Patent US4861670A successfully refreshed from Google Patents.
Patent US5300833A successfully refreshed from Google Patents.
← Back to Patent Explorer
US5300833A Expired / Lapsed US ⏱️ 0.0 years remaining

Low voltage biCMOS circuit having ECL and TTL input buffers and no intervening level-shift circuits

Assignee: NEC Corp
•
Filing: 1993-01-15
•
Granted: 1994-04-05
•
Expires: 2013-01-15
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract In the conventional configuration, when using circuits with different logical amplitude levels in mixture, the level converter circuit has been necessarily required, and this has been an element preventing the speeding up. Also when holding the ECL interface and the TTL interfaces in common, the level converter circuit is useless and the total size gets larger. In the present invention, for the semiconductor circuit mixed with the input buffer 1 receiving the signal amplitude voltage of the ECL interface, the input buffer 3 receiving the signal amplitude voltage of the TTL interface, and the MIS or BiMIS driver 2, the level converter circuit is not required by holding each signal amplitude voltage in Common, and it can be speeded up as much as the delayed time caused by the level converter circuit. And the total size of the switching between the TTL input buffer 3 and the ECL input buffer 1 can be reduced because there is no level converter circuit, and the ECL interface and the TTL interface can be easily mixed.

Inventors

  • 👤 Takashi Oguri

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 12:37
CPC Classifications
H; H03; H03K; H03K19/00; H03K19/0175; H03K19/017509; H03K19/017518; H03K19/017527

