Electronic imaging device with defect correction

Claim 1

An electronic imaging device comprising: first and second arrays of corresponding sensor elements that generate electrical signals in response to incident radiation, wherein said first and second arrays may included some defective sensor elements, corresponding sensor elements of the first and second arrays being arranged in sensor element pairs aligned along a scanning direction, each of said pairs comprising at least one functional sensor element; first and second transfer means for carrying out the readout of the electrical signals generated respectively by the sensor elements of said pairs; defect identification means for identifying defective sensor elements in said first and second arrays; and output means for receiving the electrical signals from said first and second transfer means and for combining the electrical signals generated by corresponding sensor elements of said sensor element pairs when both sensor elements are functional and for increasing the level of the electrical signal generated by a functional sensor element of a pair to a defect compensation level when the other sensor element of said pair is not functional wherein the output means includes a defect correction amplifier coupled to an output of said first transfer means, a second defect correction amplifier coupled to an output of said second transfer means, and a summing amplifier coupled to the outputs of both the first and second transfer means, said output means providing corrected output image signals.

Claim 5

A method of improving the signal to noise response and of compensating for defective sensor elements in an electronic imaging device comprising first and second arrays of corresponding sensor elements that generate electrical signals in response to incident radiation, wherien said first and second arrays may includes some defective sensor elements, corresponding sensor elements of the first and second arrays being arranged in sensor element pairs aligned along a scanning direction, each of said pairs comprising at least one functional sensor element, said method comprising the steps of: a) identifying defective sensor elements in said first and second arrays; b) reading out the electrical signals generated by the sensor elements of said first and second arrays; c) summing the electrical signals generated by corresponding sensor elements of said sensor element pairs of first and second arrays when both sensor elements are functional; and amplifying the level of the electrical signal generated by a functional sensor element of a pair of first and second arrays, to a defect compensation level when the other element of said pair is not functional.

Claim 6

A method of improving the signal to noise response and of compensating for defective sensor elements in an electronic imaging device comprising first and second arrays of corresponding sensor elements that generate electrical signals in response to incident radiation, wherien said first and second arrays may includes some defective sensor elements, corresponding sensor elements of the first and second arrays being arranged in sensor element pairs aligned along a scanning direction, each of said pairs comprising at least one functional sensor element, said method comprising the steps of: a) identifying defective sensor elements in said first and second arrays; b) reading out the electrical signals generated by the sensor elements of said first and second arrays; c) summing the electrical signals generated by corresponding sensor elements of said sensor element pairs of first and second arrays when both sensor elements are functional; and amplifying the level of the electrical signal generated by a functional sensor element of a pair of first and second arrays, to a defect compensation level when the other element of said pair is not functional.

Claim 10

A method of compensating for defective sensor elements in an electronic imaging device comprising a plurality of at least four arrays of corresponding sensor elements that generate electrical signals in response to incident radiation wherein said plurality of four arrays is comprised of: a first array of red sensor elements; a second array of green sensor elements; a third array of blue sensor elements; and a fourth array of luminance sensor elements corresponding sensor elements of said plurality of at least four arrays being arranged in sensor element sets aligned along a scanning direction, the electrical signals from each sensor element of a set being a function of a combination of the electrical signals of the other elements of said set, wherien said plurality of at least four arrays may include some defective sensor elements, said method comprising the steps of: a) identifying defective sensor elements in said plurality of at least four arrays; b) reading out the electrical signals generated by the sensor elements of said plurality of at least four arrays; c) in the event of a defective sensor element in one of said sensor element sets, generating a compensation signal for the defective sensor element from the electrical signals of the functional sensor elements of said fourth array of luminance sensor elements.

Claim 11

A method of compensating for defective sensor elements in an electronic imaging device comprising a plurality of at least four arrays of corresponding sensor elements that generate electrical signals in response to incident radiation wherein said plurality of four arrays is comprised of: a first array of red sensor elements; a second array of green sensor elements; a third array of blue sensor elements; and a fourth array of luminance sensor elements corresponding sensor elements of said plurality of at least four arrays being arranged in sensor element sets aligned along a scanning direction, the electrical signals from each sensor element of a set being a function of a combination of the electrical signals of the other elements of said set, wherien said plurality of at least four arrays may include some defective sensor elements, said method comprising the steps of: a) identifying defective sensor elements in said plurality of at least four arrays; b) reading out the electrical signals generated by the sensor elements of said plurality of at least four arrays; c) in the event of a defective sensor element in one of said sensor element sets, generating a compensation signal for the defective sensor element from the electrical signals of the functional sensor elements of said fourth array of luminance sensor elements.