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US5262358A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for producing a silicate layer in an integrated circuit

Assignee: Fraunhofer-Gesellschaft zur Förderung der Angewandten Forschung eV
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Filing: 1990-11-09
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Granted: 1993-11-16
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Expires: 2010-11-09
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Abstract

Abstract A silicate layer, which is especially used as an intermediate oxide insulation layer in an integrated circuit for levelling topographic irregularities, is produced by the following method steps: photo-induced polymerization of polysiloxane by means of vapor-phase reaction taking as a basis an SiO-containing or an SiC-containing organic compound together with an O 2 -containing and/or an N 2 O-containing gas at a first temperature and under a first pressure in a reaction chamber; condensing polysiloxane to produce a polysiloxane layer on a structure, in particular on the circuit structures of the integrated circuit, in a condensation chamber separated from said reaction chamber at a second temperature, which is lower than said first temperature and which is at least high enough to prevent the SiO- or SiC-containing organic compound from condensing under a predetermined second pressure in the condensation chamber, but which is higher than the temperature at which polysiloxane will condense under said second pressure; and converting the polysiloxane layer into the silicate layer.

Inventors

  • 👤 Hermann Sigmund
  • 👤 Armin Klumpp

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-06 00:03
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6326; H10P14/6328; H10P14/6334; H10P14/6338; H10P14/6342; H10P14/66; H10P14/668; H10P14/6681; H10P14/6684; H10P14/6686; H10P14/69; H10P14/692; H10P14/6921; H10P14/6922; Y; Y10; Y10S; Y10S148/00; Y10S148/098; Y10S148/118; Y10S148/17

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 187 words
A method of producing a silicate layer as an intermediate oxide insulation layer in an integrated circuit for levelling topogaphic irregularities of circuit structures formed on a substrate of said integrated circuit, said method comprising the following steps: photo-induced polymerization of polysiloxane by means of vapor-phase reaction taking as a basis an SiO-containing or an SiC-containing organic compound together with an O 2 -atmosphere and/or an N 2 O-atmosphere at a first temperature and under a first pressure in a reaction chamber; condensing polysiloxane to produce a polysiloxane layer on the circuit structures of the integrated circuit formed on the substrate, in a condensation chamber separated from said reaction chamber; said substrate being adjusted to a second temperature, which is lower than said first temperature and which is so selected that the SiO-containing or SiC-containing organic compound will no longer condense under a second pressure in the condensation chamber, but that condensation of the polysiloxane on the circuit structures of the integrated circuit formed on said substrate will take place; and tempering said polysiloxane layer into the silicate layer whereby it is converted into the silicate layer.
Claim 2
Independent Claim 187 words
A method of producing a silicate layer as an intermediate oxide insulation layer in an integrated circuit for levelling topogaphic irregularities of circuit structures formed on a substrate of said integrated circuit, said method comprising the following steps: photo-induced polymerization of polysiloxane by means of vapor-phase reaction taking as a basis an SiO-containing or an SiC-containing organic compound together with an O 2 -atmosphere and/or an N 2 O-atmosphere at a first temperature and under a first pressure in a reaction chamber; condensing polysiloxane to produce a polysiloxane layer on the circuit structures of the integrated circuit formed on the substrate, in a condensation chamber separated from said reaction chamber; said substrate being adjusted to a second temperature, which is lower than said first temperature and which is so selected that the SiO-containing or SiC-containing organic compound will no longer condense under a second pressure in the condensation chamber, but that condensation of the polysiloxane on the circuit structures of the integrated circuit formed on said substrate will take place; and tempering said polysiloxane layer into the silicate layer whereby it is converted into the silicate layer.
Claim 3
Dependent Claim 22 words
A method according to claim 1 characterized in that the first temperature lies in the range between 120° C. and 150° C.
Claim 4
Dependent Claim 22 words
A method according to claim 1, characterized in that the second temperature lies in the range between 30° C and 90° C.
Claim 5
Dependent Claim 23 words
A method according to claim 1, characterized in that the first pressure lies between 100 mbar and 800 mbar, and that the second
Claim 6
Dependent Claim 44 words
A method according to claim 1, characterized in that the method step of photo-induced polymerization of polysiloxane comprises the step of supplying the starting materials via separate flow control means (12 to 14) as well as the step of vaporizing the SiO-containing organic compound.
Claim 7
Dependent Claim 23 words
A method according to claim 1, characterized in that the SiO-containing organic compound is tetraethyl orthosilicate (Si(OC 2 H 5 ) 4 ).
Claim 8
Dependent Claim 24 words
A method according to claim 1, characterized in that the polysiloxane layer is converted into the silicate layer in a purely thermal tempering process.
Claim 9
Dependent Claim 23 words
A method according to claim 1, characterized in that the polysiloxane layer is converted into the silicate layer in a photo-aided tempering process.

References Cited (Backward Citations)

GB2048230A Cited
GB2094280A Cited
US4702936A Cited
US4781942A Cited
EP0283311A2 Cited
US5028566A Cited
JPH0198033A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-11-15 1997-05-17 1997-11-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-11-15 2001-05-17 2001-11-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-11-15 2005-05-17 2005-11-16 $7700.00 Window Closed / Lapsed

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