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 125 words
A semiconductor circuit comprising an ECL input buffer receiving a signal amplitude voltage of an ECL interface and a TTL input buffer receiving a signal amplitude voltage of a TTL interface, and an MIS or BiMIS circuit selecting and receiving a signal amplitude voltage supplied from said ECL and TTL input buffers; wherein, a power voltage applied to said MIS or BiMIS circuit is set at a total voltage of an output signal amplitude voltage of said ECL input buffer and a threshold voltage of an MIS transistor comprising said MIS or BiMIS circuit, and set at a total voltage of an output signal amplitude voltage of the TTL input buffer and a threshold voltage of the MIS transistor comprising said MIS or BiMIS circuit.
Claim 2
Dependent Claim 125 words
A semiconductor circuit comprising an ECL input buffer receiving a signal amplitude voltage of an ECL interface and a TTL input buffer receiving a signal amplitude voltage of a TTL interface, and an MIS or BiMIS circuit selecting and receiving a signal amplitude voltage supplied from said ECL and TTL input buffers; wherein, a power voltage applied to said MIS or BiMIS circuit is set at a total voltage of an output signal amplitude voltage of said ECL input buffer and a threshold voltage of an MIS transistor comprising said MIS or BiMIS circuit, and set at a total voltage of an output signal amplitude voltage of the TTL input buffer and a threshold voltage of the MIS transistor comprising said MIS or BiMIS circuit.
Claim 3
Dependent Claim 129 words
A semiconductor circuit comprising an ECL input buffer receiving a signal amplitude voltage of an ECL interface and a TTL input buffer receiving a signal amplitude voltage of a TTL interface, and an MIS or BiMIS circuit selecting and receiving a signal amplitude voltage supplied from said ECL and TTL input buffers; wherein, a power voltage applied to said MIS or BiMIS circuit is set at a total voltage of an output signal amplitude voltage of said ECL input buffer and a threshold voltage of an MIS transistor comprising said MIS or BiMIS circuit, and set at a value less than a total voltage of an output signal amplitude voltage of the TTL input buffer and a threshold voltage of the MIS transistor comprising said MIS or BiMIS circuit.
Claim 4
Dependent Claim 129 words
A semiconductor circuit comprising an ECL input buffer receiving a signal amplitude voltage of an ECL interface and a TTL input buffer receiving a signal amplitude voltage of a TTL interface, and an MIS or BiMIS circuit selecting and receiving a signal amplitude voltage supplied from said ECL and TTL input buffers; wherein, a power voltage applied to said MIS or BiMIS circuit is set at a total voltage of an output signal amplitude voltage of said ECL input buffer and a threshold voltage of an MIS transistor comprising said MIS or BiMIS circuit, and set at a value less than a total voltage of an output signal amplitude voltage of the TTL input buffer and a threshold voltage of the MIS transistor comprising said MIS or BiMIS circuit.
Claim 5
Dependent Claim 58 words
A semiconductor circuit as set forth in the claim 2, characterized in that the power voltage applied to the MIS or BiMIS circuit is 0 to 0.6 V lower than the total voltage of the output signal amplitude voltage of the TTL input buffer and the threshold voltage of the MIS transistor comprising the MIS or BiMIS circuit.
Claim 6
Dependent Claim 129 words
A semiconductor circuit comprising an ECL input buffer receiving a signal amplitude voltage of an ECL interface and a TTL input buffer receiving a signal amplitude voltage of a TTL interface, and an MIS or BiMIS circuit selecting and receiving a signal amplitude voltage supplied from said ECL and TTL input buffers; wherein, a power voltage applied to said MIS or BiMIS circuit is set at a value less than a total voltage of an output signal amplitude voltage of said ECL input buffer and a threshold voltage of an MIS transistor comprising said MIS or BiMIS circuit, and set at a total voltage of an output signal amplitude voltage of the TTL input buffer and a threshold voltage of the MIS transistor comprising said MIS or BiMIS circuit.
Claim 7
Dependent Claim 129 words
A semiconductor circuit comprising an ECL input buffer receiving a signal amplitude voltage of an ECL interface and a TTL input buffer receiving a signal amplitude voltage of a TTL interface, and an MIS or BiMIS circuit selecting and receiving a signal amplitude voltage supplied from said ECL and TTL input buffers; wherein, a power voltage applied to said MIS or BiMIS circuit is set at a value less than a total voltage of an output signal amplitude voltage of said ECL input buffer and a threshold voltage of an MIS transistor comprising said MIS or BiMIS circuit, and set at a total voltage of an output signal amplitude voltage of the TTL input buffer and a threshold voltage of the MIS transistor comprising said MIS or BiMIS circuit.
Claim 8
Dependent Claim 57 words
A semiconductor circuit as set forth in claim 4, characterized in that the power voltage applied to the MIS or BiMIS circuit is 0 to 0.6 V lower than the total voltage of the output signal amplitude voltage of the ECL input buffer and the threshold voltage of the MIS transistor comprising the MIS or BiMIS circuit.
Claim 9
Dependent Claim 133 words
A semiconductor circuit comprising an ECL input buffer receiving a signal amplitude voltage of an ECL interface and a TTL input buffer receiving a signal amplitude voltage of a TTL interface, and an MIS or BiMIS circuit selecting and receiving a signal amplitude voltage supplied from said ECL and TTL input buffers; wherein a power voltage applied to said MIS or BiMIS circuit is set at a value less than a total voltage of an output signal amplitude voltage of said ECL input buffer and a threshold voltage of an MIS transistor comprising said MIS or BiMIS circuit, and set at a value less than a total voltage of the output signal amplitude voltage of the TTL input buffer and a threshold voltage of the MIS transistor comprising said MIS or BiMIS circuit.
Claim 10
Dependent Claim 133 words
A semiconductor circuit comprising an ECL input buffer receiving a signal amplitude voltage of an ECL interface and a TTL input buffer receiving a signal amplitude voltage of a TTL interface, and an MIS or BiMIS circuit selecting and receiving a signal amplitude voltage supplied from said ECL and TTL input buffers; wherein a power voltage applied to said MIS or BiMIS circuit is set at a value less than a total voltage of an output signal amplitude voltage of said ECL input buffer and a threshold voltage of an MIS transistor comprising said MIS or BiMIS circuit, and set at a value less than a total voltage of the output signal amplitude voltage of the TTL input buffer and a threshold voltage of the MIS transistor comprising said MIS or BiMIS circuit.
Claim 11
Dependent Claim 57 words
A semiconductor circuit as set forth in claim 6, characterized in that the power voltage applied to the MIS or BiMIS circuit is 0 to 0.6 V lower than the total voltage of the output signal amplitude voltage of the ECL input buffer and the threshold voltage of the MIS transistor comprising the MIS or BiMIS circuit.
Claim 12
Dependent Claim 57 words
A semiconductor circuit as set forth in claim 6, characterized in that the power voltage applied to the MIS or BiMIS circuit is 0 to 0.6 V lower than the total voltage of the output signal amplitude voltage of the TTL input buffer and the threshold voltage of the MIS transistor comprising the MIS or BiMIS circuit.

References Cited (Backward Citations)

US4879480A Cited
US4984202A Cited
US4939393A Cited
JPH03152798A Cited
US5132573A Cited
US5122692A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-04-04 1997-10-04 1998-04-05 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-04-04 2001-10-04 2002-04-05 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-04-04 2005-10-04 2006-04-05 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag