Stencil mask and charged particle beam exposure method and apparatus using the stencil mask

Claim 2

A stencil mask for use in exposing a pattern on a wafer using a charged particle beam which is transmitted through the stencil mask, said stencil mask comprising: a plate; at least a first block pattern region formed on said plate, said first block pattern region including apertures of arbitrary shapes for transmitting therethrough the charged particle beam which irradiates the apertures in one shot of the charged particle beam said first block pattern region forming a block mask; and a corresponding pair of confronting blanking electrodes disposed in each of selected ones of the apertures.

Claim 3

The stencil mask as claimed in claim 1, wherein the apertures are arranged regularly within said first block pattern region.

Claim 4

The stencil mask as claimed in claim 2, wherein each aperture has a first length along a first direction within said first block pattern region, which first length is smaller than a first pitch with which the apertures are arranged in the first direction, and each aperture has a second length, along a second direction which is perpendicular to the first direction and within said first block pattern region, which is smaller than a second pitch with which the apertures are arranged in the second direction.

Claim 5

The stencil mask as claimed in claim 2, wherein the apertures within said first block pattern region have a shape selected from a group consisting of a square shape, a rectangular shape, a circular shape, an approximate V-shape, an approximate L-shape, an approximate T-shape and an approximate octagonal shape.

Claim 6

The stencil mask as claimed in claim 1, wherein the apertures within said first block pattern region are used for exposing patterns selected from a group consisting of contact holes and interconnection patterns of an integrated circuit.

Claim 7

The stencil mask as claimed in claim 1, which further comprises pads which are arranged on a peripheral part of said plate, each of said pads being electrically coupled to one of the pair of blanking electrodes of a corresponding one of the apertures within said first block pattern region.

Claim 8

The stencil mask as claimed in claim 1, which further comprises a second block pattern region formed on said plate, said second block pattern region including apertures used for exposing rectangular patterns of variable size.

Claim 9

A stencil mask for use in exposing a pattern on a wafer using a charged particle beam which is transmitted through the stencil mask, said stencil mask comprising: a plate; at least a first block pattern region formed on said plate, said first block pattern region including corresponding apertures of arbitrary shapes for transmitting therethrough the charged particle beam which irradiates the apertures in one shot of the charged particle beam, said first block pattern region forming a block mask; and a corresponding pair of confronting blanking electrodes disposed in each of the apertures, said corresponding apertures within each block pattern region being arranged with a predetermined pitch so that patterns of two adjacent apertures of a corresponding block pattern region are isolated on the wafer.

Claim 10

A stencil mask for use in exposing a pattern on a wafer using a charged particle beam which is transmitted through the stencil mask, said stencil mask comprising: a plate; at least a first block pattern region formed on said plate, said first block pattern region including corresponding apertures of arbitrary shapes for transmitting therethrough the charged particle beam which irradiates the apertures in one shot of the charged particle beam, said first block pattern region forming a block mask; and a corresponding pair of confronting blanking electrodes disposed in each of the apertures, said corresponding apertures within each block pattern region being arranged with a predetermined pitch so that patterns of two adjacent apertures of a corresponding block pattern region are isolated on the wafer.

Claim 11

Th stencil mask as claimed in claim 8, wherein each aperture has a first length along a first direction within said first block pattern region, which first length is smaller than a first pitch with which the apertures are arranged in the first direction, and ha a second length, along a second direction which is perpendicular to the first direction and within said first block pattern region, which second length is smaller than a second pitch with which the apertures are arranged in the second direction.

Claim 12

The stencil mask as claimed in claim 8, wherein the apertures within said first block pattern region have a shape selected from a group consisting of a square shape, a rectangular shape, a circular shape, an approximate V-shape, an approximate L-shape, an approximate T-shape and an approximate octagonal shape.

Claim 13

The stencil mask as claimed in claim 8, wherein the apertures within said first block pattern region are used for exposing patterns selected from a group consisting of contact holes and interconnection patterns of an integrated circuit.

Claim 14

The stencil mask as claimed in claim 8, which further comprises pads which are arranged on a peripheral part of said plate, each of said pads being electrically coupled to a respective one of the pair of blanking electrode associated with a corresponding one of the apertures within said first block pattern region.

