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US5258334A Expired / Lapsed US ⏱️ 0.0 years remaining

Process of preventing visual access to a semiconductor device by applying an opaque ceramic coating to integrated circuit devices

Assignee: United States, AS REPRESENED BY DIRECTOR NATIONAL SECURITY AGENCY
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Filing: 1993-01-15
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Granted: 1993-11-02
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Expires: 2013-01-15
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Abstract

Abstract Reverse engineering of integrated circuit devices is prevented by denying visual access to the topology of an integrated circuit device. Visual access is denied by coating the device with an opaque ceramic. The opaque ceramic is produced by first mixing opaque particulate with a silica precursor. The mixture is then applied to the surface of the integrated circuit device. The coated device is heated to a temperature in the range of 50° C. to 450° C. in an inert environment for a time within the range of 1 second to 6 hours to allow the coating to flow across the surface of the device without ceramifying. The coated device is then heated to a temperature in the range of 20° C. to 1000° C. in a reactive environment for a time in the range of 2 to 12 hours to allow the coating to ceramify. The result is an integrated circuit device that is coated with opaque ceramic which prevents visual access to the underlying circuitry of the integrated circuit device while providing the device with protection against environmental stresses, ionic contamination, and mechanical abrasion.

Inventors

  • 👤 II Leon Lantz

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 10:31
CPC Classifications
H; H10; H10D; H10D89/00; C; C23; C23C; C23C18/00; C23C18/02; C23C18/12; C23C18/1204; C23C18/1208; C23C18/125; C23C18/1283; H10W; H10W42/00; H10W42/121; H10W42/40; H10W74/00; H10W74/40; H10W74/43; Y; Y10; Y10S; Y10S148/00; Y10S148/133

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 117 words
A method of forming an opaque coating on a semiconductor integrated circuit device comprising the steps of: a) mixing particulate with a silica precursor having a melting point in the range from 50° C. to 450° C.; b) coating said integrated circuit device with said mixture; c) heating said coated integrated circuit device a first time to a temperature above the melting point of said silica precursor in an inert environment for a time sufficient to allow said mixture to flow across said integrated circuit device; and d) heating said coated integrated circuit device a second time in a reactive environment for a time and at a temperature sufficient to convert said mixture to an opaque silica.
Claim 2
Independent Claim 117 words
A method of forming an opaque coating on a semiconductor integrated circuit device comprising the steps of: a) mixing particulate with a silica precursor having a melting point in the range from 50° C. to 450° C.; b) coating said integrated circuit device with said mixture; c) heating said coated integrated circuit device a first time to a temperature above the melting point of said silica precursor in an inert environment for a time sufficient to allow said mixture to flow across said integrated circuit device; and d) heating said coated integrated circuit device a second time in a reactive environment for a time and at a temperature sufficient to convert said mixture to an opaque silica.
Claim 3
Dependent Claim 56 words
The method of claim 1 wherein said particulate is selected from the group consisting of metallurgical borides, metallurgical carbides, metallurgical nitrides, metallurgical oxides, inorganic pigments, mineral powders, powdered metals, silica, graphite, carbon blacks, and color pigments wherein the particulate is present in said mixture in an amount in the range of 0.01 to 30 weight percent.
Claim 4
Dependent Claim 20 words
The method of claim 2 wherein said particulate has a diameter in the range of 1 nanometer to 3000 nanometers.
Claim 5
Dependent Claim 13 words
The method of claim 3 wherein said silica precursor comprises hydrogen silsesquioxane resin.
Claim 6
Dependent Claim 33 words
The method of claim 4 wherein said first heating is done at a temperature in the range of 50° C. to 450° C. for a time less than or equal to 6 hours.
Claim 7
Dependent Claim 21 words
The method of claim 5 wherein said inert environment is selected from the group consisting of argon, helium, nitrogen, and vacuum.
Claim 8
Dependent Claim 35 words
The method of claim 6 wherein said second heating is done at a temperature in the range of 20° C. to 1000° C. for a time in the range of 2 hours to 12 hours.
Claim 9
Dependent Claim 23 words
The method of claim 7 wherein said reactive environment is selected from the group consisting of air, oxygen, oxygen plasma, ammonia, and amines.

References Cited (Backward Citations)

US3770498A Cited
US4133690A Cited
US4544576A Cited
US4756977A Cited
US5059448A Cited
US5145723A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-11-01 1997-05-03 1997-11-02 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-11-01 2001-05-03 2001-11-02 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-11-01 2005-05-03 2005-11-02 $7700.00 Window Closed / Lapsed

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