connected to said third conductive ring and a base connected to said second conductive ring.

Claim 22

The semiconductor device of claim 17 wherein each of said fourth and fifth lateral transistors of said second conductivity type have an emitter coupled to said input and output pads respectively, a collector connected to said second conductive ring and a base connected to said first conductive ring; and further comprising a lateral transistor of said first conductivity type having its collector connected to said first ring, its emitter connected to third ring and its base coupled to said first ring by said capacitor.

Claim 23

The semiconductor device of claim 15 wherein said lateral transistors of said second conductivity type are associated with a MOS transistor having a channel of said second conductivity type and wherein said MOS transistor has a source connected to the collector of its associated lateral transistor, an drain connected to the emitter of its associated lateral transistor and a gate connected to its drain by a capacitor and to its source by a resistor; said capacitor having a value greater than its intrinsic gate to drain capacitance whereby each associated transistor is kick-started into a reverse biased conducting region during an electrostatic discharge event.