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Process for producing micro-mechanical structures

Assignee: Robert Bosch GmbH
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Filing: 1991-03-23
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Granted: 1994-02-15
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Expires: 2011-03-23
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Abstract

Abstract A process for producing micro-mechanical structures for sensors or actuators is proposed. Here, local oxidations are placed into the surfaces of at least two wafers with the aid of masking technology, so that level wafer surfaces are generated. The at least two wafers are subsequently connected with each other in such a way that the local oxidations of the at least two wafers are in direct contact. The actual sensor structure, which might possibly be mechanically deformable, is exposed by dissolving the local oxidations out.

Inventors

  • 👤 Hans-Peter Trah

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 20:11
CPC Classifications
G; G01; G01L; G01L9/00; G01L9/0041; G01L9/0042

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 165 words
A method of making micro-mechanical structures from a first (10) and a second (20) semiconductor wafer, comprising the steps of applying, to portions of a major surface of said first wafer, a passivating layer (14), leaving other portions of said surface exposed; causing local oxidation of said exposed other portions, thereby producing at least one recess or cut-out (15) in said major surface (17) of said first wafer (10); removing said passivating layer (14); filling said recess or cut-out with a semiconductor oxide (13), thereby forming a flat surface; bonding said flat surface (17) of said first wafer (10) to a major surface (27) of said second wafer (20), thereby forming a sandwich structure enclosing said semiconductor oxide (13, 30); forming an opening (16) extending from an outer surface of said sandwich structure to a surface of said semiconductor oxide; and applying an etching solution, through said opening (16), until said semiconductor oxide is dissolved away, thereby defining a chamber (31) within said sandwich structure.
Claim 2
Independent Claim 165 words
A method of making micro-mechanical structures from a first (10) and a second (20) semiconductor wafer, comprising the steps of applying, to portions of a major surface of said first wafer, a passivating layer (14), leaving other portions of said surface exposed; causing local oxidation of said exposed other portions, thereby producing at least one recess or cut-out (15) in said major surface (17) of said first wafer (10); removing said passivating layer (14); filling said recess or cut-out with a semiconductor oxide (13), thereby forming a flat surface; bonding said flat surface (17) of said first wafer (10) to a major surface (27) of said second wafer (20), thereby forming a sandwich structure enclosing said semiconductor oxide (13, 30); forming an opening (16) extending from an outer surface of said sandwich structure to a surface of said semiconductor oxide; and applying an etching solution, through said opening (16), until said semiconductor oxide is dissolved away, thereby defining a chamber (31) within said sandwich structure.
Claim 3
Dependent Claim 23 words
The method in accordance with claim 1, characterized in that local oxidations are placed in both main surfaces of the first wafer (10).
Claim 4
Dependent Claim 26 words
The method in accordance with claim 1, characterized in that the first and second wafers (10, 20) are connected with each other by silicon fusion bonding.
Claim 5
Dependent Claim 23 words
The method in accordance with claim 1, further comprising the step of reducing thickness of the wafers (10, 20) connected with each other.
Claim 6
Dependent Claim 64 words
The method in accordance with claim 1, characterized in that the first and second wafers (10, 20) are so doped, that no doping junction appears at the interface (32) generated when the wafers (10, 20) are bonded, and that at least one of the wafers (10, 20) has a lower layer (21) and an upper layer (22), between which there is a doping junction.
Claim 7
Dependent Claim 42 words
The method in accordance with claim 5, characterized in that the doping junction, between the lower layer (21) and the upper layer (22), is used as an etch stop for reducing the thickness of the wafers (10, 20) connected with each other.
Claim 8
Dependent Claim 25 words
The method in accordance with claim 1, characterized in that the local oxidation (13, 231, 232) is dissolved out by means of hydrofluoric acid (HF).
Claim 9
Dependent Claim 90 words
The method of claim 1, further comprising, prior to bonding said first wafer to said second wafer, applying, to portions of a major surface of said second wafer, a passivating layer (24), leaving other portions of said surface (27) exposed; causing local oxidation of said exposed other portions, thereby producing at least one recess or cut-out (251, 252) in said major surface (27) of said second wafer (20); removing said passivating layer (24); and filling said recess or cut-out with a semiconductor oxide (231, 232), thereby forming a flat surface.
Claim 10
Dependent Claim 36 words
The method of claim 8, further comprising prior to bonding said first wafer to said second wafer, the step of aligning respective oxide-filled recesses of said first wafer and of said second wafer with each other.
Claim 11
Dependent Claim 12 words
The method of claim 1, wherein said wafers are of monocrystalline silicon.
Claim 12
Dependent Claim 17 words
The method of claim 10, wherein said step of filling comprises filling with an oxide of silicon.
Claim 13
Dependent Claim 21 words
The method of claim 1, further comprising, prior to said step of causing local oxidation, forming cut-outs in said major surface.

References Cited (Backward Citations)

US4236137A Cited
US4744863A Cited
US4853669A Cited
US4784721A Cited
US4808549A Cited
DE4018275A1 Cited
US5142781A Cited
WO1991003074A1 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-02-14 1997-08-16 1998-02-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-02-14 2001-08-16 2002-02-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-02-14 2005-08-16 2006-02-15 $7700.00 Window Closed / Lapsed

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