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US5262670A Expired / Lapsed US ⏱️ 0.0 years remaining

Vertically stacked bipolar dynamic random access memory

Assignee: Electronics and Telecommunications Research Institute
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Filing: 1991-03-08
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Granted: 1993-11-16
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Expires: 2011-03-08
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Abstract

Abstract A bipolar DRAM comprises a switching transistor, a storage capacitor and a substrate. The switching transistor and the storage capacitor are vertically stacked with each other. The switching transistor is preferably an NPN bipolar transistor. The switching transistor preferably comprises P - base region, an N + emitter region of the substrate, a N + collector region, with a lower epitaxial layer between the N + emitter region and P - base region, and an upper epitaxial layer between the P - base region and N + collector region. The storage capacitor comprises a storage electrode formed on the N + collector region, a dielectric layer and a plate electrode. The dielectric layer and the plate electrode are vertically and sequentially stacked on the storage electrode. A bit line is formed on the plate electrode, and a word line is formed on the side surface of the P + base region.

Inventors

  • 👤 Jin-Hyo Lee
  • 👤 Kyu-Hong Lee
  • 👤 Dae-Yong Kim
  • 👤 Won-Gu Kang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 01:50
CPC Classifications
H; H10; H10B; H10B12/00; H10B12/01; H10B12/02; H10B12/05; H10B12/053; H10B12/10; Y; Y10; Y10S; Y10S257/00; Y10S257/906

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 228 words
A bipolar DRAM (dynamic random access memory) in which a switching transistor and a storage capacitor are vertically stacked with each other, said DRAM comprising: a semiconductor substrate employed as an emitter region of said transistor; a first impurity layer of a first conductivity type formed on said semiconductor substrate, and being electrically isolated from another impurity layer of said first conductivity type formed on said semiconductor substrate by a field oxide layer therebetween; a base region of a second conductivity type formed on said first impurity layer and forming a first laminate structure with said first impurity layer; a second impurity layer of said first conductivity type formed on said base region; a collector region formed on said second impurity layer thereby forming a second laminate structure with said second impurity layer; first and second spacers, respectively formed along side-walls of said laminate structure of said second impurity layer and said collector region; first and second word lines respectively formed along sidewalls of a third laminate structure comprised of said base region and said first and second spacers; a first storage node of said capacitor formed on said collector region, electrically isolated with a second storage node by an insulating layer therebetween; a dielectric layer formed on a surface of said first storage node; and a plate electrode formed on said dielectric layer and said insulating layer.
Claim 2
Dependent Claim 228 words
A bipolar DRAM (dynamic random access memory) in which a switching transistor and a storage capacitor are vertically stacked with each other, said DRAM comprising: a semiconductor substrate employed as an emitter region of said transistor; a first impurity layer of a first conductivity type formed on said semiconductor substrate, and being electrically isolated from another impurity layer of said first conductivity type formed on said semiconductor substrate by a field oxide layer therebetween; a base region of a second conductivity type formed on said first impurity layer and forming a first laminate structure with said first impurity layer; a second impurity layer of said first conductivity type formed on said base region; a collector region formed on said second impurity layer thereby forming a second laminate structure with said second impurity layer; first and second spacers, respectively formed along side-walls of said laminate structure of said second impurity layer and said collector region; first and second word lines respectively formed along sidewalls of a third laminate structure comprised of said base region and said first and second spacers; a first storage node of said capacitor formed on said collector region, electrically isolated with a second storage node by an insulating layer therebetween; a dielectric layer formed on a surface of said first storage node; and a plate electrode formed on said dielectric layer and said insulating layer.
Claim 3
Dependent Claim 23 words
A bipolar DRAM, according to claim 1, wherein said collector region and said wordline are separated from one another by said first spacer.
Claim 4
Dependent Claim 17 words
A bipolar DRAM, according to claim 1, wherein said first spacer is formed of an oxide layer.
Claim 5
Dependent Claim 23 words
A bipolar DRAM, according to claim 1, wherein said base region has a contact connected to said wordline at a side surface thereof.

References Cited (Backward Citations)

US4538244A Cited
US5126814A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-11-15 1997-05-17 1997-11-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-11-15 2001-05-17 2001-11-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-11-15 2005-05-17 2005-11-16 $7700.00 Window Closed / Lapsed

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