Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
187 words
A method of manufacturing a nonvolatile semiconductor memory, comprising the steps of: (a) forming a first insulating film, a first semiconductor film for forming floating gates, a second insulating film, and a second semiconductor film for forming control gates in that order on a semiconductor substrate; (b) forming etching masks, each having a configuration corresponding to that of the floating gate, at every other one of ares on said second semiconductor film where the floating gates are to be formed; (c) forming side wall spacers on both side walls of each of said etching masks; (d) growing selectively a third semiconductor film formed of the same material as that of said second semiconductor film on parts of said second semiconductor film which are not covered by any of said etching masks and said side wall spacers; (e) removing said side wall spacers; and (f) etching selectively said second semiconductor film, under said side wall spacers, said second insulating film and said first semiconductor film, together with said third semiconductor film in a direction substantially perpendicular to a surface of said semiconductor substrate by using said etching masks.
Claim 2
Independent Claim
187 words
A method of manufacturing a nonvolatile semiconductor memory, comprising the steps of: (a) forming a first insulating film, a first semiconductor film for forming floating gates, a second insulating film, and a second semiconductor film for forming control gates in that order on a semiconductor substrate; (b) forming etching masks, each having a configuration corresponding to that of the floating gate, at every other one of ares on said second semiconductor film where the floating gates are to be formed; (c) forming side wall spacers on both side walls of each of said etching masks; (d) growing selectively a third semiconductor film formed of the same material as that of said second semiconductor film on parts of said second semiconductor film which are not covered by any of said etching masks and said side wall spacers; (e) removing said side wall spacers; and (f) etching selectively said second semiconductor film, under said side wall spacers, said second insulating film and said first semiconductor film, together with said third semiconductor film in a direction substantially perpendicular to a surface of said semiconductor substrate by using said etching masks.
Claim 3
Dependent Claim
28 words
A method according to claim 1, wherein in the step of forming said side wall spacers, a length of a space between the side wall spacers is controlled.
Claim 4
Dependent Claim
30 words
A method according to claim 1, wherein a thickness of said third semiconductor film is larger than the total thickness of said first semiconductor film and said second semiconductor film.
Claim 5
Dependent Claim
55 words
A method according to claim 1, wherein in said etching step, slit-like parts in lamination of said first semiconductor film, said second insulating film and said second semiconductor film disposed between said etching masks and said third semiconductor film are etched and finally said third semiconductor film formed by said selective growth is also removed.
Claim 6
Dependent Claim
16 words
A method according to claim 1, wherein said side wall spacers are removed by wet etching.
Claim 7
Dependent Claim
43 words
A method according to claim 5, wherein said second semiconductor film, said second insulating film and said first semiconductor film are etched together with said third semiconductor film by reactive ion etching after said side wall spacers are removed by the wet etching.