Claim 15

The stencil mask as claimed in claim 8, which further comprises a a second block pattern region formed on said plate, said second block pattern region including apertures used for exposing rectangular patterns of variable size.

Claim 16

A charged particle beam exposure method in which a charged particle beam is irradiated on an exposure region of a wafer via a stencil mask, said stencil mask including a plate and at least a first block pattern region formed on the plate, said first block pattern region including apertures of arbitrary shapes for transmitting therethrough the charged particle beam which irradiates the apertures in one shot of the charged particle beam, said first block pattern region forming a block mask and further comprising a corresponding pair of confronting blanking electrodes disposed in each of at least predetermined ones of the apertures, said charged particle beam exposure method comprising the steps of: (a) selectively irradiating the charged particle beam within one block pattern region of the stencil mask; and (b) applying a voltage across the respectively corresponding pairs of blanking electrodes of selected ones of the predetermined apertures within the first block pattern region depending on a desired pattern which is to be exposed on the wafer when said step (a) selectively irradiates the charged particle beam within the first block pattern region, so that the charged particle beam transmitted through each of the selected ones of the apertures is deflected outside the exposure region of the wafer.

Claim 17

A charged particle beam exposure method in which a charged particle beam is irradiated on an exposure region of a wafer via a stencil mask, said stencil mask including a plate and at least a first block pattern region formed on the plate, said first block pattern region including apertures of arbitrary shapes for transmitting therethrough the charged particle beam which irradiates the apertures in one shot of the charged particle beam, said first block pattern region forming a block mask and further comprising a corresponding pair of confronting blanking electrodes disposed in each of at least predetermined ones of the apertures, said charged particle beam exposure method comprising the steps of: (a) selectively irradiating the charged particle beam within one block pattern region of the stencil mask; and (b) applying a voltage across the respectively corresponding pairs of blanking electrodes of selected ones of the predetermined apertures within the first block pattern region depending on a desired pattern which is to be exposed on the wafer when said step (a) selectively irradiates the charged particle beam within the first block pattern region, so that the charged particle beam transmitted through each of the selected ones of the apertures is deflected outside the exposure region of the wafer.

Claim 18

The charged particle beam exposure method as claimed in claim 14, wherein said step (b) is repeated for at least two exposure processes by applying the voltage to different pairs of blanking electrodes between the two exposure processes.

Claim 19

The charged particle beam exposure method as claimed in claim 15, wherein the desired pattern is selected from the group consisting of contact holes and interconnection patterns of an integrated circuit.

Claim 20

The charged particle beam exposure method as claimed in claim 16, wherein the desired pattern is divided into a plurality of parts, and the apertures within the first block pattern region of the stencil mask correspond to at least one of the divided parts of the desired pattern.

Claim 21

The charged particle beam exposure method as claimed in claim 17, which further comprises the step (c) of deflecting the charged particle beam by a predetermined distance on the wafer during one of the two exposure processes so that the desired pattern becomes continuous on the wafer upon completion of the two exposure processes.

Claim 22

The charged particle beam exposure method as claimed in claim 14, wherein the apertures are arranged regularly within the first block pattern region of the stencil mask.

Claim 23

The charged particle beam exposure method as claimed in claim 19, wherein each aperture has a first length along a first direction within the first block pattern region of the stencil mask, which first length is smaller than a first pitch with which the apertures are arranged in the first direction, and each aperture has a second length along a second direction which is perpendicular to the first direction and is within the first block pattern region of the stencil mask, which second length is smaller than a second pitch with which the apertures are arranged in the second direction.

Claim 24

The charged particle beam exposure method as claimed in claim 19, wherein the apertures within the first block pattern region of the stencil mask have a shape selected from a group consisting of a square shape, a rectangular shape, a circular shape, an approximate V-shape, an approximate L-shape, an approximate T-shape and an approximate octagonal shape.

Claim 25

The charged particle beam exposure method as claimed in claim 14, wherein the stencil mask further includes a second block pattern region formed on the plate, and the apertures within the second block pattern region are used for exposing rectangular patterns of variable size when said step (a) selectively irradiates the charged particle beam within the second block pattern region.